System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Socket Phone
Design for phone device test and system verify.Phone device: CPU,flash,baseband,LPDDR,power IC.etcPitch range from 0.30 to 1.27mmKey material: PEI,Peek,Torlon,PPS.etcContact with top pogo pin
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Transformer Resistance Testing
Weshine Electric Manufacturing Co., Ltd
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the WESHINE Transformer Ohmmeter (VS-3110 series) of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
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PXI-2559, 2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module
778572-59
2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module - The PXI‑2559 is a general-purpose switch module featuring two independently terminated single‑pole double‑throw (SPDT) relays. You can use it to add flexibility to your video switch network or to maintain uniform signal paths across multiple channels when building high-channel-count multiplexers. The PXI‑2559 termination resistors minimize reflections on open channels and protect your source or device under test from damage. The module al...show more -
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PXIe Vector Network Analyzer, 300 kHz to 20 GHz
M9374A
Pay for only the frequency range you need with a choice of six frequency ranges up to 26.5 GHz Improve accuracy, yield and margins with the best PXI VNA speed, dynamic range, trace noise and stability Add functionality to your test system with a full 2-port VNA that fits in a single PXI slot Address your multiport applications needs by cascading multiple models Increase throughput and lower costs by adding modules in a multi-site configuration
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sbRIO-9225, Non-Enclosed, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module
780588-01
Non-Enclosed, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The sbRIO‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three sbRIO‑9225 channels. Non-enclosed modules are designed for OEM applications.
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PCI High Density Pecision Resistor Card, 4-Channel, 3Ω To 102kΩ
50-298-134
The 50-298-134 is a high density programmable resistor card with 4 channels which can be set between 3Ω and 102kΩ with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 11.4MΩ
50-298-153
The 50-298-153 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 11.4MΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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ARINC 429 Bus Interfaces
AIM’s > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.
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PCI Precision Resistor Card 4-Channel, 2Ω To 102kΩ
50-297-134
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Battery Capacity Analyzer
601B
The 601B Battery Capacity Analyzer addresses the need to test and maintain sealed lead acid (SLA) batteries used in backup power UPS, emergency lighting, fire alarms, security systems, and many other electrical systems. By quickly characterizing a battery's response to a load resistance and measuring the battery's internal resistance, this meter displays the remaining battery capacity as an indicator of the battery’s health. Powered by the battery under test, the 601B supports testing of both 6 V and 12 V storage type lead acid batteries.
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PXI-2532B, 512-Crosspoint PXI Matrix Switch Module
782383-01
512-Crosspoint PXI Matrix Switch Module—The PXI‑2532B is a high-density PXI matrix switch module built to serve high‑channel‑count automated test systems. Featuring compact reed relays with switching speeds up to 2,000 cycles/s, the PXI‑2532B can be configured in more than 10 matrix topologies by using different terminal block accessories. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Circular Locus Tester
TF225
TESTEX Testing Equipment Systems Ltd.
Circular Locus Tester, to determine surface deterioration and quality of fabrics (wool, chemical fiber, mixed, kitted and woven fabrics). Using an active friction system, fabric is rubbed against a nylon brush and abrasive or an abrasive only under controlled conditions. Results of the test are achieved in minutes. The relative motion of the locus specimen grip and the abrasive platform is a circle with a relative speed of 60+/-1 r/min. The grip offers pressure to the specimen which is adjustable with a tolerance of +/-1%. For added control and safety, the machine is equipped with a self-stop switch.
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Connect Generators to the Grid
GridCode
DIgSILENT has developed a new verification tool called DIgSILENT GridCode. The software has been designed in response to the need to verify whether a conventional or renewable power plant is compliant with local Grid Code interconnection requirements on basis of generating unit tests. There is a new trend towards verification of requirements at the point of interconnection of a power plant using transient stability simulations with numerical models. An increasing number of Transmission System Op...show more -
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Transmission & Hydraulic Test Stands
Our equipment tests automatic and automated-manual transmissions. On and off-highway transmission test stands, transmission and hydraulic component test stands and valve body test stands. AIDCO Test Systems offers the latest in modern, electric motor and hydrostatically-driven transmission test stands. All units may include an air-cooled eddy current absorber (standard on the 450E), resulting in minimal dyno test cell noise and reduced maintenance.
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Phoromatic
Phoromatic is a web-based remote management system developed for the Phoronix Test Suite. Phoromatic allows the automatic scheduling of tests, remote installation of new tests, and the management of multiple test systems all through an intuitive, easy-to-use web interface. Tests can be scheduled to automatically run on a routine basis across multiple test systems. The test results are then available from this central, secure location.
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Electrodynamic Vibration Test Systems
PET-series
Vibration controller: Enables complicated vibration tests being coupled with the vibration controller.
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Transceiver Driver
S-112
Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.
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Photovoltaic System Bypass Diode Tester
FT4310
Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
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SD-SDI Test Signal Generator
7750TG
The 7750TG Test Signal Generator provides a cost effective method of generating SDTV 270Mb/s test signals. The 7750TG is ideal for checking signal path integrity, monitor alignment or to determine system performance over varying cable lengths. The 7750TG generates test signals in 525 line and 625 line SMPTE 259M-C video formats and offers four 270Mb/s outputs.
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Real-time Lubricant Analyzer
RT-Lube
Instrument platform that is capable of real time, on site detection of wear elements in lubricating fluids. Currently the process to test lubricants is to take a manual sample for lab testing. This approach is expensive, labor intensive and time consuming. The RT-Lube Analyzer can replace this manual approach by automatically sampling, on a pre-scheduled basis, the fluid under consideration. The analysis is immediate and is communicated back to cloud based storage systems where the analytics can take place.
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Diagnostic Test Tool
BIRST™ (Built-In Relay Self-Test)
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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Compact Cable Test Van
ETL-8
Van-based cable test and fault location system ETL-8 is used for testing cable insulation and locating cable faults using a variety of methods.
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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PXI 10W Programmable Resistor Module, 1-Channel, 1.5Ω to 925Ω
40-253-021
The 40-253-021 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 925Ω with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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4051 Series Signal/Spectrum Analyzer (3Hz to max. 67GHz)
4051
4051 series signal / spectrum analyzer has good expansion capacity, and can improve the features by means of flexible configuration options and also can construct testing system or redevelop by means of the output interface of all digital and analogue signals. The analyzer is applicable for signal and equipment test of fields including aviation, aerospace, radar detection, communications, electromagnetic countermeasure, and navigation.
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Dynamic Electric Motor Analyzers
Baker's dynamic motor test and monitoring instruments are built to conduct condition monitoring tests of motors and generators from a Motor Control Centre (MCC), or through a Baker EP1000 connection unit. The Baker EXP4000 dynamic motor analyser is a low-voltage, AC- and battery-operated instrument that test motors and generators while they are in operation. The EXP4000 provides health and performance data on the motor, the motor's load, and incoming power to assess motor performance and suitability in context of the entire machine system it supports.