Showing results: 526 - 540 of 584 items found.
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61510 -
Chroma Systems Solutions, Inc.
Power Rating:61511: 12KVA61512: 18KVAVoltage Range: 0-150V/0-300V / AutoConfigurations with input voltage of 220V or 480VFrequency: DC, 15Hz-1500HzSingle-phase or three-phase output selectableProgrammable slew rate setting for changing voltage and frequencyProgrammable voltage and current limitHigh output current crest factor, ideal for inrush current testingTurn on, turn off phase angle controlTTL signal which indicates output transientLIST, PULSE, STEP mode functions for testing Power Line Disturbance (PLD) simulationVoltage dips, short interruption and voltage variation simulationHarmonics, inter-harmonics waveform synthesizerComprehensive measurement capability, including current harmonicsAnalog programmable interfacesRemote interface: GPIB, RS-232, USB and EthernetCapable of delivering power output up to 90KVA by implementing Master-slave parallel operation
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JT 2149/MPV eMPV -
JTAG Technologies Inc.
The JT 2149/MPV and the JT 2149/eMPV are a 32 channel multi purpose DIOS/TAP pod modules/interfaces that can be plugged into any spare JT 2148 QuadPOD transceiver slot. The DIOS channels of these units I/O interface pods enable increased fault coverage and thus improved diagnostic resolution during boundary-scan testing. The principal difference between the two versions is the use of an extended case on the eMPV that allows standard 0.1″ connections to be used to access ths TAP and static IO signals (see tab below)- on the standard /MPV unit these signals are available at the front face 0.05″ connector. The units are fully supported by JTAG Technologies’ development tools. Additional DIOS modules can be serially connected if more parallel access points are required.
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779949-01 -
NI
48-Channel, Sink/Source Inputs, Channel-Channel Isolated PXI Digital I/O Module—The PXI‑6529 is an industrial, parallel digital input interface. PXI‑6529 devices are ideal for a variety of applications from automotive design, industrial factory automation, and machine control to aerospace, laboratory research, and biomedical applications. With programmable power-up states, you can configure the initial output states in software to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PXI‑6529 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions. Programmable input filters eliminate glitches/spikes and provide debouncing for digital switches/relays through a software-selectable digital filter.
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IT7600 Series -
I-TECH Electronic Co., Ltd
IT7600series high performance programmable AC power supplies, adopt advanced digital signal processing technology, with frequency up to 10-5000 Hz, built-inall-round power meter and large-screen oscilloscope function. Power up to 54kVA and support master-slave parallel, which can provide high-capacitysingle-phase or three-phase AC output. Some single-phase or three-phase products can be easily upgraded toAC600V (three-phase star connection downline voltage up to 1000V) output. IT7600 has built-in arbitrary waveform generator to simulate the harmonic and avariety of arbitrary waveforms output; also has strong exchange measurement and analysis functions. IT7600 can be widely used in many areas, such as newenergy, home appliances, power electronics, avionics, military, the development and application of IEC standard test and so on.
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JT631 Series -
Nanjing Jartul Electronic Co., Ltd
JT631 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT631 series load very suitable for testing power supply when produced in large quantity. Besides, JT631 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT631 series load satisfing most of R&D requirements. Moreover, JT631 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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JT634 Series -
Nanjing Jartul Electronic Co., Ltd
JT634 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT634 series load very suitable for testing power supply when produced in large quantity. Besides, JT634 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT634 series load satisfing most of R&D requirements. Moreover, JT634 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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17040 -
Chroma ATE Inc.
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Analog Devices Inc.
Analog Devices offers a wide range of high precision, multiplying current output (IOUT) D/A converters (DACs) that feature ±1 LSB INL and DNL specifications, from 12-bit up to an industry-leading 18-bit resolution. Our portfolio includes single and multiple D/A converters in small packages with parallel or serial SPI interfaces. Multiplying current output R-2R D/A converters allow for an external amplifier that’s optimized for specific applications and that does not require reference buffering, which enables high linearity. The SoftSpan™ feature allows software selectable output spans, therefore eliminating the need to add precision gain stages and the associated external jumpers, precision resistors, and amplifier circuitry. Integrated precision resistors allow for reference inversion, bipolar offset, and offset and gain adjustment.
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ICT IDE and Sequencer -
Konrad Technologies GmbH
The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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FlexiCharge FC1500 -
Advanced Energy
The FC1500 Medical Capacitor Charging power supply, with a built in configurable ACDC power supply is designed to provide the system power needs for Medical laser applications. The FC1500 can provide both capacitor charging and ACDC low voltage system power due to it’s unique design and intelligent control. The FC1500 can be used as a standalone capacitor charger, and if needed, various low voltage modules can be added to the unit to provide further system power. This functionality provides extra flexibility to power other systems and applications. Low voltage modules can be connected in parallel and in series for application that require higher voltage and current requirements. The Capacitor charger capabilities has the highest level of performance due the unique built in intelligent control for capacitor charging, higher charge rates and power limit control.
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IXI Technology
The NTDS I/O Analyzer provides insight and visibility, enabling users to quickly and efficiently analyze timing relationships, message protocols, throughput, and data integrity on all types of NTDS interfaces. It is capable of monitoring any combination of NTDS Parallel Type A, B, C, H and NTDS Serial Type D, E channels as defined in the MIL-STD-1397 revision B and C specifications regardless of NTDS mode. The channels are connected to existing NTDS cabling with NTDS tap boxes and extract ongoing communication. Each word of NTDS information received is time-stamped with a 125 nanosecond resolution clock ensuring highly accurate timing measurements. Data collected is stored locally for analysis and can be transmitted to external equipment enabling remote troubleshooting, event reconstruction, or time-critical feedback on system performance.
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Paralan Corp.
Built-in Graphical Interface addressable by any web browser through the Gigabit Ethernet port.Easy installation including self-contained initial IP address and the capability to be used in DHCP over TCP/IP environments. Automatically detects every parallel SCSI device connected to the 68-pin SCSI interface upon power up. Field upgradeable to adapt to future expansions of the iSCSI specifications, and compliant with iSCSI and SCSI interface standards. At-a-Glance status LEDs for SCSI Bus Activity, Self Diagnostics, Power, Gigabit Ethernet Link Status and Gigabit Ethernet Activity. Utilizes a dedicated 833 MHz 32-bit processor for maximum iSCSI and SCSI throughput. Embedded Adaptec Ultra160 SCSI controller chip providing state of the art, reliable control of all SCSI devices. The iS500 Series supports LVD/MSE and HVD SCSI.
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GX5296 -
Marvin Test Solutions, Inc.
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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RATCAT Family -
Sound Tools
The CAT Snake Stage Box allows four lines of balanced analog audio to be run down a shielded CAT5/6/7 cable. Each of its four channels can carry balanced analog, AES/EBU, DMX, and Clear-Com signals hundreds of feet away. The CAT Snake is a fully passive unit which can be input directly into analog or digital consoles. Each channel is isolated which means channel 1 can send a DMX Signal while channel 2 is sending balanced analog all down the same shielded CAT5 cable. Multiple CAT Snake stage boxes can be daisy chained to allow the same four analog channels to be dropped in multiple locations. Each CAT Snake stage box has an Ethercon input and Ethercon parallel output that allows the CAT Snake to be used as a hard-wire split.
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T5230 -
Advantest Corp.
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
