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Standard 0.80 (22.00) - 4.00 (114.00) High Frequency Probe
CSP-03B-006
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 3.70Return Loss @ -20dB (GHz): 1.80Dielectric VTE Rating (k VAC): 1Nominal Impedance (Ohms): 50Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,090Overall Length (mm): 27.76
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Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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HTOL Test Systems
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Inflight Entertainment System Hardware
Innovative IFEC solutions that enable connectivity, entertainment, and control.
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Enhanced Vision Systems for Aviation
Astronics offers the world’s most widely deployed enhanced vision systems for airframe OEMs and general aviation pilots. Used in search and rescue, firefighting, police, construction, and other critical missions, our EVS units are improving visibility and safety every day on fixed-wing and rotorcraft worldwide.
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sbRIO-9201, Non-Enclosed, ±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
781113-01
Non-Enclosed, ±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The sbRIO‑9201 is an effective combination of channel count and speed at a low price for an economical multifunction system. In addition to the absolute protection from the isolation, the module features up to 100 V of overvoltage protection for errant signal connection or unexpected outputs to the individual channels. Non-enclosed modules are designed for OEM applications.
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NI-9260, 51.2 kS/s/ch Simultaneous, 3 Vrms, 2-Channel C Series Voltage Output Module
783467-01
51.2 kS/s/ch Simultaneous, 3 Vrms, 2-Channel C Series Voltage Output Module - The NI‑9260 is an instrument-grade dynamic signal generator for testing the audio components and capabilities of consumer electronic devices and providing excitation in structural test applications. Unlike sound card-based solutions, the NI‑9260 can be deployed quickly and recalibrated to guarantee long-term measurement repeatability and decreased test time. It also features ±30 V overvoltage protection and short circuit protection.
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Image Sensor Testing
IP750Ex-HD Family
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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OTP-Based Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Scienlab Battery Test System — Cell Level
SL1002A
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Alpha Particle Counting System
UltraLo-1800
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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CP500X, 500 MHz, ±60 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
784253-01
The CP500X is a coaxial passive probe with fixed 10X attenuation for oscilloscopes that provide 1 MΩ input impedance. It is 1 meter in length. The CP500X attaches to BNC connections on both the signal input and instrument sides.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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NFC Conformance Test System
T3111S
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Test Requirements Document (TRD) System
TRD Software
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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19” Rackmount Data Collection System
DCS-211
- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Standard 4.47 (127.00) - 12.00 (340.00) High Frequency Probe
K-50H-S
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 2.50Nominal Impedance (Ohms): 50Test Center (mil): 600Test Center (mm): 15.24Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 90Recommended Travel (mm): 2.29Overall Length (mil): 1,205Overall Length (mm): 30.61
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LabVIEW Development Systems
Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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FD-11601, 8-Channel, ±10 V Powered-Sensor Voltage Input Device for FieldDAQ
786374-01
The FD-11601 measures up to eight channels with a voltage input range of ±10 V. Each input channel supports TEDS and provides 24 V DC to power external-powered sensors without additional power supplies. The FD-11601 features 24-bit resolution, simultaneous sample rates up to 100 kS/s/ch, and channel-to-channel isolation. It is IP65/IP67 rated to be dust-tight and water-submersible, operates in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11601 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11601 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11601 is ideal for test cell and outdoor environments.
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CC30100X, 100 MHz, 30 Arms Current Oscilloscope Probe
785562-01
The CC30100X, or Hioki 3276, is a clamp-on current probe that offers a wide DC to 100 MHz bandwidth and 30 Arms of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
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sbRIO-9215, Non-Enclosed, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Modul
780878-01
Non-Enclosed, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9215 performs differential analog input. The sbRIO‑9215 contains NIST‑traceable calibration, a channel‑to‑earth ground double isolation barrier for safety and noise immunity, and high common-mode voltage range. Non-enclosed modules are designed for OEM applications.
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NI-9264, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module
780927-01
25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module - The NI‑9264 is a simultaneously updating analog output module that accommodates higher‑channel‑count systems. Higher density modules conserve chassis space, which leaves room for other measurement types. Each channel has its own digital‑to‑analog converter. The spring-terminal version of the NI‑9264 uses a 36‑position connector for the output channels, and each channel has a ground connection.
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Flight Deck Power Systems
Multiple EmPower products are already a standard linefit option on Boeing and Airbus. Astronics flight deck power systems are modular in design and available in 110VAC, high power USB (10W), and the latest USB power delivery technology - USB Type-C (60W).
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NI-9223, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
783284-01
±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9223 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9223 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9223: either four, 2‑position screw terminal connectors or four BNC connectors.
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sbRIO-9221, Non-Enclosed, ±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
781115-01
Non-Enclosed, ±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The sbRIO‑9221 performs single-ended analog input. The wider voltage range makes this module well suited for industrial-level, automotive, or even smaller-cell battery measurements. There are two connector options for the sbRIO‑9221: a 36‑position spring‑terminal connector and a 37‑position DSUB connector. Non-enclosed modules are designed for OEM applications.





























