Filter Results By:

Products

Applications

Manufacturers

Test Program Set Development

provides set of UUT specific documentation, programming and interface.


Showing results: 1 - 11 of 11 items found.

  • PCIe 5.0 Test Platform

    PXP-500A - Teledyne LeCroy

    The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.

  • PCI Express 5.0 Test Platform

    Teledyne LeCroy

    Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.

  • ARINC 818 Tester

    iWave Systems Technologies

    iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces

  • Portable Test Platform

    GT9000P-USB3 - Guide Technology, Inc.

    A 2 channel Portable “CTIA” and/or “TIC” Test Platform controlled by USB3

  • Scalable 2 to 10 Channel Benchtop "CTIA" and/or "TIC" Test Platform with 10" Touch-Screen-Display

    GT9000 - Guide Technology, Inc.

    GT9000 is a scalable 2 to 10 channelsBench-Top CTIA and/or TIC Test Platformwith 10” touch-screen-display (iPhone quality), integrated GUI with Touch, Ethernet, WiFi and/or wireless keyboard & mouse.

  • Scalable 2 to 24 Channels 19” Rack-Mount and/or Bench-Top “CTIA” and/or “TIC” Test Platform

    GT9000R - Guide Technology, Inc.

    GT9000R is a scalable 2 to 24 channels 19”Rack-Mount CTIA and/or TIC Test Platformwith integrated GUI, Ethernet, Wi-Fi and/orwireless keyboard & mouse.

  • Comprehensive Suite of Software Tools for Semiconductor Test Applications

    ICEasy Test Suite - Marvin Test Solutions, Inc.

    Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.

  • Automatic Test Software

    EasyTest 2.0 - Acery Technologies

    EasyTest © 2.0 is a set of common test automation software platform, with the definition of test engineering, test process editor, test program generation, test execution process, test data on a network share as one of the functions. Using EasyTest © 2.0 can easily set up a large network systems and ground test integrated test system, you can build standalone automatic test system, or automatic control equipment R & D engineers, and other data stored for use in research and development.

  • Test Services

    Mu-TEST

    Mu-TEST sells a complete package including tester hardware, with electro-mechanical structure and its connectors, test instruments set, diagnostics and calibration loadboards, workstation, and software licenseIn addition, customer technical and application support for loadboard design and manufacturing, test program development, can also be managed either by MuTest directly, or via our network of partnersFinally, equipments maintenance contracts, both preventive and curative, can be contracted to one of the companies selected in our ecosystem

  • Engineering Design & Development

    TPS Associates, Inc.

    TPSA has over 20 years of experience in Engineering Design & Software Development including:Hardware & Software DesignOTPS Acquisition SupportSystems Installation & SupportAircraft Modification/CertificationEngineering Studies & AnalysesFunctional & Systems TestingIndependent Verification & Validation (IV & V)Test Program Set EngineeringReliability & Maintainability (R&M)Engineering Drawings & DataConfiguration Data ManagementReverse EngineeringRequirements AnalysisSupport Equipment (SE)Aircraft Launch & Recovery Engineering (ALRE)Engineering Change Proposal (ECP) ReviewTechnology Insertion (TI)PDR, CDR, FAT, Techeval, OSV Support

  • Automated Test Equipment

    ATE - Frontier Electronic Systems Corp.

    The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.

Get Help