Showing results: 196 - 210 of 525 items found.
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Veeco Instruments Inc
Physical Vapor Deposition Systems offer maximum flexibility for a wide range of thin film deposition applications with advanced process capabilities, unsurpassed uniformity and multiple deposition modes.
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HAM-02 -
Jinan Leading Instruments Co., Ltd.
HAM-02 Haze Meter is a kind of small hazer meter designed according to ASTMD1003—61(1997). It is applying to test the light transmittance,transmission haze, and reflection haze, reflectivity of transparent and semitransparent parallel level material and plasticfilms. Also it is suitable for liquid samples (water, beverage, pharmacy,colored liquid, grease) turbidity measurement. It is the basic instrument for plastic, glass products, all kinds oftransparent packaging films, colored and colorless of organic glass andaerospace, automotive glass and photographic film.
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Dektak® -
Bruker Nano Surfaces
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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HK Film Capacitor Ltd
AC/DC Power Film Capacitors, DC Pulse Current Capacitors, DC Filter Capacitors, Pulse Grade Capacitors, Motor Run Capacitors, Feed-Thru Capacitors and other Customized Capacitors
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900 Series -
Frontier Semiconductor, Inc,
Stress Hysteresis in vacuum or gas up to 900C for the study of annealing cycles.Thermal Desorption, Film Shrinkage, Reflectivity, and Resistivity options provide additional insight to causes of material changes with temperature.
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PN-50α -
NAPSON Corp.
*Principle: Photovoltaic effect by light pulse irradiation*No damage and no stain by Non-contact method*Possible to check even oxidized film on wafer surface*Instantly discrimination by optical pulse illuminate
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Benz Co., Inc.
For impact resistance testing of plastic film, sheet, and laminated materials, a specific weight is dropped from a specific height onto a firmly held sample to determine a 50% failure rate.
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HORIBA, Ltd.
HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
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BTT2880 -
Rinch Industrial Co.,Limited
Main used in belt tension measurement, can also be applied to measure the tension of objects such as tapes, wires. Widely applied in industries of automobile, textile, cables, wires, plastic films, paper, printing.
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PH-SE -
HenergySolar
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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Neocera, Inc.
For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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DUH-210/DUH-210S -
Shimadzu Corp.
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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Novo-Shade Duo + Reflectometer -
Rhopoint Instruments
The Novo-Shade Duo reflectometer has 3 modes of operation*OpacityThis is used for measuring the hiding power of a coating or plastic film*ShadeMeasure the shade of surface on a greyscale*CleanlinessMeasure the substrate cleanliness or oxidisation of a surface
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Dexing Magnet Tech. Co., Ltd
The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Insight Product Company
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.