- Pickering Interfaces Inc.
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Modular Breakout System for Hardware-In-Loop Simulation
Designed in partnership with OPAL-RT Technologies, this Modular Breakout System combines a BoB feature set with the added flexibility of an FIU. By mating the FIU chassis directly to the BoB using our plug-in modules, cabling is minimized, creating a more compact reliable design and improving signal integrity.
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PXI Thermocouple Simulators
Our PXI Millivolt Thermocouple Simulator modules provide 32, 24, 16 or 8 channels of accurate low sources. They are ideal for the simulation of thermocouples and can be used for sensor emulation in ECU testing. The channels can be operated with one of three voltage ranges covering most thermocouple types. We can also supply connection solutions allowing the easy integration of the Thermocouple Simulator into your test system.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Modulation Distortion Up To 43.5 GHz
S930704B
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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System Integration
Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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STANAG3910/EFEX Modules
AIM’s STANAG3910/EFEX test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O. Configurations with...show more -
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and m...show more -
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Solar Simulators
TriSOL CPV
Concentrating Photovoltaics (CPV) has the promise of producing solar cells with high cell efficiencies, which result in a reduction in the cost of operating a PV module. However, a CPV system requires the integration of CPV solar cells, modules and CPV optics into one efficient system. OAI’s focus is CPV cell testing methodology. The CPV cells can now be tested using OAI’s advanced standalone CPV Simulators for low dose and high dose configurations. The low dose CPV Solar Simulator provides expo...show more -
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Modulation Distortion Up To 13.5 GHz
S930701B
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Multifunction Switch / Measure Unit, Modules
34980A Series
The Keysight 34980A multifunction switch / measure mainframe and modules provide functionality that is easy to set up and use. The 34980A helps you lower your cost of test and accelerate your test system integration and development.
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Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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Testing Services
Howland & Lawrence Chamber Services
RF shield testing: IEEE-299, MIL-STD-285, NSA 65-6CTIA CATL certification testing: Probe symmetry and amplitude ripple measurements following Test Plan for Wireless Device Over-the-Air PerformanceAnechoic material test, inspection, remediation: VSWR, inverse spherical nearfield testing of installed material and NRL arch screening tests of individual absorber pieces We can also provide in-process testing of welded steel shielded enclosures with a test technique based on ASME BPVC vacuum box t...show more -
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Packaging Manufacturing
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and ev...show more -
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4-Module ICT System, I307x Series 6
E9903G
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Modulation Distortion Up To 53 GHz
S95070B
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between th...show more -
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Boundary-Scan DIMM Socket Tester
ScanDIMM
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as...show more -
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4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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Integrated OTDR 1310/1550nm 32/30dB
TR800
Shenzhen Sharingtek Communication Co., LTD
TR800 series optical time domain reflectometer is a new generation of portable and intelligent measuring instrument designed by AVES Communication Technology for testing optical fiber communication system. Adopt 5.8 inch color touch screen, button/ touch dual operation; Internal integration of eight major functional modules, multi-functional integration to help customers effectively solve the field test and maintenance; Intelligent power-saving management, 20 hours long standby, efficient protection of test dimension.
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Off-Line Testing Platform
6TL22
The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain, and cost-effective. The rack is prepared for the direct integration of the three platform-based receivers from Virginia Panel, the S6, G12 and G12X.The core of the system can be either an Industrial PC or a NI-PXI. A UPS will protect the valuable instrumentation as well as control all the steps for an automatic power-up and down of the test system.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear...show more -
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Signal Integration Systems
Avenue
The Avenue system includes modules for video up/down conversion, audio embedding, synchronization, conversion, routing, noise reduction, protection switches, test signal generators and more. Avenue signal processing modules are used worldwide in broadcast, mobile, satellite, cable, worship and post production facilities. Avenue is a tray-based signal integration system housed in a 1RU or 3RU frame. Any combination of 1.5 Gb/s HD, 3 Gb/s HD, SD, MPEG, analog video and audio processing modules can be used together in the same frame.
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Analog
Create complete systems while streamlining your development process and reducing your design risk. We design our mixed-signal, linear, interface and power products for seamless integration with our extensive portfolio of microcontrollers, digital signal controllers, microprocessors and FPGAs. Well-known for our thorough documentation, we provide parts that work on the bench the same way they’re described on paper. We also provide evaluation boards to demonstrate functionality, an intuitive Integrated Development Environment (IDE), simulation software and other design resources to create a rapid design, prototype and test environment for all aspects of your system design.
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Blackbodies & Extended Area Sources
The Infinity Series of blackbody radiation sources and extended area sources combine leading edge technology with features that support the expanding test requirements of the latest high performance sensors. SBIR designs the most stable, uniform, accurate and highly emissive blackbodies available. SBIR now offers VANTABLACK®S-IR as an optional coating, providing the E-O test community an unprecedented flat plate source emisisivty. SBIR continues to offer blackbody systems that provide the test c...show more -
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Advanced Measurement Package For M8000 Series Of BERT Test Solutions
M8070ADVB
The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.
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PXI Digital Multimeters - DMM
All three PXI-DMMs deliver market-leading speed at their price points, measuring up to 15,000 readings/s with a maximum single-reading rate of 66 µs. These fast reading speeds translate into higher test system throughput and lower cost of test. Advanced triggering, enhanced functionality, and a full suite of free software simplify system integration and operation.
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Electronics Cooling Simulation Software
FloTHERM
Perform thermal analysis, create virtual models, and test design modifications of electronic equipment before physical prototyping. FloTHERM uses advanced CFD techniques to predict airflow, temperature, and heat transfer in components, boards, and complete systems, including racks and data centers. It''s also the industry''s best solution for integration with MCAD and EDA software.
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SSFDR Software Integration Rig
MS 1112
Software Integration Rig (SIR) is an Industrial PC based system is used to test the SSFDR (Solid State Flight Data Recorder) of SU30 Aircraft. SIR is a PXI based test platform and it is used to test independent and integrated software tests of the SSFDR.
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Duplex Double Test Insertion/Return Loss Test Station
JW8302
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
JW8302 Duplex double test Insertion/Return Loss Test Station is a professional equipment to test CWDM device, multi-wavelength device, PLC, fiber optical patch cord and other passive optical devices. It is a new-generation precision optical instrument of JOINWIT who combined with so many years experience in optical passive detection. It equipped with VFL or 850 light source , supporting threshold determination, automatic multi-wavelength detection, system integration, secondary development...show more -
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Multiple Module Serial Bus Test Instrument
Bi4-Series
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant softw...show more
