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Probes for Tube Inspection
Probes for tube inspection are lightweight but solidly constructed eddy current, remote field, magnetic flux leakage, and IRIS ultrasound. These probes are used for ferromagnetic or non-ferromagnetic tube inspection applications.
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Inspection System for high-power precise 3D X-ray CT
X-eye PCT225
Inspection System for 3D X-ray CT able to analyze defected area precisely by precise movement of axis with high polished Anti-vibration table. High-power X-ray Tube of max. 450kV and large area Flat Panel Detector of max.16 inches can be installed depending on the sample. Customized 3D CT equipment is available with selecting main parts by customers depends on their needs for size and material.
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Inspection Toolkit
OTK-4000
The Inspection Toolkit contains selected tools for verifying the existence of threatening electronic surveillance devices.
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High-speed In-Line 3D CT Inspection System
X-eye 6300
Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Industry-Standard, Automated Precision Inspection Systems
Circuit AOI 4.0
Circuit AOI 4.0 is a set of industry-standard, automated precision inspection systems that combine precision, robust construction and line-of-sight technology for assembly and production under stringent regulatory standards and is ideal for PCB / HDI line inspection.It uses innovative alignment detection logic to detect defects such as short / open circuit, protrusion / depression, scratch, pinhole, residual copper, line width / line distance violation, missing objects, unwanted objects, and so on. The system can be used with off-line set-up station and off-line re-check station to enhance the detection capacity.Circuit AOI 4.0 uses multi-angle LED light source, compared to the traditional single angle light source design, can obtain the best image contrast, widely used in different plate inspection.
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Cargo and Vehicle Inspection
In a world where threats continue to evolve and concealment techniques become more sophisticated, our customers are facing more complex, difficult missions than ever.
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Step & Repeat Non-Contact Inspection System for FPC and PCB
OHT-Ⅴ
*Space-saving design and highly efficient and high-speed inspection, with top and bottom slider structure*Roller head enables to handle the reverse imposition.*Easy operation by new alignment mechanism*The machine handlingPCB is called "WSR"
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3D Digital Inspection
Digital stereo 3D imaging is a unique, advanced, stereo image presentation system designed to provide fully interactive real time natural 3D viewing and visualisation with outstanding depth perception.
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21.5" 1920 X 1080 Onboard Passenger Information Display System
ARD-R2150
- EN50155 compliant with cabin temperature OT1 level / EN45545- Brightness: 500 /1500 nits (BOM option)- NXP i.MX8M Plus / Intel Atom x7433RE Processor- Supports 2x M12 D-code LAN 10/100Mb- Wide range DC 24-110V power input- Auto-dimming for enhancing readability and eco-friendliness- IK grade glass/Anti-glare/Anti-reflection/SRF surface coating (optional)- ADLINK PIDS software with EGiFlow for on-site configurations (optional)
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iD-Box 16 | 400 x 150 x 400 mm Enclosure
16-10001-03
A versatile enclosure for high-quality electronic components. Since it is independent of standards, the iD-Box 16 can be designed according to the individual needs of the end customer and adapts in size to the application.
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Coatings Inspection Division
For over seventy years, Elcometer has been a world leader in the design, manufacture and supply of inspection equipment to the coatings industry. Whether you are measuring surface profile, surface cleanliness, dry film thickness, porosity, adhesion or gloss; or testing the abrasion, scratch resistance or elasticity of a coating - Elcometer's extensive and versatile range of equipment provides the complete solution to your coatings inspection requirements, whatever and wherever they might be.
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Car-to-X Test Bench
Qosmotec Software Solutions GmbH
The QPER-C2X adaptation, that emulates signal strength between radio devices for Car-to-X communication in the lab, can be combined with the test automation software CANoe from Vector Informatik to enable a fully automated lab test under realistic radio conditions. This combination can be regarded as full test bench setups for Car-to-X test laboratories.
