X-ray Fluorescence Measuring Instrument

X-ray Fluorescence Measuring Instrument

Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)Features a fixed aperture and a fixed filterSuitable for structure sizes starting at about 1 mmLarge and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is availableStandard X-ray tube, proportional counter tube

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