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Showing results: 436 - 450 of 502 items found.

  • Atomic Force Microscope

    3DM Serirs - Park Systems Corp.

    Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.

  • Semiconductor

    Aerotech, Inc.

    Aerotech has a long history of engineering and manufacturing motion systems and components for high precision wafer processing, scanning electron microscopy (SEM), wafer bumping, 450 mm wafer manufacturing, lithography equipment and advanced laser micromachining. We also specialize in systems and components for vacuum applications, such as EUV lithography. So whether you need off-the-shelf wafer bumping components or a custom-engineered SEM system manufactured and tested to exacting specifications, Aerotech can provide the optimal solution for your application.

  • Spectrometers, Vacuum

    McPherson, Inc.

    A compact and versatile vacuum ultraviolet monochromator. A selection of aberration-corrected diffraction gratings is available so you can tailor the instrument to your wavelength of interest and application. Connect this instrument directly to your vacuum plasma physics experiment or build an intense UV tunable source. It is available as a scanning monochromator, as a spectrometer, or as a spectrograph with microchannel plate or direct-detection CCD. The Model 234/302 is popular in systems due to its compact design, high throughput and resolution. It is also available with an additional entrance or exit port.

  • Fourier Transform Optical Spectrum Analyzer, 350 - 1100 nm

    OSA201C - Thorlabs, Inc.

    Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.

  • Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm

    OSA202C - Thorlabs, Inc.

    Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.

  • Safety Laser Scanner

    Leuze electronic GmbH + Co. KG

    Thanks to the configurable protective and warning fields, safety laser scanners can be used versatilely for danger zone and access guarding. Their compact design makes them ideal both for stationary and for mobile applications. Our RSL 400 safety laser scanners are characterized by their performance, robustness and easy handling. Thanks to its high operating range of 8.25 m and a scanning angle of 270°, it can monitor even large areas. The series also includes models for integration via PROFIsafe/PROFINET interface and models with data output for the navigation of automated guided vehicles.

  • Optical 3D Scanner

    ATOS Core - GOM GmbH

    ATOS Core is the specialist for the three-dimensional measurement of small components up to 500 millimeters in size. The sensor forms the basis for a diverse range of measuring tasks – from simple 3D scanning to fully automated measurement and inspection processes. The ATOS Core is used for the three-dimensional measurement of small and medium-sized objects such as ceramic cores, and cast or plastic parts. To capture also large objects of several meters in optimal workflows, the ATOS Core can be easily combined with digital photogrammetry of GOM's optical 3D coordinate measuring machine TRITOP.

  • Low-noise High-voltage Amplifier For Tube-scanners -

    HV200/5 - Anfatec Instruments AG

    The HV200/5 is a high-precision HV-amplifier designed for the control of tube scanners. It takes three input voltages In X, In Y and In Z (-10 V to + 10 V), amplifies them separately (input gain switches: x1, x2, x5, x10, x20) and adds an offset voltage between -10 V and +10 V. In a 2nd stage, the signal is amplified by a factor of 20. This enables its use as HV amplifier in scanning image acquisition applications, such as STM or AFM, with the capability to shift the scan range in high resolution imaging.

  • NTSC PATTERN GENERATOR

    PG-38 - GME Technology

    Model PG-38 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. RF video output on Channel 3 with 1KHz audio tone for audio troubleshooting. User friendly interface for easy operation.

  • C/Ku Band Satellite Monitoring

    SCL-3412 - Shoghi Communications Ltd.

    C/Ku Satellite Monitoring System (SCL-3412) is designed to intercept International/national telecom carriers, GSM A/Abis links and IP Carriers over satellite which are using C, Ku, X or Ka-Band. In order to reduce the manual effort and time consumed in the analysis of the carriers, system is integrated with Satellite Carrier Analysis module, which automatically performs the scanning on the selected spectrum and provide the list of carriers along with their payload type (i.e DCME, GSM or IP) and characteristics parameters. This provides great help to take decision for monitoring of the carriers of interest.

  • Laser Diode Drivers (LDD)

    Renesas Electronics Corp.

    LDD technology has evolved from driving DVD/CD/Blue-ray optical drives to include laser projection in smartphones, automotive head-up displays (HUDs) and pico projectors. Renesas has developed new LDDs for RGB scanning laser projection systems and laser-based pico projectors. Automotive HUDs are benefiting from big innovations in MEMS projection systems and are now central to advanced driver assistance systems (ADAS) and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost.

  • 3D Software

    Geomagic Control X - Artec 3D

    Combined with the powerful and highly precise Artec 3D scanners, Geomagic Control X is a fantastic solution for anyone looking for speed, accuracy and a large variety of tools to choose from. Easily get the data required for extensive quality control in no time at all with Artec’s advanced 3D scanning solutions. Acquire precise measurements and carry out inspection and data analysis on the spot, using Geomagic Control X and an Artec 3D handheld scanner. Compare 3D scans to the reference CAD model to minimise assembly flaws and increase productivity.

  • Fast-Screening Raman Imaging System

    RAMANview - Nanophoton Corp.

    RAMANview has a dedicated optical system, which substantially expand the field-of-view. Even large samples – bigger than 800 mm2 – can be analyzed without moving the sample. Just select with the mouse of your computer the area of interest and the ultra-fast laser scanning system will do the requested analysis. Regular mapping systems take a long time; have the risk of moving the sample out of area or ? working with solutions ? even slopping it. RAMANview saves your time and provides a secure analysis of any area of interest.

  • Hipot Wire Harness Testers

    NX Hipot - Dynalab Test Systems, Inc.

    * 50 to 1500VDC Hipot Testing* 50 to 1000VAC (optional) * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable

  • FAST SDD and C2 Window

    EDS (SEM) Applications - Amptek Inc.

    Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).

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