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Mezzanine System
5174
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Valve Leak Measurement System
VLMS
The G Systems Valve Leak Measurement System (VLMS) reliably measures slow leaks that are unidentifiable with conventional leak detectors, helping manufacturers test and ensure that critical valves are absolutely airtight.
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Wireless Inspection Cameras
General offers three wireless inspection cameras whose probes can be disconnected from the grip and monitor. They are the DCS18HPART (with a 6mm/0.23 in. diameter articulating probe), the DCS1800HP (with a 5.5mm/0.22 in. diameter non-articulating probe), and the DCS500 (with a 9mm/0.35 in. diameter probe and a 5 in. diagonal color LCD). Wireless inspection cameras offer operating flexibility because the user can use both hands to manipulate the probe.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Complete GPR System for Road Inspection
RoadScan
Geophysical Survey Systems, Inc.
The RoadScan™ 30 system provides users with an effective tool for quickly determining pavement layers at high speeds. RoadScan is able to collect data densities not obtainable using other labor-intensive methods commonly used for pavement testing.
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Digital Inspection Probes
DI-1000
The ergonomically designed DI-1000 is Lightel’s all digital video microscope probe. It connects directly to your PC through the computer’s USB2.0 port. Featuring easy single finger focusing, a built-in image freeze/capture button, and detectable resolution to 0.5µm, the DI-1000 package includes our free ConnectorViewTM (standard) software, providing digital zoom, image display, image capture, auto-calibration and basic analysis tools.
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Thickness and Flaw Inspection
OmniScan MX ECA/ECT
With thousands of units being used throughout the world, the OmniScan® MX is a field-proven, reliable instrument that is built to withstand harsh and demanding inspection conditions. Compact and lightweight, its two Li-ion batteries provide up to 6 hours of manual or semi-automated inspection time.
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AXI Inspection Systems
Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises AXI Inspection Systems
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Inspection scope
KI-TK1012
Inspection scope & cleaning materials. Interchangeable MPO SC LC connectors
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Drone Inspection Software
Qii.AI
Qii.AI automates the detection and analysis of defects. It is the only enterprise AI platform that combines drone inspection software with an AI labeling tool, AI-assisted computer vision, and machine learning.
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Semiconductor / FPD Inspection Microscope
MX61L
Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Car-to-X Test Systems
Qosmotec Software Solutions GmbH
Wireless Communication Technology is finding its way into automotive industry – not only for entertainment purposes, but for security and safety reasons: With Car-to-X technology, drivers shall get information that other vehicles and road side facilities already have, for example, in case of a traffic jam ahead, a slippery road behind a curve or a necessary change of the traffic lane because of road constructions.
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NUV-PL SiC Defect Inspection System
VS6845E
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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iD-Box 16 | 300 x 120 x 310 mm Enclosure
16-10003-03
A versatile enclosure for high-quality electronic components. Since it is independent of standards, the iD-Box 16 can be designed according to the individual needs of the end customer and adapts in size to the application.
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3D Solder Paste Inspection
aSPIre 3
Industry-leading measurement accuracy and inspection reliability- Perfect solution to eliminate shadow problems, base plane settings, and problems with projection direction- Full 3D foreign material inspection solution for the entire PCB- High productivity through the highest accuracy
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Automated Optical Inspection Solutions
Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system
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Smart Aircraft System
The Astronics Smart Aircraft System makes that possible. Our patented system enables the immediate, cabin-wide gathering of thousands of data points using sensors & IoT (Internet of Things) technology. The result? You get the insightyou need—when you need it. Insight that helps you on every flight. Insight that allows you to improve your operational efficiency, your cabin safety, and your overall passenger experience.
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9U CTEL Backplanes with system Slot on left 9U8Slot, 3 x P47
103CTEL908-4146R5
Conforms to PICMG basic specification 2.0 R3.0, Versions conforming to PICMG H.110 Computer Telephony specifications, 8-layer and 12- layer controlled impedance stripline design.
