Showing results: 421 - 435 of 501 items found.
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V550 -
Highland Technology, Inc.
The V550 is a 6U, one-slot VME module which will acquire position data from up to eight LVDT (linear variable differential transformer) position sensors. The LVDT sensors are excited by an ultrastable synthesized sinewave generator, and conditioned by a precision 16-bit A/D converter followed by digital signal processing. The resident microprocessor supervises scanning and signal conditioning, and places updated position data in VME-accessible dual-ported data registers for instant access from the VME bus.
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Thorlabs, Inc.
Thorlabs' GL16 End Face Interferometer measures and images the end face geometry of single- and multi-fiber connectors. A non-contact technique called scanning white-light interferometry (SWLI) provides high accuracy, repeatability, and reliability for fiber connector testing, particularly for pass/fail testing using IEC or Telcordia requirements. The system can be controlled locally through the touchscreen display or remotely through a browser-based application (see Software tab for details), allowing it to be easily integrated on the production floor.
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Snappy 5M -
Teledyne e2v
The SnappyTM 5M CMOS image sensor is designed for barcode reading, 2D scanning and other demanding applications. Available in both monochrome and color, Snappy 5M has a small 1/1.8 inch optical format, containing a 2.8µm, low-noise, global shutter pixel, and arranged in a 2,560 x 1,936 array. The device can stream video at ~50fps at 10 bits over a 4 wire, MIPI CSI-2 interface, and is housed in a small compact fan-out organic package.
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TR7500 SII -
Test Research, Inc.
Featuring a large FOV 3-CCD color camera and four angled cameras, the TR7500 SII automated optical inspection offers double the scanning speed of TR7500 with identical inspection performance in an inline solution. The system is capable of high performance inspection at resolutions ranging from 10 to 15 µm, utilizing TRI' hallmark on-the-fly Dynamic Imaging technology for powerful pre/post reflow inspection without generating vibration associated with stop-and-go systems.
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DU3328 -
Delta United Instrument Co., Ltd.
Programmable test voltage in AC: 0.1K~5KV, DC: 0.1K~6KV Programmable cutting current in AC:0.001mA~15mA, DC: 0.001mA~7.5mA 3 in 1 functions, with AC, DC Hi-Pot test, Insulation test. Built in 100 sets memory Arcing detect function 8 ports scanning function Independent 8 channels real-time open check Real-time check function, to ensure your products tested, no more loss test.
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PInano -
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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SPIP -
Image Metrology A/S
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Shoghi Communications Ltd.
Radio Reconnaissance and Jamming Station is monitoring and jamming of radio signals in the frequency range of 25 to 1000MHz. The Radio Reconnaissance and Jamming Station allows audio monitoring, technical analysis, monopulse bearing finding of the radio emission sources.The Radio Reconnaissance and Jamming Station is capable of scanning the VHF/UHF frequency bands to identify the various sources of radio transmissions with their signal parameters. Carry out direction finding (DF) of the source of the radio signals and generation of jamming signals of required waveform to carry out jamming.
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TR7600 SII -
Test Research, Inc.
Featuring advanced automated 3D X-ray inspection of PCBAs, the TR7600 SII high speed scanning with multiple resolutions in a single program. Automatic Pass/Fail determination uses 2D + 3D images provided using 6-axis control and ultra-high-speed multiple angle cameras with automatic board warp compensation. TR7600 SII is ideal for inspection of fine pitch 01005 components, BGAs, PoPs, LGAs and other bottom termination components on both sides of the PCBA, including complex Pressfit connectors.
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Nikon Instruments Inc.
Metrology's walk-around laser scanner for portable metrology applications. Accurate, easy-to-use and with stunning performance ensure it to be the most capable handheld scanning solution without mechanical constraints. The scanner is tracked by the K-CMM Optical Tracker, so that operators can measure anywhere needed. K-Scan MMDx is the ultimate tool for accurate part-to-CAD inspection and productive reverse engineering, combining the accuracy and productivity of the MMDx laser scanner and the user freedom, measurement volume and motion compensation of the K-CMM Optical Tracker system.
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CMOSIS CMV4000 -
XIMEA GmbH
2K camera Applications: In-situ optical inspection camera, fast process capturing, e.g. Golf club swings, Intelligent Transportation Systems (ITS), Open road tolling and Traffic monitoring, Industrial Automation, Machine Vision, Facial Recognition, Motion Capture, Automotive crash testing, OCR/ OCV, 3D scanning, Robotic Arms, Material and Life science Microscopy, Ophthalmology and Retinal imaging, Medical Imaging, Flat panel inspection, Dental, Kiosks, Security, Biometrics
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PCTEL, Inc
Get the most out of your PCTEL® scanning receivers with SeeHawk® Touch and Collect network testing software and the SeeHawk™ Central cloud reporting and automation platform. Our intuitive interface makes it easy to conduct drive testing, walk testing, troubleshooting, commissioning, and reporting for cellular, WiFi, and critical communications networks indoors and out. With SeeHawk Central, you’ll also get instant online data access, workflow automation, and report sharing tools for grid-based in-building testing.
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CMOSIS CMV2000 -
XIMEA GmbH
2K camera Applications: In-situ optical inspection camera, fast process capturing, e.g. Golf club swings, Intelligent Transportation Systems (ITS), Open road tolling and Traffic monitoring, Industrial Automation, Machine Vision, Facial Recognition, Motion Capture, Automotive crash testing, OCR/ OCV, 3D scanning, Robotic Arms, Material and Life science Microscopy, Ophthalmology and Retinal imaging, Medical Imaging, Flat panel inspection, Dental, Kiosks, Security, Biometrics
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SmartSPM -
HORIBA, Ltd.
The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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3DM Serirs -
Park Systems Corp.
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
