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Showing results: 526 - 540 of 545 items found.

  • Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces

    JT 37x7/TSI - JTAG Technologies Inc.

    High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

  • PXIe-7821, Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module

    783485-01 - NI

    Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7821 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

  • PXIe-7820, Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module

    783484-01 - NI

    Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module—The PXIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7820 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7820 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

  • PXIe-7822, PXI Express Digital RIO with Kintex-7 325T FPGA

    783486-01 - NI

    Kintex 7 325T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7822 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7822 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7822 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

  • SPI Isolators

    Analog Devices Inc.

    SPI (Serial peripheral interface) is one of the most widely used interfaces between microcontrollers and peripheral ICs such as sensors, ADCs, DACs, shift registers, SRAM, and others. Analog Devices has your isolated SPI bus covered with our dedicated SPI digital isolators which support this synchronous, full duplex master-slave-based interface. Options include devices built with ADI's proven iCoupler® technology and offering a small footprint, simple design-in, fast speeds, and high data integrity, as well as integrated µModules which require no external components. Our SPI isolator solutions increase performance and reduce board space. This simple, compact solution is ideal for isolated SPI data requiring communication across different ground potentials or through large common mode transients often found in Industrial PLCs (programmable logic controllers) and Instrumentation and data acquisition systems.

  • Electrical Testers

    Actron

    Actron is an industry leader in electrical testers for your car or home repair projects. Pick your choice of Actron’s digital multimeters to help pinpoint problem areas and determine which components need repair or replacement. Find shorted and open wiring with the help of our circuit testers. Troubleshoot fuel injectors, solenoids, and digital sensors with the Actron Automotive Logic Tester. Use Actron IR thermometers to check AC systems, brakes, catalytic converters, cylinder heads, and overheating electrical components. Use the Actron Videoscope to inspect hard to reach areas. Measure and set spark plug timing on older vehicles, tractors, lawn mowers and more using Actron timing lights. Find bad batteries and faulty charging systems with Actron Battery Load Testers. Our Remote Starter Switches allow one person to conduct tests while cranking or starting the engine.

  • Metallic Pendulum Impact Testing Machine

    JB-S Series - Jinan Testing Equipment IE Corporation

    JB-S series superior metallic pendulum impact testing system is strictly designed according to international standards ISO148, ASTM E23 and EN10045. The pendulum impact testing system is mainly used to determine the anti-impact capability of metal materials under dynamic load and is capable of doing a large number of of impact tests continuously. Adopting the important intelligent programmable logic controller (PLC) system, the pendulum impact testing system can realize the test process control and test data collection based on computer software program or digital display touch screen controller. The test data can be used for further data analysis, storage and printing. An aluminum shield with transparent tempered glass covers the load frame for safe operation. The impact testing machine of metallic pendulum is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.

  • C Series Digital Module

    NI

    The C Series Digital Module interacts with a range of industrial switches, transducers, and devices. Some modules include an LED per channel that indicates the state of the channel. It supports input, output, or a combination of digital lines, and they can interact with a variety of voltages and logic levels, so they are well-suited for a variety of benchtop and industrial environments. Additionally, the C Series Digital Module also offers isolation options and sinking or sourcing capabilities to add further protection to your digital I/O application. When you use the C Series Digital Module with CompactRIO, you can use LabVIEW FPGA to create custom high-speed counter/timers, digital communication protocols, pulse generation, and more.The C Series Digital Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.

  • FPGA PXIe High-Performance Digital I/O Card

    GX3700e - Marvin Test Solutions, Inc.

    The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3700e is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded directly into the FPGA or via an on-board EEPROM.

  • AMIDA 3001XP Tester

    Amida Technology, Inc.

    AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.

  • LED Driver Aging Rack

    LEDRACK-100W192P - Lisun Electronics Inc.

