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Qualification
fulfills an absolute condition.
See Also: Performance Testing, Validation, Characterization
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Vapor Relays & Contactors
From rail passenger cars and locomotive control and starting circuits to earth moving equipment, Vapor relays and contactors have established a reputation for quality and reliability where dependable control of DC circuits is required. Performance-proven in thousands of applications worldwide, Vapor relays and contactors meet or exceed stringent qualification requirements of major locomotive and rail passenger car builders and heavy machinery manufacturers. Units are in daily service on U.S. Class 1 railroads, the New York City Transit Authority, the Chicago Transit Authority, the Toronto Transit Commission and other railroads and transit agencies around the globe.
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Biased and Unbiased HAST Testing
Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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Qualification Tester
LQ402
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 6 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 2 cabinets. One is for the electronic components with the primary measurement devices and the other one holds the 6 load boxes.
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PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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Defect Inspection and Review
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Emulator
GCI E84
The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
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Laser Diode Life Test
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Quickly & Accurately Validate Any Pluggable Transceiver from 10M to 100G
iOptics
iOptics offers a complete, powerful and easy-to-use tool for CFP and QSFP qualification and can validate the full range of low- to high-rate transceivers including SFP, SFP+, XFP, CFP, CFP2, CFP4, QSFP+ and QSFP28. iOptics offers a faster, streamlined and automated test sequence aimed at quickly and simply validating any type of 10M to 100G interface. It is the ideal solution for multirate field commissioning with a simple one-button pass/fail. It offers automated stress testing for lab qualification and is also ideally suited for data center and data center interconnect (DCI) testing.
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Extensive Qualification & Test
Quality and reliability of the battery pack design starts with proper cell selection. Ensuring the battery pack is well matched to the host equipment is often overlooked or not given sufficient priority until performance and/or supply problems occur. Proper cell selection is key and requires much more than checking dimensions and capacity. Designers need to consider loading, environment, shelf life, and a number of other factors specific to the application.
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Qualification Tester
LQ404
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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Thermal Test Vehicles
TTV
Thermal Engineering Associates, Inc.
Using the TTC-1002 Thermal Test Chip as a basis, TEA offers TTVs in flip-chip, bare die, BGA packages for a variety of thermal simulation, reliability, qualification, heat sink characterization, and TIM characterization activities. Selective unused balls are sequentially connected together for daisy-chain applications.
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Meter Qualification Board
MQB
Power-up and apply load to electric watt-hour meters for functionality testing with TESCO’s multi-position MQBs. These boards assist with AMI Meter Certification process and AMI meter qualification and communication testing.
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Meter Test Station
WECO 8000
The innovative WECO 8000 Meter Test Station is the first of its kind – a multi-position test board integrating meter qualification and accuracy. This versatile and economic test station is the solution for utilities needing the ability to switch between functional testing and accuracy testing. Separate multi-position test boards are no longer a necessity.
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Opticle Encoder Tester
Endeavour
Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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Space Applications & High Performance Cable Assemblies
Teledyne Stom Microwave’s space flight heritage began in the 1990s when one of our military/aerospace customers independently performed space qualification testing on our cables. Since 2010, TSM has dedicated design, engineering, test, qualification and documentation resources to specifically service a growing list of military and commercial space customers. These customers include most of the major US defense contractors and a growing number of Low Earth Orbit and small satellite companies.
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END-to-END VALIDATION TESTING
SANBlaze VirtuaLUN NVMe Initiator is the key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.
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Qualification Testing
Teledyne Storm Microwave ensures your design specifications are met by conducting in-house testing at all production phases. This comprehensive qualification process guarantees high-quality performance and reliability in every cable assembly, meeting the stringent requirements of your application.
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Pressure Testing
All metal, plastic, and composite parts intended to contain liquids or gases under pressure are required to undergo stringent pressure testing procedures to meet qualification standards.
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Detective Logic Analyzer
DDR3
Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured StatesContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsRow Hammer Analysis for potential data corruptionInteractions among up to 8 ranks, over two slots are analyzed.Mode Register Listing providedSupports Auto-Clock rate detect and clock stoppage Connects to the target under test with DIMM, SO-DIMM, and BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Helmholtz Coils
Helmholtz coils is a candidate test apparatus for low frequency magnetic field susceptibility testing on military equipment and subsystems. Use of this coils reduce electromagnetic compatibility (EMC) qualification tests time, and subject the equipment under test (EUT) to a relatively uniform field.
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Three Phase Meter Qualification Board
MQB3
Apply true three phase voltage and current to electric meters, enabling them to be tested under all possible conditions that may be encountered in the field with TESCO’s Three Phase Meter Qualification Board (MQB3).
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xDSL Line Qualifier
ELQ 2+
2,2 MHz Test Set for the qualification of ADSL & SHDSL lineswith data rate calculation. TDR & Bridge for cable fault location.
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Microelectronics - Integrated Solutions
Teledyne e2v HiRel provides microelectronics packaging and products with a full range of packaging solutions from COTS to MIL-PRF-38534 compliant (Class H & K) qualifications. HiRel provides a one stop solution for your microelectronic assembly, evaluation, test and screening requirements. Our MCM packaging technology enable our customers to meet size, weight, power and cost (SWaPC) requirements without a sacrifice in performance. Our numerous certifications including AS9100, ISO 9001, and MIL-PRF-38534 Class H accreditation, all of which are integral factors in our company-wide initiative to deliver high-reliability microelectronic devices that meet our customers' stringent requirements. We are a DOD Trusted Source for Microelectronics Packaging, Assembly, and Test.
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Logic Analyzer
FS2352B
The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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19" Enclosures for 6U VME VPX Boards
R4U8S
The R4U8S is a 4U height 19'' Rack Mount Industrial Chassis featuring 8 slots of either VME or cPCI 6U size boards. The R4U8S has successfully passed the mechanical, thermal, electromagnetic EMC/EMI qualification tests required by our customers. Its modular design enables to fulfil the requirements of application areas ranging from the environmentally benign right through to deployed industrial, airborne and naval applications.
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Testing Services
*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
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Optical Switches
This latest technology platform presents the best value in terms of size, form factor, durability, and cost. The design of our MEMS optical switch centers on DiCon's proprietary dual-axes tilting MEMS mirror and is expandable up to a 1x36 switch configuration. Large fan-out 1xN optical switches and non-blocking fan-out/fan-in NxM matrix optical switches are built by cascading multiple of these 1xN switches. The MEMS 1xN fiber optic switch passes the stringent Telcordia GR-1221 qualification and is vastly deployed in today’s optical communication networks. With a lifetime of over a billion cycles, the durability of this MEMS device makes it a perfect choice for optical network monitoring applications that require frequent switching.
