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Custom Systems
With our custom VNA your ATE works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
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Multi-Axis Hot Deformation System
MAXStrain
The system restrains specimens lengthwise while allowing unlimited deformation in the other two dimensions. As a result, very high strain levels can be introduced into specimens to produce a sample of ultrafine-grain or nanoscale material that is large enough for subsequent properties testing.
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Instrument Systems LED Measurement Accessories
Konica Minolta Sensing Americas, Inc
It’s critical to use the appropriate LED measurement equipment and accessories when evaluating an LED’s various photometric and radiometric quantities. Because all of the test adapters Instrument Systems designs are compliant with CIE 127:2007, users are assured of compatibility between measurements. Instrument Systems has a diverse array of LED Measurement Equipment.
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MU Cable Tester System
16814
The MU Locomotive Trainline/Cable Test System (MU Test System) can perform shorts testing, continuity testing, and ground-leakage testing on each of the 27 pin Multi-Unit Trainlines normally found on Freight Locomotives. The MU Test System is comprised of two identical tester units. Each unit is installed in a rugged, water resistant Pelican case. Each unit contains an MU cable receptacle that mates with a 27 pin MU jumper cable. A snap-on vinyl pouch on the outside cover of each unit provides storage for the battery charger/power adapter and the chassis test lead. The enclosure cover hinges separate from the test unit as the cover is opened; this removes the cover completely to allow free access to the MU cable receptacle and the control panel.
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Magnetic Field Measurement Systems
The magnetic field probe performs non-contact current measurements and can be used for real traces. The probe of higher resolution enables pinpoint measurements.
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Portable gear inspection- and 3D-measuring systems
ultimate independent measurement - on the production machine or on the shop-floor without rotary table
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Hall Effect Measurement system
HMS-5300
Variable temp : 80K ~ 350K (model#: AMP55T ) - HMS-5300 can be compatibly used with both low temp magnet kit (model# : AMP55T) and high temp magnet kit (model# : AHT55T3, upto 300dC). - Below image is to show model# HMS-5300 + AMP55T, for low temp.
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Surface Defect Inspection System
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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EUV Lithography Systems
Using extreme ultraviolet (EUV) light, our NXE and EXE systems deliver high-resolution lithography and make mass production of the world’s most advanced microchips possible
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Manual Vision Measuring System
Manual Vision Measuring MachineQS-LAF/B QS-LZB QS-EB Series. 2-D Manual Type Vision Measuring MachineQuick Image
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Production – High Speed Functional Test Systems
Chroma Systems Solutions, Inc.
Built for production, our high speed functional automated test system is based on our C8000 platform which uses a unique test command optimization technology to prevent sending repetitive control commands to the system hardware devices. This improves system test speed dramatically and, when used with our PowerPro III software, makes it highly efficient as a closed or optimized auto test system.
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Data Acquisition Systems And Recorders
Aiming to measure, condition, process, monitor and record analogue and digital signals from all common types of physical sensors.
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CCD Spectroradiometer Integrating Sphere Compact System
LPCE-3
LPCE-3 is a CCD Spectroradiometer Integrating Sphere Compact System for LED Testing. It is suitable for photometric and colorimetric measurement of luminaries such as LEDs, LED luminaires, Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps) and CCFL. The measured data meets the requirements of CIE, EN and LM-79 clause 9.1 for the measurement of photometry and colorimetry.
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Blackbody System
IR-563/301
Infrared Systems Development Corp.
IR-563 is a ideal source for the Near (1-3 um), Mid (3-8) and Far (8-30+ um) infrared bands. The IR-563 has been the industry standard 1000º C blackbody for more than 30 years, and continues to provide excellent service to infrared applications throughout the industry. The IR-564 extends the temperature range of the IR-563 to 1200º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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Portable Raman Spectrometer System
IndiRAM Portable Series
IndiRAMTM Portable Series Raman Spectrometer system is one of its kind for quick screening of the samples with high throughput. The system can be customized based on application and requirement.
