Showing results: 106 - 120 of 332 items found.
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Agilent Technologies
Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Evans Analytical Group®
ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards. ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identifcation and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements
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National Technical Systems
The use of Scanning Electron Microscopy / Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in the analysis of failure related issues of printed circuit boards (PCBs), assemblies (PCAs), and electronic components (BGA, capacitors, resistors, inductors, connectors, diodes, oscillators, transformers, IC, etc.) is a well-established and accepted protocol. As opposed to or simply in addition to normal optical microscopy, SEM/EDS allows for the “inspection” of areas of interest in a much more informative way.
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EV 2.0 Series -
HORIBA, Ltd.
To address new requirements in Semiconductor, lighting devices, automotive components, flat panels, MEMS sensors, memory chips, and logic electronics processed in the industry using dry etch, cleaning and (PE)CVD, HORIBA has introduced a unique generation of sensor dedicated to Advanced Endpoint Control, Fault Detection and Chamber Health Monitoring.
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Hamamatsu Photonics K.K.
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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K102 -
Kromek Group plc
The K102 is a miniature USB-based multichannel analyser for gamma spectroscopy applications. It is perfect for colleges, universities and research work, and includes gamma spectroscopy software.
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Kymera 328i -
Andor Technology Ltd
Intelligent and multi-modal spectroscopy platform for Physical and Life science. Adaptive Focus, automated optimization for the best quality of focus. 328 mm focal length, F/4.1 aperture; Ideal combination for a wide range of applications ranging from luminescence/photoluminescence spectroscopy to more demanding, higher resolution Raman spectroscopy or plasma studies.
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Evans Analytical Group®
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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QUANTAX Micro-XRF -
Bruker microCT
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Edinburgh Instruments Ltd
Our experience and expertise in instrumentation for fluorescence spectroscopy and laser flash photolysis spectroscopy is second to none, spanning decades with over 1000 systems installed in universities and leading research laboratories worldwide.
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TriVista -
Teledyne Princeton Instruments
TriVista spectrometers are 2-stage or 3 stage spectrographs designed for demanding spectroscopy applications in material science, chemistry and life science. It is the most versatile and customizable spectroscopy platform for Raman, photoluminescence, resonance Raman and fluorescence.
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Femtochrome Research, Inc.
The FR-203 provides periodic linear optical delay (~200ps) for ultrashort laser pulses. It is useful for applications such as time resolved spectroscopy and time domain terahertz spectroscopy. A well defined optical delay is generated with interferometric precision.
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KURO® -
Teledyne Princeton Instruments
The KURO® is the first back-illuminated scientific CMOS camera. With high sensitivity and fast frame rates the KURO is optimal for applications such as hyperspectral imaging, astronomy, cold-atom imaging, quantum imaging, fluorescence spectroscopy, and high-speed spectroscopy