- InterWorking Labs, Inc.
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UDP Test Suite
The UDP Test Suite is used by design engineers, quality assurance engineers and testers to find and fix bugs in their UDP implementation. The tests help ensure that the UDP implementation is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the UDP protocol.
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MMW Field Sensors
ITS-9050
The Innovative Technical Systems ITS-9050 Detector is a sensitive, harmonic mixing detector designed to measure millimeter-wave free-space radiation. It is ideal for measuring radiation patterns of antennas inboth the near and far-field. The ITS-9050 employs a free-running dielectric resonator oscillator (DRO) and an integrated harmonic mixer with a waveguide RF input that either connects directly to a circuit under test or to an antenna for radiation detection. The resulting IF is amplified an...show more -
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600MHz To 4GHz Radiation Measurement System
RMS-0640
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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NRZ Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
BERT integrates pulse pattern generator(PPG) and high sensitivity error detector(ED) to achieve the error rate measurement of data transmission in high speed communication. BERT can support multi-channel output and input and output polarity upset. It provides a best solution for the automated production test of the high speed optical transceiver.
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400, 200, 100 Gbit Error Rate Tester
PAM-4 BERT
The MI-PE5610-1 is a PAM-4 BERT with an integrated propriety, optical PAM-4 modulator. ROSA testing is tremebous simpliefied by the integration of the optical PAM-4 modulator in the BERT chassis. This ROSA testing solution saves time and avoids trouble shooting and accelerates your product development. The BERT provides an excellent optical PAM-4 reference output signal with adjustable OMA of the three PAM-4 eyes.The implemented 3-Eye BER technique measures the BER in real time of the 3 eyes simultanously.A wide range of selectable pattern for compliance test and signal analysis is supported.
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Digital I/O PXI Card
GX5290
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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DisplayMate Multimedia with Motion Bitmaps Edition
DisplayMate Technologies Corporation
DisplayMate Multimedia with Motion Bitmaps Edition includes a Motion Engine that moves a special set of test patterns and test photos to measure and evaluate response time, motion blur and motion artifacts in displays for different speeds, directions, intensities and colors for all monitors, projectors and HDTVs. It has everything in the standard Multimedia Edition including all of its 500+ test patterns up through 3072 x 3072 resolution.
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Fiber Optic Test Solution
Eye-BERT Micro 10G
The Eye-BERT Micro 10G is a low cost, easy to use, all-in-one XFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, diagnostic monitoring, and wavelength tuning (per XFP capability). Additionally, with a click of a button, the Eye-BERT Micro 10G will automatically test an XFP module based on ...show more -
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Dynamically Controlled High Speed Digital I/O PXI Card
GX5290 Series
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Multiplexer 2:1 With De-Emphasis 32 Gb/s
M8062A
R&D and test engineers who need to characterize serial interfaces of up to 32.0 Gb/s can use the M8061A 2:1 Multiplexer with optional de-emphasis to extend the rate of J-BERT M8020A and J-BERT N4903B pattern generator. For the most accurate receiver characterization results, the M8061A provides four calibrated de-emphasis taps, which can be extended to eight taps, built-in superposition of level interference and Clock/2 jitter injection. The M8061A is a 2-slot AXIe module that can be controlled via USB from the user interface of J-BERT M8020A as well as N4903B.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Test Pattern Generators
Video Test Pattern Generator, Portable Monitor Tester, Test Video Audio Signals, HDMI, DVI, SDI, Component Video, HDCP
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ISO Test Charts
ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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MIMIC® Wireless Simulator
Mobile device and network complexity is continuously increasing due to the multitude of devices, technologies and traffic patterns. As a result, wireless equipment manufacturers must test their products from every different aspect. They need to do this to improve quality and reduce costs.
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Remote Intelligent Pod
ScanTAP
The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
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DisplayMate Multimedia Edition for Mobile Displays
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition for Mobile Displays is a special version of the Multimedia with Test Photos Edition that produces native resolution Bitmap Files of all DisplayMate test patterns and photos that can be copied or downloaded to mobile devices, displays, and projectors for testing, evaluating, optimizing, analyzing and comparing their performance. Examples include: MP3 and video players, smartphones, digital cameras, picture frames, game consoles, GPS units, camcorder displays, and pico/pocket projectors.
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Dynamic Digital I/O (3U), 32 Ch., Per Pin Control, Up To 100 MHz W/256MB Memory & LVDS
GX5292
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.Dynamic Digital I/O (3U), 32 ch., per Pin Control, up to 100 MHz w/256MB Memory & LVDS
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in...show more -
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DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Drop-In Functional Test Fixtures
Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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370MHz To 6GHz Radiation Measurement System
RMS-0460
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Ind...show more -
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BERT Measurement Solutions
Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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Brahmos Checkout
Data Patterns designed and built the BrahMos Missile Checkout Equipment based on the requirements and support of DRDO and BrahMos. This unit validates the complete performance of the Missile through interfacing with it's umbilical and maintenance connections. The shelter mounted checkout equipment is utilized to test the articles on the field during it's life cycle, thus ensuring readiness for launch on demand.
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Logic Analyzer & Digital Pattern Generator
ScanaQuad Series
ScanaQuad (SQ) is a series of high performance 4 channels logic analyzers and digital pattern generators. They are designed to be your best companion when working on serial protocols like UART, SPI, I2C, 1-Wire, USB, I2S, CAN, LIN, RS232, RS485, and more. With ScanaQuad Logic Analyzers, you can capture signals, you can play them back, and you can even build genuine test signals and generate them!
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Pattern Generator
S-113
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
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Signal Generators
2, 4 and 8 Channel Arbitrary Waveform Generator and Pulse Pattern Generator solutions are ideal choice in automated test benches, for physics experiments, semiconductor tests, analog and digital debugging.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
