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Low-Thermal EMF LXI Matrices
Pickering low-thermal EMF LXI matrices offer excellent thermal stability and substantially reduced thermal EMF figures when compared to a conventional switching matrix. Typical applications include signal routing in automatic test equipment, selecting thermocouple inputs, switching amplifier gain circuits and high accuracy DC microvolt measurements.
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Digital Wideband Transceiver Analysis
S94610B
Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver typ...show more -
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Pull Off Tester
Serie DY-2
The DY-2 FAMILY of automated pull-off testers covers the complete range of pull-off applications with unmatched ease of operation and a unique capability to store a complete record of the test.Pull-off testing is one of the most widely used test methods in the construction industry. This is reflected in the huge number of standards dedicated to the method.
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Air Data Calibrator
ADC-2550
TestVonics ADC-2550 Air Data Calibrator is a high accuracy pitot static calibrator. The ADC-2550 is capable of controlling and measuring Altitude and Airspeed pressures with the highest degree of accuracy. The control and measurement range of the test system can meets or exceed requirements for both commercial and military applications - the ADC-2550 is Nationally Stock Listed. The ADC-2550 is a derivative of the ADC-2500 Series. It features a touchscreen interface, a mid range 23PSIA sensor. It is ideally suited for Automated Test Equipment (ATE) applications.
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Dual Channel Optical Power Meter
UC8202
The UC8202 Dual channel optical power meter offer superior performance for the test of DWDM components, AWG , WSS, OPM, PLC components, optical amplifiers, transceiver/receiver and other general purpose of fiber optical test and measurement applications
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Material Test/Cure Rooms
Our walk-in Materials Test and Cure Rooms offer reliable, efficient environmental controls for a variety of applications including shelf-life testing and storage, ceramic and concrete wet and dry cure regimens (including ASTM-compliant units), thermal shock chambers, general, medical and packaging materials.
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Antenna Test Chamber for Automotive Radar
ATS1500C
The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Semiconductor Test & High-Speed Digital
Rosenberger Hochfrequenztechnik GmbH & Co. KG
The wide product range means that a variety of semiconductor test applications and high-speed digital applications are possible. To meet the ever-challenging technological requirements and increasing demands of the semiconductor test equipment industry, Rosenberger has developed and produces multiport mini-coax connectors and cable assemblies – for applications up to 40 GHz – , and spring-loaded coax products. Probes and customer-specific cable assemblies are also available.
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Insulator Testers
*Designed to test lightning arresters for damage or deterioration*Live line tester tests lightning arresters prior to energizing*For use on system voltages from 4kV to 25kV line-to-line and up to 69kV with optional add-on resistor sticks*Versatile for overhead and underground applications
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as ...show more -
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Ethernet/LXI hybridNETBOX 16 Bit Digitizer and AWG - 40 MS/s on 2 DAQ Channels and 2 AWG Channels
DN2.813-02
The hybridNETBOX DN2.80/81x series internally consists of a Digitizer and an AWG that can run together or independently. That allows simultaneous data generation and data acquisition for stimulus-response tests, ATE applications, MIMO applications or closed-loop applications. Used independently, the digitizer can acquire test data in the field and the AWG can replay this test data in lab. The hybridNETBOX offers 16 bit resolution and is available with sampling rates of 40 MS/s and 125 MS/s. The hybridNETBOX can be installed anywhere in the company LAN and can be remotely controlled from a host PC.
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RF Signal Generators
The RF signal source mainly acts as a stable local oscillator signal in the test, or generates various types of modulated signals, and the two-tone signal is used for signal excitation, receiving sensitivity testing and other applications. When choosing the RF signal source, the frequency range of the signal output, power requirement size, modulation type, frequency stability, amplitude accuracy and many other factors needs to be considered.
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Production Stand-Alone
PSA
Using PSA, test engineers can build sequences of applications in the built-in AEX (Application EXecutive) manager using if then else goto capabilities. Sequence builders can also include additional capabilities through DOS/Win command line calls, create serial number logged test reports, export tests results to a database etc.. PSA includes drivers for all JTAG Technologies controller hardware past or present.
