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Showing results: 1546 - 1560 of 14436 items found.

  • Wafer Level Test

    Chroma ATE Inc.

    Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.

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  • Optical Test Platforms

    Santec Corporation

    We offer a range of complete systems for measuring optical properties by combining our tunable lasers, optical switches, polarization controller, power meter and software. Please feel free to contact us for customization according to your needs.

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  • SoC Test System

    T2000 - Advantest Corp.

    SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.

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  • Measuring and Test Devices

    ProfiMessage D - Delphin Technology AG

    With a ProfiMessage D device, you can immediately begin using a optinal PROFINET interface as well as communicating to third-party systems via an OPC UA Server/Client. The device is also equipped with a display to show important configuration and measurement data. Other special features include universal sensor inputs, high-level data security, and a diverse range of interfaces.

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  • Shock Test System

    Labtone Test Equipment Co., LTD

    Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability and sometimes the object may fail. Therefore, it's necessary to study the effect of impact and reproduce the shock environment, to assess the structural strenghth and performance of the object under shock environment.

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  • Transducer Test System

    TTS-030 - F&K Physiktechnik GmbH

    For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.

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  • Test & Development Platforms

    ELMA Electronic, Inc.

    Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.

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  • Support And Test Equipment

    HABCO, Inc.

    As the leader in testing and ground support equipment for more than 45 years, HABCO Industries has consistently provided its customers everything they need, just as they need it, right when they need it – with unparalleled attention to detail and customer support. Habco’s unmatched, highly focused and passionately dedicated staff draw daily upon their unique capabilities and extensive experience in electro-mechanical systems, user-friendly software, and design for Lean manufacturing. We consistently anticipate the needs of our customers and routinely exceed their expectations.

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  • Signaling Test Solution

    IQcell-5G - LitePoint Corporation

    Purpose built to validate RF parametric measurements, end-to-end throughput, MIMO, mobility, and user experience testing across cellular and cellular capable connectivity devices such as smartphones, CPE’s, laptops, tablets, hotspots & much more.

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  • Cable Test Van

    ETL-35K - Kharkovenergopribor Ltd.

    ETL-35K system has a multitude of applications in electrical equipment testing and maintenance: testing cable insulation with DC (rectified) voltage up to 60 kV, measuring small leakage current of surge arrestors, high-voltage testing with AC voltage up to 100 kV at industrial frequency, underground utilities tracing, cable fault pre-location and pinpointing, and measuring capacitance and tan delta of various electrical objects at industrial frequency.

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  • Spectroscopic Analyzer / Test

    Optokey, Inc.

    Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.

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  • Audio Test System

    Audio-Capture - WavCapture

    The Audio Capture is a PC based multifunction audio testing system that is ideal for designing, verification and quality check of audio components such as loudspeakers, acoustics and audio electronics.

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  • Extensive Qualification & Test

    iTECH

    Quality and reliability of the battery pack design starts with proper cell selection.  Ensuring the battery pack is well matched to the host equipment is often overlooked or not given sufficient priority until performance and/or supply problems occur.  Proper cell selection is key and requires much more than checking dimensions and capacity.  Designers need to consider loading, environment, shelf life, and a number of other factors specific to the application.

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  • Test Leader / Other

    PL-10N - PINTEK Electronics

    *MODEL：PL-10N*IMPEDANCE：1.111MΩ*ACCURACY：±0.5%*FREQUENCY B.W.：DC~50MHz*WORKING POWER：MAX. 1Watt*INPUT VOLTAGE：MAX.250VDC or 200V rms AC*DIMENSION：48mm(L)xΦ16mm(D)*WEIGHT：25g*APPLICATION: Matching the impedance of the Scope probe with the DMM. with this converter, the user can use the oscilloscope to watch the wave from and measure the precise reading from the DMM.

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  • Telecom Test Systems

    4301 Series - AE Techron, Inc.

    The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.

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