Showing results: 301 - 315 of 486 items found.
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FISCHERSCOPE® X-RAY XAN® 250 -
Fischer Technology, Inc.
Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement. Measurements according to DIN EN ISO 3497 and ASTM B 568.
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HS-NCS-300 -
HenergySolar
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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MTI Instruments
Ultimate laser displacement sensor for measuring height, thickness, displacement, vibration, and more, with a sensor frame rate of 40k Samples/sec. and linearity of 0.03% FSO (Full Scale Output) accuracy and repeatability are assured
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OCT-2000 -
HenergySolar
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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TF116 -
TESTEX Testing Equipment Systems Ltd.
Bally flexing Tester is designed for flexing resistance test to be and ingor other types of failure at flexing creases. The machines applicable to all flexible materials,in particular leathers, artificial leather below thickness
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ASTM D882 -
National Technical Systems
This test method covers the determination of tensile properties of plastics in the form of thin sheeting and films (less than 1.0 mm (0.04 in.) in thickness). Film is defined in Terminology D883 as an optional term for sheeting having a nominal thickness no greater than 0.25 mm (0.010 in.). Tensile properties of plastics 1.0 mm (0.04 in.) or greater in thickness shall be determined according to Test Method D638. This test method can be used to test all plastics within the thickness range described and the capacity of the machine employed. Specimen extension can be measured by grip separation, extension indicators, or displacement of gage marks. The procedure for determining the tensile modulus of elasticity is included at one strain rate. The modulus determination is generally based on the use of grip separation as a measure of extension; however, the desirability of using extensometers, is recognized and provision for the use of such instrumentation is incorporated in the procedure. Test data obtained by this test method is relevant and appropriate for use in engineering design. The values stated in SI units are to be regarded as the standard. The values in parentheses are provided for information only. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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ASL Environmental Sciences
Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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SENTECH Instruments GmbH.
Spectroscopic ellipsometers measure film thickness and refractive index of single layers, and multi‑layer stacks. Related properties of bulk materials, isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analysed.
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MIZ-21B -
Zetec, Inc.
Our MIZ-21B handheld eddy current tester is a powerful handheld tester on the market for testing cracks, heat damage and corrosion. The MIZ-21B incorporates dual-frequency and digital conductivity testing with nonconductive coating thickness measurement.
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Smartech Inc.
- Magnetic induction (F) method is used to measure the thickness of non-magnetic coating on ferrous metal- Eddy current (N) method is used to measure the thickness of non-conducting coating on non-ferrous materials- Automatic recognition of substrate- Automatic selection of measuring methods- 5 statistical ways: Mean values / Max. values / Min. values / testing numbers.(No.) / standard deviations (S.DeV)- Upper-lower limit setting and sound alarm- Data output to printer or PC by RS232 cable- 500 readings can be stored- 2 measuring modes: continuous / single- 2 stop ways: Manual/automatic
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MTI Instruments
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Teledyne Princeton Instruments
The filter wheel assemblies are designed to hold up to six (6) 25.4 mm (1.0”) diameter (maximum thickness of 0.2”) samples or filters. Normally up to five filters are installed with the sixth position left open.
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TESTEX Testing Equipment Systems Ltd.
The internal test room is made by high quality SUS304 stainless steel; heat insulating material: high density fiberglass wool; insulation material thickness: 80mm.The heat inside the internal room may not be conducted.
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CONDOR -
Aragón Photonics Labs S.L.
Condor is a portable reflectometer designed for field measurement of reflectivity in the solar field in less than 10 seconds with a high accuracy and precision. It can be applied to both flat and curved reflecting surfaces of up to 4 mm thickness.
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MARY-102 -
FiveLab Co.,Ltd.
Ellipsometer is optical instruments which measure the change in polarizationstate of light beam upon reflection from a sample surface to analyzethe film thickness, the optical constants as the refractive index / absorption,or the optical constants of bulk materials.
