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Double Data Rate memory achieved by reading both the rising and falling edge of clock.

See Also: Memory, Memory Test, NAND, DRAM, Flash Memory

Showing recent results 1 - 15 of 24 products found.

  • DDR Bus Simulator

    W2309EP - Keysight Technologies

    The W2309EP DDR Bus Simulator quickly generates accurate bit-error-rate (BER) contours, masks, and margins between the two, for the DDR memory bus specification published by JEDEC. The simulator achieves this by use of statistical simulation, meaning no lengthy and time-consuming bit pattern is needed. Instead, it constructs the eye diagram from the transmitter, channel, and receiver impulse responses, and from the stochastic properties of a conceptually infinite non-repeating bit pattern. In doing so it avoids the pitfalls associated with precarious dual-Dirac extrapolation of a limited bit pattern from either SPICE-like simulation or from convolutional channel simulation.

  • DDR Detective Logic Analyzer

    DDR4 - FuturePlus Systems

    Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured StatesContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsMargin analysis shows where command timing fails and where it can be improvedThousands of counters for DDR4 analyze performance metrics real time, all the time, for all commands, total Clocks, by Rank also power management informationInteractions among up to 8 ranks, over two slots are analyzed.Mode register and SPD capture are providedSupports Auto-Clock rate detect and clock stoppageConnects to the target under test with DIMM, SO-DIMM, and BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools

  • DDR Bus Simulator Distributed Computing 8-Pack

    W2317EP - Keysight Technologies

    The Advanced Design System (ADS) Double Data Rate (DDR) Bus Simulator Distributed Computing 8-pack accelerates signal integrity batch-mode parameter sweeps on workstations connected to a distributed computing cluster. This combination enables signal integrity designers to run these sweeps six up to eight times faster than on a single compute node of equal performance. The licenses can be "stacked" in packs of eight, yielding even greater speed up. This product (along with the required product W2312 Transient Convolution Distributed Computing 8-pack), speeds up parameter sweeps for three combinations: 1) Batch Simulation Controller with Transient Simulator and 2) Batch Simulation Controller with DDR Bus Simulator 3) Batch Simulation Controller with Channel Simulator.

  • PC DDR2 DDR3 memory test card for repair desktop and laptop DDR

    ST-MT35 - Shenzhen Sintech Electronic, Inc.

    ST-MT35 DDR memory test card for repair laptop and desktop DDR2/DDR3 is a good test tool when DDR memory test card is defective.It can suppport desktop DDR2/DDR3 and laptop DDR2/DDR3 memory card(need extra adapter to desktop DDR).Only with 1pc motherboard ,it can configure which flash chipset is damaged or these lines open circuit,then it is easy to repair the defective DDR memory card. It also can be used to test good working DDR memory card,it will show flash chip quantity,DDR card capacity.

  • High-Speed Adapter


    Introducing the DDR Pro adapter, the latest advanced test adapter for RAMCHECK. This new high-speed DDR test adapter features advanced circuitry and a powerful high-frequency test engine, allowing you to fully test and identify PC433/466 DDR modules, with planned upgrades to 533MHz.

  • S.O. DIMM Converter

    DDR 200-pin - INNOVENTIONS, Inc.

    The RAMCHECK DDR 200-Pin Converter is a perfect low-cost solution for testing modern laptop DDR memory. The converter plugs directly into the 184-pin RAMCHECK DDR main adapter, providing you with fast, convenient testing capabilities

  • Memory Module Testers

    UniTest Inc.

    The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,

  • Component Testers

    UniTest Inc.

    After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.

  • Interface and Standards IP

    DesignWare - Synopsys, Inc.

    Synopsys offers designers a broad portfolio of complete, silicon-proven IP solutions for the most widely used interfaces such as PCI Express, USB, DDR, SATA, HDMI, MIPI, and Ethernet.

  • AXIe Logic Analysis & Protocol Test

    Keysight Technologies

    Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.

  • Resistivity Meters

    DDR3 - Integrated Geo Instruments & Services Private Limited

    The DDR 3 Resistivity Meter is a specialized version of IGIS Resistivity meters designed for use in Resistivity surveys up to about 200m depth. It utilizes rechargeable batteries as power source to energize the ground thus eliminating the necessity of using the relatively expensive dry cells.

  • Magnum Memory Test System

    Teradyne, Inc.

    Teradyne's Magnum test system delivers high throughput and high parallel test efficiency for non-volatile memories, static RAM memories and logic devices. Magnum's largest configuration provides up to 5120 digital channels and all Magnum configurations provide a 50MHz pattern rate and 100Mbps DDR rate on each channel.

  • IDM+


    Multi-functional fault recorder including: -- Disturbance fault record (DFR)- Dynamic disturbance recording (DDR) - Phasor measurement unit (PMU C37-118)- Power Quality (PQ Class A)- Travelling wave fault location (TWS to +/-60m) - Impedance fault location- Protocols (61850, Modbus, DNP3) - Sequence of event recording (SOE)- GPS, IRIG and NTP time sync- iQ+ masterstation software.

  • Production PCB Combinational Tester

    Intellitech Corp.

    The PT100Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The PT100 Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces.

  • Memory Analysis Software for Logic Analyzers

    Keysight Technologies

    DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.