Showing results: 631 - 645 of 708 items found.
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N5700 Series -
Keysight Technologies
The Keysight N5700 Series delivers low noise power in a compact 1U package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. Select output voltages from 6 to 600 V. For low current applications, the 750 W models provide 1.3 to 100 A. For higher current needs the 1500 W models provide twice as much current.
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Data Patterns Pvt. Ltd.
The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
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Precise Time and Frequency, Inc.
The ptf 1205A is a 12-channel IRIG amplitude modulated time code distribution amplifier housed in a 1U high, 19″ rack package. The ptf 1205A uses an RF design combining the latest technology in low noise components to minimize input/output delays which are of the order of nano seconds.The unit uses two stages of input signal buffering to distribute the input signal to 12 separate outputs, and insure maximum isolation between individual output signals.
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Narda Safety Test Solutions
Real-Time Remote Analyzer for the Detection, Analysis, Classification and Localization of RF Signals between 8 kHz and 8 GHz. Supports automatic direction finding and TDOA. Solves complex measurement and analysis tasks reliably and quickly with outstanding RF performance. Windows 10 based open platform for 3rd party applications. SignalShark exists in different incarnations. These are available as stand-alone units (table-top or in-system), single or double for installation in a 19" rack. The Remote Analyzer type is optimal for remote control applications.
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cPCIS-ET1100 Series -
ADLINK Technology Inc.
The cPCIS-ET1100 Series Subsystems are rack mountable, 3U in height, and designed for 3U CompactPCI cards and modules. They are ideal for industrial or transport applications where small chassis size with multifunctionality are important ample power capacity, a hot swap backplane and easy maintenance. Their ability to handle a wide range of temperatures and excellent shock and vibration characteristics make them suitable for operating in a rigorous environment. The cPCIS-ET1100 Series allows for custom configuration, giving system integrators maximum flexibility to build in specialized functionality.
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Holding Informtest
The 6-slot VXI portable rack is intended for use in modular measurement information systems based on the VXI version of the standard. The 6-slot portable VXI crate is designed to accommodate the system module, in the first slot and VXI instrumental modules placed in the remaining slots, to provide their electrical power supply, as well as to provide information interconnection via the VXIbus bus between the modules and with the control computer. The chassis meets the requirements of GOST R 51884-2002 and the document System Specification VXI-1 Revision 1.4.
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Vortex OpenSplice -
ADLINK Technology Inc.
Vortex OpenSplice enables data to be shared and integrated across a wide spectrum of operating systems and platforms. It provides a full implementation of both the OMG DDS latest rev1.4 (DCPS profiles) and the OMG-DDSI / RTPS v2.3 interoperable wire-protocol standards. It is targeted for use with server-class (desktops, racks etc.) platforms as well as more specialized real-time embedded environments and operating systems (e.g. single board computer running VxWorks). Vortex Opensplice is fully interoperable with Cyclone DDS, Vortex Link and and Vortex Insight .
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8 Series -
Tektronix, Inc.
The 8 Series Optical Clock Recovery is a fast, flexible and reliable instrument for assisting in the validation of current and future optical designs. With all the applicable standard rates in the 26 and 53 GBd data rate ranges – no options required – the TCR801 Optical Clock Recovery is a crucial component for any bench or rack aimed at verifying the latest high-speed optical standards. Featuring quick lock capabilities and a sensitive front end for low power signals, this instrument simplifies the challenges associated with today’s optical testing.
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N5249B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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N5244B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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N5245B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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N5241B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PT04 Series -
Manatronics Pty Ltd
Quality ProductRugged and Reliable DesignCurrent control from 0 to 70A on 64V RangeCurrent control from 0 to 135A on 32V Range4kW plus rating (at 40°C ambient)Cost effective; simple robust designCC, CP, CR and CV modes as standardCurrent control from either ATE with0 – 5V demand input or from a RemoteControl Box (both standard)Ultra Low electrical noiseSelectable Range 64V or 32VTemperature controlled quiet fans19 Inch Rack case 4U
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N5242B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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N5247B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
