Showing results: 46 - 60 of 525 items found.
-
HK Film Capacitor Ltd
High Voltage Pulse Capacitors, High Voltage Energy Discharge Capacitors, High Voltage Filter Capacitors and Customized High Voltage Capacitors
-
790 -
SPY Inspection Equipment
For a wide range of coatings the easy-carry and easy to handle SPY Model 790 speeds inspection time with its built in Jeep meter and various other time saving and comfort features
-
Elcometer Limited
For numerous products, such as paint, ink, varnishes, glue and cosmetics, the reliability of many laboratory tests is directly related to the quality and consistency of the samples. Any measurements made on coatings for the purpose of describing their physical properties (drying time, elasticity, abrasion, gloss, colour, shade, etc.) are made on the basis of uniform and comparable samples with precisely controlled thickness.
-
155 -
Elcometer Limited
This enables the application system to be set up and fine tuned prior to the curing process. In turn, this will reduce the amount of scrap and over-spray.Place the comb into the powder and slide the comb along the surface. The measurement points (or teeth) are pointed and allow the powder to flow around them.
-
154 -
Elcometer Limited
Metric and Imperial values are on the same comb, 50 to 800μm on one side, 2 to 32mils on the other.
-
Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
-
P-1000 -
Axic Inc.
The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and applications.
-
LittleFoot Series -
n&k Technology, Inc.
The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
-
CSR5100 -
Rhesca Co., Ltd.
The micro-scratch method (JIS R-3255), which is an evolution of the scratch method that evaluates the adhesion strength between the thin film formed on the material surface and the base material, enables the detection of peeling of thin films. detection, we have a highly sensitive destruction detection mechanism based on our own patented technology (Patent No. 5070146) to evaluate the adhesion strength of ultra-thin
-
128 Series -
Frontier Semiconductor, Inc,
Bow and Global Film Stress Measurement.Non-contact full wafer stress mapping for semiconductor and flat panel application.Dual Laser Switching Technology.
-
112AL -
Elcometer Limited
The Elcometer 112AL, being punched from aluminium, is not as accurate as precision formed stainless steel wet film combs and has a shorter lifespan.
-
Olympian Series -
n&k Technology, Inc.
DUV-Vis-IR (Wavelength Range: 190nm – 15,000nm) Scatterometers / Thin Film Metrology Systems: The n&k Olympian, n&k Olympian-450 and n&k Olympian-M are DUV-Vis-IR scatterometers/thin film metrology systems with micro-spot technology, covering the wavelength range from 190nm – 15,000nm. With the inclusion of the infra-red wavelength range, the Olympian Series extends the capabilities of n&k’s DUV-Vis-NIR scatterometer series – the OptiPrime-CD Series.
-
OptiPrime Series -
n&k Technology, Inc.
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
-
OptiPrime-X Series -
n&k Technology, Inc.
The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
-
CHY-CA -
Jinan Saicheng Instrument
CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.