Showing results: 316 - 330 of 384 items found.
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Dongguan Amade Instruments Technology Co., Ltd
Steam aging test chamber is a climatic test machine used to judge the products performance to resist extreme circumstance under high temperature, high humidity and high pressure during the transportation, storage and usage. The principle is very simple, water in the tank is heated turning into steam to form a simulated test environment under specified temperature and humidity. Specimens are placed into the drawers of machine to carry out test lasting for preselected time. It is applicable to electronic connectors, semiconductor IC, transistor, LCD, diodes, resistances etc.
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1110748 -
Aries
Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
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Analog Devices Inc.
Analog Devices RF amplifiers are designed utilizing the company’s leading amplifier and RF IC expertise. Our extensive family of single-ended input/output, fixed-gain amplifiers can be used from dc to microwave and include low noise amplifiers, gain blocks, intermediate frequency amplifiers, driver amplifiers, and differential amplifiers. These devices offer high linearity, low noise figures, and various fixed-gain options, as well as low power consumption; they are all fully specified over frequency, temperature, and supply voltage for use in a variety of applications.
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7128C -
Peaceful Thriving Enterprise Co Ltd
This is an auto-ranging, high accuracy and stable hand held clamp meter to make electrical maintenance safe and easy. With special designed IC to support true RMS, the meter is available to measure AC/DC voltage to 600V, AC/DC current to 600A and resistance to 60MΩ; also having the capability to test diode, continuity, frequency and non contact voltage sensing. Sub switch included Function Select, Value Hold, Range Select, Relative Value Measurement, Inrush Current Indication, Hz/Duty Cycle, Illumination and Back-light.
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Chroma ATE Inc.
Adivic/Chroma Group has been in the development of RF & Wireless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Mitsubishi, Honda, Hyundai,.. ,most of the global IC design houses with DTV chips, and also military entities in NATO. With the same customer-proved Software Defined Radio architecture, we have introduced Wi-Fi, Bluetooth tester since 2014. It will soon cover other current/future wireless standards such as 4G/LTE, 802.11ax, 802.11ah, etc.
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TLC5940 (16 Channel) -
SparkFun Electronics
The TLC5940 is a 16 channel PWM unit with 12-bit duty cycle control (0-4095), 6 bit current limit control (0-63), and a daisy chainable serial interface. This breakout board is a good way to take full advantage of this useful IC. All 16 PWM channels are broken out to standard 0.1" headers, which run alongside convenient voltage and ground rails. Also, because the TLC5940 can be daisy-chained, the breakout is designed to support that feature. On the left-hand side of the board all serial inputs are broken out to 0.1" headers and likewise with output on the right-hand side.
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Thermo Fisher Scientific Inc.
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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KayaQ™ (GRL-KAYAQ-FW) -
Granite River Labs Inc.
GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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SEN-39001 -
Playing With Fusion Inc
Breakout board for the AS3935 digital lightning sensor based on the AMS reference design. Includes specially tuned antenna, SPI or I2C interfacing, and a wide 2.4V to 5.5V standard operating range. This innovative sensor is designed to interface with most current development systems and boards, including all current Arduino modules. The breakout board features an inductor (antenna) specially designed for this application, and the board ships fully calibrated. This ensures that you don't have to write a massive back-end to support low-level IC calibration, just focus on your final application!
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Renesas Electronics Corp.
Renesas provides a wide range of optoelectronic devices, including IC output photocouplers (optocouplers) featuring a high response from 1Mbps to 15Mbps, as well as general purpose transistor output devices featuring high isolation voltage, high temperature operation and compliance with various international safety standards. For motor drive applications, dedicated photocouplers provide high isolation voltage, high temperature operation, high output current, and high-speed switching. These are complemented by a diverse range of ultra-high speed devices for fiber-optic applications, as well as solid state relays (OCMOS FETs).
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Pacific Testing Laboratories
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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NEBULA -
Intellitech Corp.
You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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GAO Tek Inc.
GAOTek provides a large collection of certified and feature-rich line testers for sale to the United States, Canada and Globally. These devices are mainly used for line installation, line performance testing, inspection, and maintenance of the telecommunication networks. They are particularly designed to accelerate telecom trouble shooting and with the help of latest technology they are equipped with a smart CPU, IC, and SMT. These devices have some unique features such as caller ID display and last number redial. Moreover, it can also be used for multi-line testing, wire pair checking, inspection of line insulation and test for breaks and faults.
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JANUS 2800T Tri-Temp Handler -
SESSCO Technologies, Inc.
SESSCO Janus 2800T Tri-temp Handler is designed to accommodate small to medium size standard and custom IC packages. Supports high parallelism of up to octal sites and is equipped with dual high-speed input tube loaders and dual auto output tube unloaders for higher throughput up to 28K UPH. With over 500+ I/O and 16 temperature zones available, it has plenty enough resources for the most demanding applications. It can be customized for MEMS applications and high-voltage testing. Powered by a cutting-edge 10 ns/step all-integrated controller and modular programming design.
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EV Group
Increased demand for applications based on thin wafers and thin microelectronic-substrates result in the need for processing and handling of thin- and ultra-thin substrates during the manufacturing step. Thin substrates in the area of IC manufacturing (like memory, CMOS, 3D-TSV integration or ChipCard applications), power devices (e.g. IGBTs), compound semiconductors (e.g. for high brightness LEDs or RF-power amplifiers), as well as emerging technologies that also involve thin or flexible substrates (MEMS; RFID-tags, flexible displays, etc.) require reliable handling and support techniques in order to ensure safe processing.
