Showing results: 451 - 465 of 486 items found.
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Fiaxell Sàrl
The ceramic pellets that generally have a diameter between 6 to 12 mm and a thickness of 2 to 4 mm are blocked on a special flange with a disc of soft vermiculite (mica) that has the same high of the ceramic sample and prevents the latter (or the flanges) to toggle. Gold or other appropriate M_Grid™ materials are placed on both sides of the pellet for potential and current measurement. After this operation, the double ceramic felt caps are covering the sample as for any other cell mounting in the Open-Flanges™ test set-up.
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Dektak® -
Bruker Nano Surfaces
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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W Series -
Bowman
The W Series Micro XRF uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.
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Titan Enterprises Ltd
Titan’s oval gear (OG) range of flow meters operate on the basic positive displacement technique in that they take a discrete volume of liquid and pass it from the inlet to the outlet without loss or slippage. By nature these devices perform better at higher viscosities as the increasing fluid thickness reduces the leakage rate even further and extends the useful operating range to lower flow rates. The oval gear design allows these flowmeters to operate with a very low differential pressure, only millimetres of head in some cases.
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Machvision
SMV system is designed to perform automatic final inspecting system. SMV integrates professional vision and optics technology. Besides, reliable mechanical system reduces the maintenance time. It is especially suitable for the demand for high quality and low cost inspection. Unique inspection techniques adapt to all 3D measuring. It can detect laser Via, dimple, bump, copper plating thickness, line, SMT, BGA, etc. SMV provides 3D image and 3D measuring result. SMV adopts programmable LED lighting to obtain the best image.
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NCS-200SA -
HenergySolar
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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GBW-600 -
Jinan Testing Equipment IE Corporation
GBW series Erichsen Metal Sheet Testing Machine is designed on the basis of screw universal material testing machine, using the servo motor for highly accurate loading for punching, meanwhile, it is equipped with hydraulic servo control system for pre-tightening/clamping of metal sheet. It is ideal to evaluate the plastic deformation performance and ductility of metal sheet & strip materials. The cupping test for metal sheet thickness range is 0.1mm-5mm, Max. Punching capacity is 600KN, and the pre-tightening/clamping device is with hydraulic servo loading pump for 600kN capacity;
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DRK8090 -
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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SENresearch 4.0 -
SENTECH Instruments GmbH.
The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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400C Series -
CH Instruments, Inc.
The quartz crystal microbalance (QCM) is a variant of acoustic wave microsensors that are capable of ultrasensitive mass measurements. Under favorable conditions, a typical QCM can measure a mass change of 0.1-1 ng/cm2. QCM oscillates in a mechanically resonant shear mode under the influence of a high frequency AC electric field which is applied across the thickness of the crystal. Figure 1b below shows an edge view of a QCM crystal undergoing oscillatory shear distortion. The central portions of the top and bottom of the crystal are coated with a typically disk-shaped thin metal film (e.g., gold).
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Smart SE -
HORIBA, Ltd.
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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MF Series -
EKO Instruments Co., Ltd.
EKO Heat Flow Sensors are applied to measure the heat flow or thermal conductivity in materials and radiative IR flux emitted by body surfaces. The sensors are suitable for indoors applications, some models made for outdoors purposes and are available in different sizes and thickness. All sensors are extremely flat, which is a big advantage considering the minimum interference with the conditions of the testing area the thermal dynamics. Since sensor foils are relatively flexible those can easy be applied on curved surfaces and can be used in different applications to measure the performance of insulating materials in refrigerators, container walls, pipes, building constructions, etc.
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1064nm Raman -
OtO Photonics Inc.
●The Smallest NIR TECooling Spectrometer, the Volume is 130 x 96 x 55 mm3●SW2960 : High-Level TECooling Spectrometer, The Wavelength Range is 900~2500nm●High Sensitivity、High Dynamic Range、High SNR●TEC One Stage (SW2860)、TEC Two Stage(SW2960)●Competitive Price for High-End Market●High Gain mode & Low Gain mode is selectable. The Sensetivity of High Gain is 18 times higher than of Low Gain●The Best Choise of 1064nm Raman, Film Thickness Measurement, Food Safety, Enviroment and Biochemical Detection●SMA905, FC/PC optional connector
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UPG-07 Monochrome -
Danatronics Corporation
PG-07 Series of hand held ultrasonic precision gages are available in 4 models. Our UPG-07 series is the ideal unit to non-destructively test the wall thickness for manufactured parts requiring unprecedented accuracy and resolution. The UPG-07 series utilizes single element transducers and offers a 30 Mhz, square wave pulser, .0001" or 1 micron resolution with the ability to store and re-call 30 unique applications. So if you are measuring light bulbs, plastic bottles, golf clubs, coil steel, thin aluminum, aircraft parts and even pure gold bars, the UPG-07 series is the right choice.
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H-Series -
Teledyne LABS
The manual lab testers of the H-series in the new LAB.line design combine state-of-the art technology with usability: round shapes, generous radii and smooth surfaces allow for easy and hygienic cleaning.Operation of the embedded touch display is simple and intuitive: you can change a product or view informative test results with just a few clicks.The H series consists of three unit variations with usually 500 N, alternatively 50 N or 1000 N. The H5 version offers to connect an external scale (Sartorius/Mettler). With the H5+ version, you can even perform high-precision measurements with the external thickness gauge module.
