Showing results: 46 - 60 of 239 items found.
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SPECTRO MIDEX -
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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FISCHERSCOPE X-RAY 4000 -
Helmut Fischer AG
For continuous measurement of coatings on foils, strips and punched strips in ongoing productionMeasuring head may be positioned at right angles to the transport direction of the specimenEasy handling and quick start-upProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorPositioning device for measurements on several measuring positionsCustomer-specific designAutomated calibrationFast conversion from one production line to anotherEasy integration into quality management systems and process controls
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FISCHERSCOPE X-RAY 5000 -
Helmut Fischer AG
Flange measuring head for continuous measurements in production linesProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorQuick and easy calibration on a workpiece master directly in the production processFor use in air or vacuumAllows measurements even on very hot substrate materials up to 500 C (930 F)Design is focused on maximum robustness and serviceability
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FISCHERSCOPE X-RAY/XDV-SDD -
Helmut Fischer AG
Premium model with universal application characteristicsHighest excitation flexibility, for both the size of the measurement spot and the spectral compositionWith the silicon drift detector, even very high intensities> 100 kcps can be processed without a loss in energy resolutionVery low detection limits and excellent repeatabilityLarge and easily accessible measurement chamberAutomated series testing with fast, programmable XY-stage
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Gasmet Technologies Oy
Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.
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Harpia-TF -
Light Conversion Ltd.
HARPIA‑TF is a time-resolved fluorescence measurement extension to the HARPIA‑TA mainframe that combines two time-resolved fluorescence techniques. For the highest time resolution, fluorescence is measured using the time-resolved fluorescence upconversion technique, where the fluorescence light emitted from the sample is sum-frequency mixed in a nonlinear crystal with a femtosecond gating pulse from the laser. The time resolution is then limited by the duration of the gate pulse and is in the range of 250 fs. For fluorescence decay times exceeding 150 ps, the instrument can be used in time-correlated single-photon counting (TCSPC) mode that allows for measuring high‑accuracy kinetic traces in the 200 ps – 2 μs temporal domain. HARPIA‑TF extension is designed around the industry leading Becker&Hickl® time-correlated single-photon counting system, with different detector options available.
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Petro-Marine -
Xenemetrix Ltd.
The powerful Energy Dispersive X-ray Fluorescence (EDXRF) analyzers of Xenemetrix are capable of more sensitive and precise analysis than can be expected from a laboratory class analyzer.
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SLFA-20 -
HORIBA, Ltd.
The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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SLFA-2100/2800 -
HORIBA, Ltd.
The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Dantec Dynamics A/S
Planar laser-induced fluorescence (PLIF) is an optical diagnostic technique widely used in fluid and gas applications. PLIF has proven to be a valuable tool for flow visualization as well as for quantitative whole-field measurements of scalars such as concentration and temperature in liquid and concentration in gaseous flows. Applications can be found in process engineering, biomedical engineering, and fluid dynamics research.
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SLFA-6000 -
HORIBA, Ltd.
HORIBA Scientific, a market leader in sulfur-in-oil analysis, announces the launch of the new SLFA-6100/6800 Energy Dispersive X-ray Fluorescence Analyzer, which measures sulfur in oil ranging from 5 ppm to 9.9999%. This new, compact, and accurate analyzer meets the needs of anyone wishing to conform to ASTM D4294, ISO 8754 or JIS K2541/B7995.
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Pharmaceutical Elemental Impurities Analysis System -
Shimadzu Corp.
Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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EDX-LE -
Shimadzu Corp.
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.