Showing results: 76 - 87 of 87 items found.
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Bio-Logic Science Instruments
Scan range : X&Y = 200 μm; Z = 100 μm• Practical minimum step size : 50 nm with <10 nm resolution• Max scan speed : 200 μm/s• Max discrete data acquisition for line or area scan : 20 points/s• Micrometer macro positioning : 13 mm range – the smallest graduation is 10 μm• Max area scan point density : >4,000,000
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12962A -
Ametek Scientific Instruments
The 12962A sample holder is designed to allow accurate impedance tests of solid materials to be performed at room temperature. The sample holder consists of two parallel electrodes, one of which is fixed in position and the other which can be moved into contact with the sample by adjustment of a micrometer. The sample holder makes use of guard ring and reference techniques in order to improve accuracy by reducing “fringing” effects at the edge of the sample. The standard electrode provided is 20mm diameter.
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CAD-to-Part Inspection -
BuildIT Software & Solutions Ltd.
Enables quick and easy dimensional verification of manufactured parts and assemblies for tool building, assembly, alignment, process automation, reverse engineering and quality control. BuildIT’s advanced analysis and reporting capabilities combine measurement data from multiple sources to produce detailed graphical and textual reports that are used to quickly identify manufacturing and production trends. With both numerical and graphical feedback of real-time deviations, BuildIT allows users to position parts with micrometer accuracy for high-precision assembly and alignment applications.
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Bowers Group
Bowers’ XT3 digital internal micrometers offer an ergonomic design - including a larger and clearer LCD display - along with IP67 electronics protection, proximity output; allowing bi-directional communication giving greater flexibility for data acquisition and storage. The extended mechanical travel of the XT range means that special heads can also be manufactured to accommodate users most awkward measuring problems. If you need something bespoke, reach out to us at sales@bowersgroup.co.ukIf you prefer the analogue approach, then we offer the same size range in our XT Analogue format.
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Applied Image, Inc.
With the amount of applications that optical components have, no one could hope to have the perfect component for every possible scenario. For this reason, APPLIED IMAGE makes easy the process of designing, building, and delivering custom components to our customers. Our engineering process is designed to produce the best parts in the industry and more importantly, the best component for your specific needs. The APPLIED IMAGE experience will cover the project with expert engineers from start to finish. Use the form below to start the conversation for checkerboard and dot arrays, stage and image analysis micrometers, reticles and machine vision components.
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Model 200IR -
OAI
The OAI Model 200IR Mask Aligner is a tabletop system that requires minimal clean room space. It is a cost-effective alternative for R&D or limited scale, pilot production. Utilizing an innovative, air bearing / vacuum chuck leveling system, the substrate is leveled quickly and gently, for parallel photo mask alignment and uniform contact across the wafer during contact exposure. The Model 200IR Mask Aligner is capable of one micron resolution and alignment precision. It has an alignment module which features mask insert sets and quick-change wafer chucks that enable the use of a variety of substrates and masks without requiring tools for reconfiguration. The alignment module incorporates micrometers for X, Y, and z-axis.
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PCE Instruments
Roughness is an important parameter when trying to find out whether a surface is suitable for a certain purpose. Rough surfaces often wear out more quickly than smoother surfaces. Rougher surfaces are normally more vulnerable to corrosion and cracks, but they can also aid in adhesion. A roughness tester is used to quickly and accurately determine the surface texture or surface roughness of a material. A roughness tester shows the measured roughness depth (Rz) as well as the mean roughness value (Ra) in micrometers or microns (µm). Measuring the roughness of a surface involves applying a roughness filter. Different international standards and surface texture or surface finish specifications recommend the use of different roughness filters. For example, a Gaussian filter often is recommended in ISO standards.
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ZOLIX
Manual micrometer adjustable slits for precision control of incoming light. Motorized Slit and fixed slit is optional. More than 100 gratings for the best spectral range, throughput and dispersion to meet your applicationDSP controlled stepping motor scanning system provides superior precision and repeatability of wavelength positioningOptional internal shutter or six-position filter wheel for experiments requiring background removal or signal attenuationInstallation and set-up through USB 2.0 computer interfaces Stand-alone Omni Series monochromator control software for basic scanning and calibration. Also includes utilities for grating updates and communications Active X control support Visual Basic, C++ and Delphi drivers allow users to design their own acquisition programsZolixScan data acquisition software provides a simple user interface for easy data acquisition and experimental set-up
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Fairview Microwave Inc.
Our millimeter wave variable waveguide attenuators allow designers and engineers to test their systems at various signal strengths and attenuation values to determine the optimum signal performance of the system. The key feature of these waveguide attenuators is that the attenuation level is adjusted using a built-in micrometer which enables repeatable and rapid re-setting to different attenuation levels without the need for additional external components. Our waveguide attenuators handle varying attenuation levels from 0 to 30 dB over the specified band allowing the designer to tune the attenuation level needed for the application. These continuously variable waveguide attenuators cover a broad frequency range of 33 to 110 GHz in five bands and also display flat performance across a wide band with low insertion loss.
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CVS Trevista X4 -
STEMMER IMAGING Ltd.
The fourth generation of CVS Trevista Surface, Cylinder and Multiline surface inspection systems from Stemmer Imaging features brighter illumination to enable faster image acquisition and have a larger measuring field. The new Trevista X4 models utilize a 2.5-D process, called "Shape from Shading," and are especially suited to the examination of components with shiny and diffusely scattering surfaces. Surface defects such as scratches, burrs, dents, discoloration or grinding marks, even if only a few micrometers deep, can be detected with significantly greater certainty with this process than with conventional image processing systems, according to the manufacturer. The X4 generation offers structured, diffuse dome illumination that is brighter by a factor of 2.5 compared with the previous models, enabling faster image acquisition. For a typical image size of four megapixels, evaluation using the Trevista algorithm takes place around 20% faster than before, which results in potentially lower cycle times.
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Omni-λi -
ZOLIX
Zolix Imaging Spectrometer includes different focal length 320mm, 500mm, 750mm; ◆Manual micrometer adjustable slits for precision control of incoming light. Motorized Slit and fixed slit is optional. • More than 100 gratings for the best spectral range, throughput and dispersion to meet your application◆DSP controlled stepping motor scanning system provides superior precision and repeatability of wavelength positioning◆Optional internal shutter or six-position filter wheel for experiments requiring background removal or signal attenuation◆Installation and set-up through USB 2.0 computer interfaces • Stand-alone Omni Series monochromator control software for basic scanning and calibration. Also includes utilities for grating updates and communications◆ Active X control support Visual Basic, C++ and Delphi drivers allow users to design their own acquisition programs◆ZolixScan data acquisition software provides a simple user interface for easy data acquisition and experimental set-up
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Maury Microwave Corporation
Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
