Showing results: 301 - 315 of 334 items found.
-
ams AG
Linear array sensors consist of a linear array of integrating photosensing pixels which measure incident light over a user-defined exposure time and generate a voltage or digital output which represents the light exposure at each pixel. The sensors are available in a variety of lengths and pixel resolutions. The analog output may be directly interfaced to an ADC for digital processing or for comparing black/white thresholds. Applications include contact image sensing, optical character recognition, edge detection, and object measurement in products such as copiers, document scanners and spectroscopy.
-
HORIBA, Ltd.
TE and cryogenically cooled CCD and EMCCD scientific cameras for ultra sensitivity from 200 nm to 1100 nmHORIBA Scientific offers a complete line of spectroscopic multi-channel detectors for scientific research. For spectral detection from UV to near-IR, two dimensional CCDs and indium gallium arsenide linear arrays offer a faster acquisition option over single point detectors with relatively high sensitivity. Coupled with HORIBA’s range of aberration corrected, flat field imaging spectrographs, custom spectroscopy packages can be assembled for a variety of applications.
-
LabRAM Soleil Nano -
HORIBA, Ltd.
Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
-
FemtoFiber dichro midIR -
TOPTICA Photonics Inc
The new FemtoFiber dichro midIR represents an ideal laser source for mid-infrared spectroscopy and imaging. It provides a tunable broadband output in the wavelength range of 5 to 15 m (20 - 60 THz, 670 - 2000 cm-1). The unique 400 cm-1 broad emission spectra allow to excite a wide range of materials at the same time. The air-cooled system is based on TOPTICAs proprietary fiber laser technologies and includes a difference frequency generation (DFG) unit as well as all necessary electronics into the same box. All functions and features are computer controllable by Ethernet or USB interfaces.
-
OptoScope SC-10 systems -
Optronis GmbH
SC-10 systems are based on the SC-10 main unit and cover a very large range of applications thanks to their flexibility. With a time resolution of 2 ps, a very high temporal resolution streak system is available. The main unit itself uses a fused silica input window, maintaining sensitivity well into the UV range. Deflection units for triggered and synchroscan operation are available. The configuration with a second deflection unit for extension with an orthogonal time axis is also possible. SC-10 systems are well suited for applications in the field of time-resolved spectroscopy and offer a wide range of options for optical coupling.
-
Lynx R Series -
Xenics
The Lynx R series, based on an in-house developed linear InGaAs detector, is a high-performance short-wave infrared (SWIR) camera providing high speed and quality line-scan imaging.The Lynx R cameras are able to image line rates up to 40 kHz, for demanding spectroscopy applications.The camera comes with an industry standard CameraLink or GigE Vision interface.Benefits & Features• High speed line-scan imaging up to 40 kHz (10 kHz for the 2048)• High resolution 1024/2048 Rectangular pixels option (12.5μm x 250μm)• CameraLink or GigE Vision interfacing
-
T-Series -
MKS Instruments
T-Series Inline Gas Analyzer improves gas measurement accuracy over the traditional non-dispersive infrared (NDIR) analyzers using Tunable Filter Spectroscopy (TFS™), a spectroscopic scanning technique capable of generating slices of spectra in the infrared region. Each scan produces an absorption spectrum which is used to identify compounds and provide concentration values. TFS technology improves gas identification accuracy and selectivity by subtracting out spectra from interferent gases within the same infrared regions. This spectral processing capability also provides multi-component measurement.
-
ZOLIX
Combining volume phase holographic (VPH) grating, wavelength optimized optics and deep-cooled CCD camera, Zolix is proud to present stateof-the-art Omni-iSpecT Raman spectrograph. It solves two essential problems concerned with Raman spectroscopy, speed and sensitivity. VPH spectrograph allows you to have faster acquisition and better S/N ratio, it is ideal for low light Raman applications such as remote detection, ultra fast Raman mapping etc, its lens-based design delivers minimum distortion at focal plane and ensures best image quality, which gives you high resolution and large spectral range simultaneously, also perfect image quality is ideal for multi-channel applications without cross-talking. The Omni-iSpecT's rugged and compact design make an ideal module for in-the-field and industrial applications; It is still suitable for academic research with research-grade performance; The Omni-iSpecT also provides the SDK file for secondary development.
