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FPGA Test System
DO-254/CTS
DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Polarization Controller and Scrambler - PXIe
Pol 1000 Series
The Pol 1000 Series PXIe module enables high-speed automated polarization control for polarization dependent testing procedures.Rotate or scramble the polarization of your signal with no need for manual adjustment of paddles or tension screws using intuitive software, LabVIEW or comprehensive SCPI commands. Pol 1000 Series can be used with our wide range of optical and electrical PXIe test modules, and can be used to build complete mixed-signal test platforms.
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Processor-Controlled Test (PCT)
ScanWorks® Processor-Controlled Test
Embedded in that CPU on your circuit board are the instruments that are critical for overcoming today's design challenges. Given the complexity of board designs and chips, you need access to this on-chip technology to diagnose, debug and test your designs. One of the tools that makes up the ScanWorks platform for embedded instruments is Processor-Controlled Test (PCT). It takes advantage of the CPU's debug port for access to the circuit board so it can perform board debug, device initialization, at-speed functional test with structural diagnostics and much more.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Continuous Testing Platform
TOSCA
Tricentis Tosca is a Continuous Testing platform that accelerates testing to keep pace with Agile and DevOps. With the industry’s most innovative functional testing technologies, Tricentis Tosca breaks through the barriers experienced with conventional testing tools. Using Tricentis Tosca, enterprise teams achieve unprecedented 90%+ test automation rates—enabling them to deliver the fast and continuous feedback required for Agile and DevOps.
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TEST MANAGEMENT JIRA
QARAJ
QARA – Test Management for JIRA (QARAJ) is an add-on that is used with JIRA to enhance its test management capabilities. It can also be used with QARA Enterprise to track projects and bugs on the same platform, without the need to switch to JIRA. The add-on is available for download on the Atlassian Marketplace.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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DDoS Testing
DDoS testing is a simulation of a DDoS attack performed under controlled conditions with real traffic. The goal of DDoS testing is to answer specific questions about the target environment.DDoS attacks are unique for many organizations in that they are relatively infrequent, but when they do occur they're often catastrophic. This catastrophic nature requires that a strategy be implemented to protect the organization, but a lack of real-world experience may limit the effectiveness of any solution...show more -
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Automated Measurement Expert (AMX), VNA Plugin
S94702A
The Keysight automated measurement expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe vector network analyzers M937xA/M9485A or the benchtop E5080A ENA network analyzer. The S94702A AMX VNA plugin adds S-parameter measurement capabilities to the Keysight test automation platform (TAP). The combination of the TAP and the VNA plugin forms the AMX backend software, which makes the VNA setups and executes the test sequences in the PXIe controller...show more -
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Electromagnets
The Lake Shore electromagnets (EM-V Series) produce magnetic fields with a variety of indexed air gap and pole cap configurations. The EM-V Series is ideally suited for integration into customer-designed magnetic test platforms for applications including magneto-optical studies, magnetic hysteresis studies, in-line annealing, Hall effect studies, susceptibility measurements, spin magnetic resonance demonstrations, and biological studies.
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Power Quality Monitoring Terminal Detection Platform
PQC1650
PQC1650 power quality terminal detection platform is a test system specially designed for power quality terminals. It can fully complete the power quality test method and accuracy test of power quality terminals.
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Cloud-Based RF Signal Analysis Software
Cloud4Testing
Our next-generation software as a service (SaaS) platform is an ideal choice for your test and measurement needs. With the R&S®Cloud4Testing, you can enjoy a quick and easy access to Rohde & Schwarz testing essentials without having to make a big investment. Simply measure, analyze and process your individual RF data, on demand and on the go.
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Sencha Platform
The Sencha Web Application Development platform simplifies the challenges of managing the software development lifecycle of web applications. Now you can seamlessly design, develop, and test data-intensive web applications and deliver the right user experience, on the right screen, at the right time.
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G12x - 18 Module Solution
The G12x Receiver has four removable rubber feet below the platform and also allows for permanent tabletop mounting. Available with 15" or 20" platforms. The G12x accepts ITAs designed for both the G12 and G12x allowing versatility with your test system.
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Test Cell Controller
RAPID
The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquis...show more -
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Optical Test Platforms
We offer a range of complete systems for measuring optical properties by combining our tunable lasers, optical switches, polarization controller, power meter and software. Please feel free to contact us for customization according to your needs.