    • Application range: LED driver and multi channel driver power aging. It has equipped with computer operation and monitor system. The working condition can be set by the computer, and the computer will record real time data to do statistical analysis. • The parameters of load can be set freely on the software, to monitor the real time voltage, current, and power etc • Load mode: CC, CV, CR, CP, and LED • Aging Control System includes: ON/OFF control signal output; Signal of relay switch control; K type thermocouple temperature acquisition • The channels are parallel connected under arbitrary load mode, which can allow product power expansion • The LED Driver Aging rack will design according to customer’s LED driver power and aging quantity per time • Automatic current switching function (optional) • AC power meter to measure modules, and test power input characteristics (optional) • Temperature monitoring function at product zone (optional) • PWM dimming and two sets of logic control signal function (optional)

  • FPGA PXI High-Performance Digital I/O Card

    GX3702 - Marvin Test Solutions, Inc.

    The GX3702 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3702 is supplied with an integral expansion board providing access to the FPGA's 160 I/Os and is pin for pin compatible with the NI PXI 7813R and 7811R FPGA cards . Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.

  • Dual Digital Multichannel Analyzer

    780 MCA Family - CAEN S.p.A.

    The 780 MCA family integrates advanced firmware algorithms operating Digital Pulse Processing for Pulse Height Analysis (PHA). The processing algorithms can be easily adapted to different detectors and application ensuring effective data analysis even at high count rates. It provides advanced tools for configuring baseline restoration, pile-up rejection. Thanks to the two input simultaneous acquisition, the modules are able to manage coincidence and anti-coincidence logic between detectors, allowing the user, for example, to easily take advantage of background rejection or anti-Compton techniques. These MCAs may provide at the same time energy, time stamp and the digitized pulse in a configurable time window (e.g. including the rising edge region) in order to perform further online analysis. Acquisition settings and basic mathematical analysis are performed through the CoMPASS and MC2Analyzer software, providing energy spectra with up to 16k channels, which can be exported and imported in ASCII or N42.42 compliant files. CAEN further provides drivers for the supported communication interfaces; configuration software tools, C and LabVIEW libraries (CAENComm, CAENDigitzer, CAENDPP), demo applications and utilities.

  • High-Mount Outdoor Infrared Motion Sensor

    ENVIROMUX-IMD-OHM - Network Technologies Inc

    High-mount outdoor weatherproof sensor with 94 detection zones. Unique pyro-element provides multiple pattern detection and accurate discrimination function for spot temperature changes of moving objects. Drastically reduces false and missed alarms caused by severe outdoor environmental changes. Upper and lower area must be activated to generate an alarm condition. Summer night compensation, advanced temperature compensation, and vegetation sway analysis logic. Ideal detection area setting – adjustable length/spot detection. Registers movement in area covered: 13/18/30/40 ft and 85° wide. LED indicators for operation and system status. Unwanted detection areas can be eliminated using the included area masking seal. Mounting height: 8.3 to 10 feet. Tamper switch opens when cover is removed. Screw terminal. To connect to the RJ45 inputs use CAT5/5e/6 cable terminated at one end with RJ45 connector. Connect the un-terminated end to the sensor screw terminal. Operating temperature: -4 to 140°F (-20 to 60°C). IP54 compliant. Powered by ENVIROMUX-2D/5D/16D.

  • Controllers

    BKM91 - Techna-Tool Inc.

    Clockwise and/or counter-clockwise rotation of the wand is programmable allowing an optimum adaptation to the machine.The scanning intensity is adjustable in 8 steps. Even rotating drills with small diameters can be checked.The scanning results are display as "OK" or "KO" and signaled by LEDs on the front side of the device.The PROFIBUS is a standard Sub-D 9 pin connection; the USB connection is a USB-mini plug / type B and meets the 2.0 specification.Three digital inputs serve to activate the functions "Teach-in" to learn the position to be scanned, "Start" to initialize the scanning process and "Configurable" for receiving a stop command.Two digital outputs provide the signals for the message "OK" or "KO".The relay contacts are configurable as N/C or N/O connections. They can be set as momentary (valid with start or timed) or latching.Convenient configuration software for programming and setting of tool data is available at no cost.Mini USB for PC connection3 digital control inputs (positive or negative logic) Start and teach signal One configurable input2 relay outputs selectable as N/C or N/O contact Signal all clear message ("OK") Signal error message ("KO") Scanner connection4 LEDs for status display Opening for top hat plug for optional connection to I/O extension module Din rail mounting

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