-
BA8100 -
B&K Precision Corporation
The BA8100 is designed to accurately measure the internal impedance of a single cell or battery stack with voltages as high as 80 V. In addition to impedance, auxiliary measurements include voltage, current, phase, capacitance, inductance, quality factor and more. With the provided software, the BA8100 can perform Electrochemical Impedance Spectroscopy (EIS) across a frequency range of 50 mHz to 10 kHz. The impedance spectrum can be evaluated through the Nyquist and Bode plot tools to determine effective series resistance (ESR) and track battery health. Included with the BA8100 is a self-test fixture to verify the instrument’s performance or compensate for resistance introduced by the test leads.
-
SPRITE XT -
M Squared Lasers
Sprite XT is a flexible ultrafast, femtosecond laser source. It delivers stability, reliability and productivity and is equally at home in the lab or as part of an OEM application. Choose your output power (up to multi-Watts), pulse width (femtosecond or picosecond models), wavelength range (fixed wavelength or tunable), and pulse repetition rate (<80 MHz to multi-GHz). All Sprite models are designed for alignment-free and maintenance-free operation and can be controlled from a web browser. It’s ideal for multi-photon excitation (MPE) and FLIM, quantum optics, time resolved spectroscopy, nonlinear optics, pump-probe experiments, microscopy, amplifier seeding, and electro-optic sampling.
-
FLAME-CHEM -
Ocean Optics, Inc.
FLAME-CHEM spectrometers are fully integrated UV-Vis and Vis-NIR systems for measuring absorbance and transmission of liquid samples in cuvettes. FLAME-CHEM is a great option for teaching labs and research facilities where users seek the performance and flexibility advantages of the Flame spectrometer in a compact, small footprint instrument. Each FLAME-CHEM system comprises a preconfigured Flame spectrometer, a direct-attach light source and a cuvette holder for 1 cm pathlength cuvettes – all in a single package. UV-Vis (200-850 nm) and Vis-NIR (350-1000 nm) models are available. Add OceanView spectroscopy software (purchased separately) to complete your system.
-
HORIBA, Ltd.
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
-
Ametek Scientific Instruments
The Materials Lab XM product provides a fully integrated reference grade time domain and AC measurement platform. No need to switch sample connections between techniques. Time domain measurements include I-V (current voltage) characterization as well as fast pulse techniques. AC testing techniques include everything from single-sine analysis, to multisine / Fast Fourier Transform for faster low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. Measurements of electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance are all provided from the XM-studio MTS software platform, together with integrated equivalent circuit analysis functionality.
-
AD14-65Mx16AVE -
Ultraview Corporation
14-bit 16-concurrent channel 65MSPS A/D board for demanding large-system uses, where signals on multiple time-aligned channels need to be observed with high SNR, such as RADAR, nuclear instrumentation, ultrasound, medical imaging, spectroscopy, communications systems, RF component and antenna testing and other critical applications. An on-board low-jitter LMX2581-based RF synthesizer allows any A/D sampling rate between 20MSPS and 65MSPS to be specified in software. A second on-board LMX2581 with synchronized reference can be optionally used to output four stimulus clocks on SMA connectors that can be vectored to any combination of 4 external transmitters, microwave pulse generators, laser modulators, and other devices.
-
HDK -
Laser-Detect Systems Ltd.
LDS Hybrid Detection Kit (HDK) - By operating the sensors in parallel, and in real-time, results in much higher probability of detection than the performance of each specific detector. Integrated solution including laser detection technologies, dual Ion Mobility Spectroscopy (IMS) and chemical detection, that operate in synch. The HDK employs a proprietary algorithm to processes the feeds from each of the detectors. Operating the sensors in parallel, and in real-time, results in a much higher probability of detection than the performance of each specific detector. HDK also provides much lower false positive rate, even in conditions that hinder detection by each of the specific techniques.
