Showing results: 121 - 135 of 501 items found.
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Talon RTR 2654 -
Pentek, Inc.
- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 800 MHz to 26.5 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- 4U chassis with front panel removable SSDs- Storage capabilities to 245 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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National Technical Systems
The use of Scanning Electron Microscopy / Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in the analysis of failure related issues of printed circuit boards (PCBs), assemblies (PCAs), and electronic components (BGA, capacitors, resistors, inductors, connectors, diodes, oscillators, transformers, IC, etc.) is a well-established and accepted protocol. As opposed to or simply in addition to normal optical microscopy, SEM/EDS allows for the “inspection” of areas of interest in a much more informative way.
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Talon RTX 2684 -
Pentek, Inc.
- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 1 GHz to 26 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- Rugged 1/2 ATR MIL-spec chassis for harsh mechanical and thermal environments- Environmentally sealed- Internally conduction-cooled- Fully sealed for RF emissions with EMI power line filter- MIL-STD circular connectors- Compact and lightweight: about 23 lb (10.4 kg)- QuickPac® drive packs allow quick removal of all data storage up to 61 TB via the front panel- Ideal for UAVs, military vehicles, aircraft pods and outdoor environments- Sustained real-time record rates up to 4 GB/s- 12 to 28 VDC power supply- Optional GPS receiver for precise time and position stamping- SystemFlow® GUI, SystemFlow API, and Signal Viewer analysis tools- Optional telnet remote connection to recorder
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Talon RTS 2620 -
Pentek, Inc.
- Search and capture system using Sentinel™ Intelligent Signal Scanner- Captures RF signals up to 6 GHz- Capture and scan bandwidths up to 40 MHz- 30 GHz/sec scan rate- Selectable threshold triggered or manual record modes- 16-bit A/D with 75 dB SNR & 87 dB SFDR- Built-in DDC with selectable decimation range from 2 to 65,536- Built-in DUC with selectable interpolation range from 2 to 65,536- 3U to 6U 19-inch rackmount server chassis with hot-swappable HDDs- Storage capabilities to 192 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- Optional RF upconversion- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Talon RTR 2623 -
Pentek, Inc.
- Search and capture system using Sentinel™ Intelligent Signal Scanner- Captures RF signals up to 6 GHz- Capture and scan bandwidths up to 40 MHz- 30 GHz/sec scan rate- Selectable threshold triggered or manual record modes- 16-bit A/D with 75 dB SNR & 87 dB SFDR- Built-in DDC with selectable decimation range from 2 to 65,536- Portable system measuring 16.0" W x 6.9" D x 13.0" H- Lightweight, just less than 30 pounds- Storage capabilities to 30 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor
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Zetec, Inc.
Zetec scanning systems provide accurate and efficient scanning of surfaces. Our scanners are aided by our software for control of the scan to cover the inspection area and to acquire the scan data. Whether you’re inspecting with eddy current or ultrasound, you can take advantage of one of our standard scanning solutions, or have us customize a scanning solution to fit your specific needs.
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UVisIR Inc.
UVisIR'sreal-time long scanning autocorrelator measures laser pulses from femtosecond to picosecond. It is easy-to-use, real-time, dispersion-free, high-sensitivity and background-free! Long scanning range: 10fs-100ps. Real-time, dispersion-free and background-free scanning. High sensitivity: High-voltage(-1000VDC) PMT embeded! (Diode version is also available!). Broadband wavelength range: 500-1700nm.
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EIB 1500 series -
Heidenhain Corp.
*Interpolation and digitizing electronics for the real-time digital processing of positions from two scanning heads*Input: incremental rotatory HEIDENHAIN encoder with two scanning heads and distance-coded reference marks (relative orientation of scanning heads: 180° ± 5°)*Output: EnDat 2.2, Fanuc Serial Interface, Mitsubishi high speed serial interface*Integrated subdivision: 16 384-fold
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Galion -
Halo Photonics
The Galion LiDAR, distributed by SgurrEnergy, has been optimised for collecting data for wind power applications. The all-sky scanning capability enables many more data collection opportunities than VAD scanning alone.
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SA-AFM -
AFM Workshop
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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Heidenhain Corp.
Exposed linear encoders consist of a scale or scale tape and a scanning head. Their photoelectric scanning method is touch-free and wear-free, detecting graduation lines just micrometers in width and producing output signals with very short signal periods.
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Evatronix SA
eviXscan 3D Suite 2.0 is a comprehensive software platform that delivers the most powerful and user-friendly tools for scanning and mesh processing within straightforward workflow.With eviXscan 3D Suite 2.0 the scanning process is more easy to use and faster than ever before.The clear workflow will guide the user in all scanning steps from basic configuration to the final mesh processing and will enable to achieve significant productivity gain in work with eviXscan 3D products.
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Femtosecond NSOM -
Del Mar Photonics, Inc.
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.