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PCI Digitizers
ATS850
ATS850 digitizers offer the lowest cost solution for data conversion in automated test applications and automotive R&D. With its low cost, high signal quality and robust analog front-end, ATS850 is ideal for OEM applications that are very cost-sensitive.
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PCI-6123, 8 AI (16-Bit, 500 kS/s/ch), 8 DIO, PCI Multifunction I/O Device
779408-01
8 AI (16-Bit, 500 kS/s/ch), 8 DIO, PCI Multifunction I/O Device - The PCI‑6123 is a simultaneous-sampling, multifunction DAQ device. It offers analog input, digital I/O, two 24‑bit counters, and digital triggering. The PCI‑6123 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements. The PCI‑6123 dimensions require chassis slots that can accommodate full-length PCI modules.
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PXI-6230, 8 AI (16-Bit, 250 kS/s), 4 AO, 6 DI, 4 DO, Bank-Isolated, PXI Hybrid, Multifunction I/O
779616-01
8 AI (16-Bit, 250 kS/s), 4 AO, 6 DI, 4 DO, Bank-Isolated, PXI Multifunction I/O Module—The PXI‑6230 is a bank-isolated DAQ device designed for voltage I/O. It offers analog I/O, digital input, digital output, two 32‑bit counters, and digital triggering. The digital input and outputs are compatible with 5 V TTL/CMOS signals. It combines the safety and performance benefits of isolation with high-performance timing, amplification, and calibration technologies to offer accurate measurements and prec...show more -
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Advanced Power System: Dynamic DC Power Supply, 120 V, 16.7 A, 2000 W
N7976A
The N7976A is designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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USB-6353 , 32 AI, (16-Bit, 1.25 MS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device
781441-01
32 AI, (16-Bit, 1.25 MS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device - The USB‑6353 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6353 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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9-Slot 3U PXI Express Chassis with AC - Up to 8GB/s, All Hybrid
PXES-2590
The ADLINK PXES-2590 is a 9-slot PXI Express chassis equipped with advanced features and functions. Compliant with PXI Express and cPCI Express specifications, the PXES-2590 offers one system slot, one system timing slot, and seven hybrid peripheral slots for versatile test and measurement applications requiring enhanced bandwidth. The hybrid-slot design accepts installation of CompactPCI, PXI, CompactPCI Express, and PXI Express modules into any peripheral slots in PXES-2590, maximizing flexibility. The PXES-2590 is built on a four-link PXI express chassis with 8 GB/s system bandwidth, and 2 GB/s slot bandwidth for all peripheral slots.
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2.5mm Test Wire Test Probe Pin
CX-3C
Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test wire test probe pin 1.Application: Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool.
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PXI 3A Power MUX BRIC, 24-Channel, 12-Pole
40-571-306
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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C Series PROFINET Interface Module
The C Series PROFINET Interface Module provides two PROFINET interface ports that enable you to reliably connect programmable logic controllers (PLCs), I/O, sensors, and drives over long distances in industrial environments. PROFINET is an application protocol that uses familiar concepts from PROFIBUS that are implemented on the physical layer of Ethernet. The C Series PROFINET Interface Module includes NI-PROFINET driver software for human machine interface (HMI) and supervisory control and data acquisition (SCADA) applications. You can perform PROFINET device automated test using these interfaces.
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PCI High Density Pecision Resistor Card, 9-Channel, 3Ω To 6.97kΩ
50-298-030
The 50-298-030 is a high density programmable resistor card with 9 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Install and Development
Whether it is an error proofing application or a complete end-of-line (EOL) test solution, ARC services what we sell by providing quality onsite installation and development as required by the project. Whether it is a senior engineering resource or our expert team of engineering technicians, ARC can provide the best solution to get your application up and running at your site when completed.
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 2.97MΩ
40-252-051
The 40-252-051 is a programmable resistor module with 1 channel which can be set between 3Ω and 2.97MΩ with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Function Tester with Low Number of Channels
UTP 6010 RF
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels...show more -
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1kV, 120 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3106A-NOACC
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 62.1Ω
50-298-011
The 50-298-011 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.