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3D Semiconductor & MEMS Process Modeling Platform
SEMulator3D
SEMulator3D® is a powerful 3D semiconductor and MEMS process modeling platform that offers wide ranging technology development capabilities. Based on highly efficient physics-driven voxel modeling technology, SEMulator3D has a unique ability to model complete process flows. Starting from input design data, SEMulator3D follows an integrated process flow description to create the virtual equivalent of the complex 3D structures created in the fab. Because the full integrated process sequence is modeled, SEMulator3D has the ability to predict downstream ramifications of process changes that would otherwise require build-and-test cycles in the fab.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Radio Frequency Cable Tester
RFCT
Textron Systems’ Radio Frequency Cable Tester (RFCT) allows for on-site testing and maintenance for radio frequency (RF) transmission paths within a platform. Using preconfigured databases of sweep parameters and pass/fail criteria, the RFCT quickly determines the status of installed RF cables. The RFCT checks each cable’s performance characteristics to include voltage standing wave ratio (VSWR), insertion loss (IL), phase and phase matching. If a cable fails a test, the RFCT automatically determines the distance-to-fault (DTF). With its intuitive touchscreen-based user interface and lightweight, ruggedized packaging, the RFCT is the gold standard for operational-level RF cable testing.
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Sensor Boards
SensorXplorer™
Each sensor board can be used together with the SensorXplorer board.The SensorXplorer boards acts as a USB to I2C interface between Vishay's freely available software modules and the sensor boards. The sensor boards also have test pins for the I2C interface, allowing you to connect them to your own platform.
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Personal SerDes Testers
C Series
Everything you need to develop and verify your high-speed digital algorithms is contained in these ultra-portable test instruments. They will forever change the way you think about developing and verifying Gbps digital and mixed-signal algorithms, and they will allow you to measure signals in ways that were not possible in the past. Each personalized SerDes tester is equivalent to multiple hardware platforms, containing everything that you need to make high-performance measurements like bit error rate testing, signal generation, and signal measurement.
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Water Meter Test Bench
LS-4B
Hong Kong Songyang Industrial Ltd.
The water meter test bench is made up the platform, clamps, back and front pipe, flow counter group, standard measuring instrument and the outlet valve.When the inlet is connected with the stable water source, the water will get to the standard measuring instrument through the straight pipe. Compare the value of the checked water meter with that of the standard measuring instrument, the valve error that the water meter reads will be acquired.
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Ethernet Testing Network Performance
Networked Communication Solutions, LLC
Xena Networks and Veryx Technologies have created an innovative Ethernet test platform that combines Xena’s high performance, wire-speed Ethernet test hardware with Veryx’s broad portfolio of IP & Ethernet functional and conformance test suites. The result: an affordable, high-performance platform for IP & Ethernet load stress, protocol conformance & functional verification testing.
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Tri-Temp Test Handler
SIA-118 Series
Whether you are testing at room, cold or hot temperatures, our tri-temp test handlers are suited for a wide range of applications, from the basic to the most stringent and demanding test requirements. The SIA-118 series offers an open platform for packages from 3 x 3 mm up to 100 x 50 mm at a temperature range from -55 °C to +125 °C and optional full temperature range from -60 °C to +175 °C. Offering easy and flexible configuration, this tri-temperature handler supports both Kelvin and PTB conta...show more -
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2-Channel 40KSPS Datalogging Oscilloscope / 2-Channel 5.5 Digit DMM CF Card
CFD200
The CFD200 is a new concept in test equipment that allows a PDA, laptop or tablet PC to be turned into a dual channel Digital MultiMeter with sophisticated analysis capabilities. SmartAnalysis software facilitates step-by-step fault investigation with instant display of results and an interactive diagnostic guide. With the CFD200 it is possible to integrate multiple measurement functions into a single hardware/software platform, providing high-level analysis features and a small, lightweight and...show more -
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PXI/cPCI Modules
As a leading provider of PXI products in Asia’s test & measurement market, ADLINK has devoted its extensive field experience to the PXI platform. After more than ten years and developing more than 100 PXI products for automation and testing, and as a sponsor member of the PXI System Alliance, ADLINK continues to expand PXI and PXI Express offerings with innovative products, meeting the unique needs of high-speed and high-bandwidth applications, such as spectral monitoring and signal intelligence.
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Storage Test
Teradyne, Inc. is a leading global supplier of Storage Test solutions. Since delivering our first Hard Disk Drive tester in 2007, we have been supporting our customers in producing the best HDD products in the market. Enabled by our scalable high-density architecture, high-speed automation, precision HDD handling, and carefully controlled test environment, our customers have access to a single platform for all their HDD tests that can keep up with their aggressive production schedules.
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RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
