Storage Test

Teradyne, Inc. is a leading global supplier of Storage Test solutions. Since delivering our first Hard Disk Drive tester in 2007, we have been supporting our customers in producing the best HDD products in the market. Enabled by our scalable high-density architecture, high-speed automation, precision HDD handling, and carefully controlled test environment, our customers have access to a single platform for all their HDD tests that can keep up with their aggressive production schedules.

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TestStation Product Family

Teradyne, Inc.

TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.

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TestStation Multi-Site Inline

Teradyne, Inc.

TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.

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Test System Optimized for High Volume Production Testing of Integrated Circuits

ETS-364 / ETS-600 - Teradyne, Inc.

The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.

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Test System

UltraFLEX - Teradyne, Inc.

The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.

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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications

ETS-88RF - Teradyne, Inc.

Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.

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Image Sensor Test System

IP750 - Teradyne, Inc.

Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.

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High-Speed Memory Test Solution

UltraFLEX-M - Teradyne, Inc.

The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.

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Fastest In-Circuit Test Platform

TestStation - Teradyne, Inc.

Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.

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Automated Inline In-Circuit Test Solutions

Teradyne, Inc.

Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.

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TestStation Rackmount

TSR - Teradyne, Inc.

TestStation Rackmount (TSR) is designed for easy integration into high-volume automated manufacturing lines. This solution is a collection of specifically designed hardware modules that can be easily integrated into standard or custom automation handling equipment.

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True Concurrent Test

TestStation Duo - Teradyne, Inc.

The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.

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Lower-Cost Small Footprint In-Circuit Test System

TestStation LHS - Teradyne, Inc.

The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.

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Offline In-Circuit Test Solutions

Teradyne, Inc.

TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.

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Disk Drive Test System

Saturn - Teradyne, Inc.

The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.

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