System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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PXI Very High Density Versatile 2 Amp Multiplexer
40-612A-002
The 40-612A Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves. Typical applications include signal routing in ATE and data acquisition systems. The 40-612 module uses high quality electro-mechanical relays, connections are made via a front panel 160 pin DIN41612 connector....show more -
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 239Ω
40-251-113
The 40-251-113 is a programmable resistor module with 4 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Microcomputer Three-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditio...show more -
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Temperature Forcing System
ETF-SERIES
Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Combined Temperature and Altitude Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Altitude & Temperature Test Chamber combine Altitude and temperature to test various components and products, especially the aircraft avionics. Automatic controlled vacuum system provide a precise altitude simulated condition up to 30000 meters. Available to connect cable for the electronic performance test.
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Insulation Resistance Meter
AMIC-15k1
*The partial discharge indicator PDI.*Diagnosis of insulation systems based on standard measurements of IR, DAR, PI, SV, RT, DD*Allows to test the electrical durability of the tested object - indication of breaking voltage.*The high resistance to electromagnetic interference ensures uninterrupted operation in power plants and near high-voltage transmission lines up to 1200 kV AC and 500 kV DC.
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TO-CAN Package Inspection System
7925
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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DC Hi-Pot Tester
3010HP, 3025HP & 3050HP
The DC Hi-Pot test is an important part and parcel of the electrical safety tests mandated by standards organization world-wide. More than 80 per cent of faults in electrical and electronic systems are due to weak insulation caused by environmental factors such as dirt, grease, temperature stress, humidity, etc that affect the dielectric strength of the insulation material.
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PCI Resistor Card 2-Channel 2 Ohm To 131 Ohm With SPDT
50-293-134
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 2.04k Ohm - SPST
40-294-122
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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In-Process Wafer Inspection System
7945
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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VIP Cabin Management Systems
Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
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Chamber/Pyroelectric Task
Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization respo...show more -
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Production Line Acoustic Test Chamber
PLATC
The Production Line Acoustic Test Chamber from GRAS is designed for quick and qualified acoustic test of cell phones, tablet PCs, Bluetooth speaker systems etc., including frequency response, THD, Rub & Buzz and microphone test using optional sound source. The chamber has a number of connections for injecting test and control signals to the test object (DUT).Benefits include:Repeatable testing and reliable dataEasy open/close for quick and safe change of DUTFlexible test jig for easy adjustm...show more -
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PCI High Density Potentiometer Card 2-Channel, 16-Bit, 0 To 65k Ohm
50-296A-021-2/16
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Air Data Calibrator
ADC-2575
TestVonics ADC-2575 Air Data Calibrator is a high accuracy pitot static calibrator. The calibrator is capable of controlling and measuring Altitude and Airspeed pressures with the highest degree of accuracy. The control and measurement range of the test system can meets or exceed requirements for both commercial and military applications. The ADC-2575 is a derivative of the ADC-2550 Series. It features a touchscreen interface, a mid range 23PSIA sensor. It is ideally suited for Automated Test Equipment (ATE) applications.
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Solid State PIN Diode Transfer Switch, 100 MHz to 8 GHz
P9400A
The Keysight P9400A solid state PIN diode transfer switch offers outstanding performance in terms of port-to-port isolation, switching speed and low insertion loss over a broad operating frequency range of 100 MHz to 8 GHz. The P9400A is particularly well-suited for ultra-fast RF and microwave switching applications in instrumentation, communications, radar, switch matrices and various other test systems where high isolation, speed and lifetime of a switch are critical.
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Mezzanine System
5089
The 5089 provides eight channels of 12 bit A/D conversion using the Analog Devices AD7328, and is suitable for medium resolution medium speed applications.
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Teraohmmeter/IR Tester
98x
The new 981i and 983i Teraohmmeters are designed to tackle the toughest High Resistance measurement applications. Demanding applications that most other IR testers won’t measure up to. So when it’s time to test higher voltage IR values like today’s electric vehicle systems and higher voltage solar arrays — look to Vitrek to deliver the IR tester you need for your production line.
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Compact System for Chemical Analysis Technology
Small test system based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of measuring instruments for chemical analysis in a high mix / medium volume environment.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Smart Aircraft System
The Astronics Smart Aircraft System makes that possible. Our patented system enables the immediate, cabin-wide gathering of thousands of data points using sensors & IoT (Internet of Things) technology. The result? You get the insightyou need—when you need it. Insight that helps you on every flight. Insight that allows you to improve your operational efficiency, your cabin safety, and your overall passenger experience.
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Amplified Noise Modules
NC1000 Series
The NC1000 Series amplified noise modules produce AWGN as high as +13 dBm, and have bandwidths up to 10 GHz. The high power modules are designed to test noise immunity for Cable TV equipment, secure communication channels, and military jamming systems. The lower power modules, <= 0 dBm, are random jitter sources for many applications including, PCIexpress, Infiniband, and 10 GigE.
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Testing of Current Measuring Transformers
All components from this category can be integrated into an existing current transformer test system. When selecting CT test components, both the type of converter to be tested and the required current are important.
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Test Charts
iQ charts
Image Engineering GmbH & Co. KG
The basis of our test chart portfolio are the ESSER TEST CHARTS owned by Image Engineering and known worldwide for their high quality which we continually improve. Included in the extensive program are HDTV charts for broadcast, multipurpose charts as well as the UTT chart (Universal Test Target), the leading system for the standardized digitalization of archives, which is already being used by the Metropolitan Museum in New York.
