Showing results: 256 - 270 of 525 items found.
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RT4 -
Hanatek Instruments
This comparative test works by abrading a printed sample against a reference material under known conditions. The results can be used to identify alternative substrates, better ink and coating formulations or the suitability of finished cartons, films or printed books, magazines and promotional materials.
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RT4 -
Rhopoint Instruments
This comparative test works by abrading a printed sample against a reference material under known conditions. The results can be used to identify alternative substrates, better ink and coating formulations or the suitability of finished cartons, films or printed books, magazines and promotional materials.
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456 -
Elcometer Limited
The Elcometer 456 dry film thickness gauge is available in four different models. Each thickness gauge provides the user with increasing functionality - from the entry level Elcometer 456 Model E, to the top of the range Elcometer 456 Model T.
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Ashcroft Inc.
General purpose industrial pressure transducer provides outstanding integrity concerning high shock, vibration and pressure cycling. Utilizing high-performance ASIC, digital compensation provides excellent temperature performance, while the thin film sensor enables long-term stability.
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TE Connectivity Ltd.
TE Connectivity (TE) piezoelectric sensors provide durable vibration, accelerometer, or dynamic switch elements for a wide range of markets and applications. Piezo sensors and transducers are available in various forms including film, cable, and miniature elements in standard and customized packages.
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Fortress Technology Inc.
Phantom Surface Web Metal Detection systems are designed to detect metallic fragments in wide, sheeted materials, continuous webs, and other thin products like textiles, paper, boards, food packaging, boxboard, poly films or products packaged on a roll/web.
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Flyin Optronics Co., Ltd
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
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508 PV -
CRAIC Technologies
The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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KLA-Tencor Corp
The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
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Flyin Optronics Co., Ltd
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
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Flyin Optronics Co., Ltd
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
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Flyin Optronics Co., Ltd
Flyin optronics' Micro-Optics WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
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MS-100 -
Component Engineering, Inc.
The MS-100 booth monitor amplifier is intended to be not only a means by which the projectionist can listen to the film being shown, but as a trouble-shooting diagnostic tool as well. Enough inputs are provided so that all significant points in the theatre's sound system can be sampled and their condition quickly determined.
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VEO -
Vision Research Inc.
The Phantom VEO camera series was designed to work well in nearly any application. The rugged body construction and custom sensor deliver the superior imaging quality that Phantom cameras are known for. These cameras can be found in science laboratories, outdoor areas, and on film production sets.
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Bruker Corporation
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.