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I3070 In-Circuit Test System Software
Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.
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Test System
ETS788XL
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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LST-2000 Laser Safety Test System
Hangzhou Everfine Photo-E-Info Co., LTD
The system can measure the spectral power distribution, radiant power, radiant energy, apparent light source size, pulse energy and other parameters of the laser light source, and classify the laser light source according to the standard IEC 60825.1. Because laser measurement involves more condition parameters, limit calculation and judgment process is complex, so this system adopts systematic design, the measurement complexity is simplified, the hardware adopts componentization module, users only need to follow the software prompts, carry out the corresponding steps of operation can accurately measure the effective radiation value under the corresponding conditions. The software calculates the relevant reachable emission limits and automatically classifies the laser product's safety level.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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Charge System Safety
Renesas' charging system safety circuits are optimized to provide a redundant safety protection to an Li-ion battery charging system by monitoring input voltage, battery voltage and charge current.
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OM Thermal Stress System
Conductor Analysis Technologies, Inc
The OM Thermal Stress System is a cost-effective performance based reliability test methodology which performs convection reflow assembly simulation and air-to-air thermal cycling. The methodology is utilized by both the IPC PCQR and the IPC 6012-QLM programs. OM systems are available for sale or lease, and test services are provided from both CAT and our service partners.
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Filter Test System
DU7216/7218
Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Receiver Systems for Monitoring, Surveillance and Logging
We produce complete turn-key radio monitoring systems ranging from portable single-channel applications for field tests and drive-by coverage measurements, to large scale computerized multi-channel surveillance systems capable of monitoring thousands of channels simultaneously.
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Platform for Multi camera systems and Embedded vision
xiX
*Smallest camera featuring Sony Pregius™ - Compact with only 26.4 x 26.4 x 31 mm and 30 grams (1)*Fast CMOS - High speed, high frame rate: from 2.3 Mpix at 166 Fps to 50 Mpix at 33 Fps*Cool economy - Low power consumption with under 3 Watt and minimal heat dissipation*All-around support - support for Windows 7 and 10, macOS, Linux, ARM and embedded platforms*Industry standard - Data and control interface complies with PCI Express External Cabling Specifications*Adaptable potential - Available with two flat ribbon flex cable connectors: parallel and perpendicular *Software interfaces - GenICam / GenTL and highly optimized API / SDK for Image Processing*Connectivity and Synchronization - Programmable opto-isolated input and output, 4 status LEDs*Lens control - EF-mount Interface allows remote control of aperture, focus and image stabilization*Highly Customizable - Variety of sensor options including Sony IMX287, IMX273, IMX249, IMX265, IMX264, IMX267, IMX304 available in board level stack for OEM use and with switches and adapters*Interoperability increase - Continuous embrace of new software and hardware partners*Cost efficient - Excellent value through utilization of the newest technologies including Sony Pregius™
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Universal Multichannel System up to 100V
- From 12 to 48 independently controllable High Voltage channels- 0 ÷ 100 V output voltage- Maximum Current: 1mA, 10 mA or 1 mA/100 μA (dual range board)- Individual Enable (A1510 only)- Either DB37, DB25 or SHV connectors- Available with either positive, negative or mixed polarity- Up to 20 nA / 100 pA current set / monitor resolution- Up to 2 / 0.2 mV voltage set / monitor resolution- Extreme Low ripple, down to < 3 mVpp- 3 different channel grounding- Common Ground (AGxxxx)- Common Floating Return (Axxxx)- Full Floating (A1510 only)- Independently programmable for each channel:- Output voltage- Current limit- Ramp up/down- TRIP parameter- Current generator operation in overcurrent condition- Specific design for double side silicon detector (A1510)
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Vision Systems
Our GEVA vision systems offer the performance and flexibility to inspect multiple parts, assemblies or surfaces at the same time. These systems are equipped with multi-core processors, high-speed camera ports and versatile I/O options to match your application and factory integration requirements.
