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Advanced Power Supplies
N7900 Series
The Keysight Advanced Power System (APS) N7900 Series is a full-featured supply designed for automated test equipment (ATE) applications that benefit from high-speed dynamic sourcing and measurement. The highly integrated N7900 enables you to accelerate your test-system throughput with industry-leading speed and precision measurements. The APS N7900 has all the capabilities of the N6900 but also includes dynamic output power, dynamic measurements, and higher accuracy. While standard on the N7900, high accuracy, dynamic sourcing, and power are available as separate options on the N6900.
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Advanced Power System - Dynamic DC Power Supply, 40 V, 25 A, 1000 W
N7952A
The N7900 Series dynamic DC power supplies are designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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PXI 8-slot BRIC Multiplexer, 96-Channel, 10-Pole (8 Sub-cards)
40-570A-416
The 40-570A-416 is a 96-channel, 10-pole High-Density Multiplexer and is part of our BRIC family. The 40-570A range is designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing.
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Advanced Power System: Dynamic DC Power Supply, 120 V, 16.7 A, 2000 W
N7976A
The N7976A is designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Advanced Power System - Dynamic DC Power Supply, 20 V, 50 A, 1000 W
N7951A
The N7900 Series dynamic DC power supplies are designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Auxiliary
To complement our main battery test equipment systems, Arbin Instruments also offers a full complement of auxiliary modules to address further testing requirements. These modules expand testing capability beyond the main charge/discharge control circuitry and can be placed in either the main chassis or a small external chassis, making it easy to add auxiliary options to your existing systems.
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Three Phase Closed I-P Link Energy Meter Test Bench Type KP-S3000-B
Bofa Instrument & Equipment Co., Ltd
Three phase closed I-P link energy meter test bench, type KP-S3000-B, is designed for testing three-phase energy meters, especially for testing Closed I-P Links three-phase energy meters. It is an ideal testing equipment for energy meter factory or R&D institute. All the testing procedures can be automatically operated by PC or by Keyboard manually.
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Specialty Test Instruments
Special test equipment means “either single or multipurpose integrated test units engineered, designed, fabricated, or modified to accomplish special purpose testing in performing a contract.
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Environmental Test Chamber
High and Low Temperature Test Chambers, ESS Environment Stress Screening, 2 Zone Thermal Shock Test Chamber, 3 Zone Thermal Shock Chambers, Walk-In Chambers, Burn-in Room and Aging Test Chambers, Altitude Chambers, Industrial Drying Oven, Salt Spray Test Chambers, Temperature Humidity Vibration Comprehensive Test Chamber, Test Machine Series, Custom Made Environmental Test Equipment, Double-Layer High and Low Temperature Chamber, Explosion Proof Temperature Chamber For Power Battery, etc.
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SLSC and CRIO Modules and Accessories
Our approach to delivering a high-quality Aerospace, Automated Test Equipment (ATE) asset begins with leveraging National Instruments hardware and software standard platforms. Beginning with high quality instrument platforms for standard Input and Output (I/O), we leverage NI’s PXI and Compact RIO platforms. Extending these system is NI’s unique platform for Switching, Loads and Signal Conditioning (SLSC), which allow the standard I/O to be customized for high performance aerospace industry applications.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Digital Leeb Hardness Tester
TIME®5350
Beijing TIME High Technology Ltd.
TIME Group manufactured the first Leeb hardness tester in China in 1989 and has been the leading manufacturer of hardness testing equipment since then. Among all the TIME hardness testers, TIME®5350 is the best one with all the features. It looks like a mobile phone, easy to carry and makes a perfect tool for on-site hardness testing. Maximum 32GB MicroSD card can be used to store measured values.
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Non-standard Constant Acceleration Tester
KRD32 series
KRD32 series non-standard constant acceleration testing machine is test equipment for military products to simulate dynamic centrifugal motion, dual environmental force centrifugal motion and central high-speed rotating motion.
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Economic Type Potentiometer Indicator
CS1-PM
CS1-PM economic type Potentiometer Indicator has been designed with high accuracy measurement, display and communication of resistance (3 wires) as like as Positioner.The meter supports Field Calibration function. It can be calibrated with sensor (Potentiometer) to meet machinery structure.They are also available 1 option of 1 Relay outputs, 1 Analogue output or 1 RS485 (Modbus RTU Mode) interface with versatile functions such as control, alarm, re-transmission or communication for a wide range of machinery and testing equipments applications.
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Transformer Resistance Testing
Weshine Electric Manufacturing Co., Ltd
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the WESHINE Transformer Ohmmeter (VS-3110 series) of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Filter Testers
All filter test equipment from TSI, used for testing efficiencies of filter media and a variety of air filters, including high and very high-efficiency filters, respiratory filters, cartridges, and protective garments, is known for its simple and reliable operation.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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IEC61850 Relay Test Set
NF802
NF802 is full digital IEC61850 relay test set, equipped with 8 optical ports, and powerful data processing capability, can realize full digital IEC61850 protection relay testing.
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Leak Test Instrumentation
At Cincinnati Test Systems (CTS), we are dedicated to providing our customers with superior quality leak testing systems. With access to advanced designs, features, and test algorithms in our leak test devices, we promise a fast and reliable leak test product that will also provide repeatable results for air leakage testing, gas leakage testing, or any other leak where reliable testing equipment is needed. Browse our family of products to learn more on how our standard and custom built systems can meet your needs:
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EMC Testing
Testing of Electromagnetic Compatibility (EMC). PHOENIX TESTLAB's accredited testing laboratory for EMC offers testing equipment to carry out current and planned EMC tests according to national, international and different company standards.
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PXI 3A Power MUX BRIC, 24-Channel, 12-Pole
40-571-306
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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Standard Products
SBIR offers an extensive line of reliable, high performance test equipment used to characterize and calibrate IR, Visible and Laser systems. Products include blackbodies, visible sources, target wheels, targets, collimators, target projectors, laser test modules/systems and IRWindows™ software for automated testing. These modular, cost effective instruments are user-friendly and easily integrated into automated test systems. For more information, including printable data sheets, select a product from the list.
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PXI-2595, 5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module
778572-95
5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module—The PXI‑2595 is ideal for applications that require the routing of high-frequency signals inside automated test equipment (ATE) systems because it can switch signals with very low insertion loss. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Software for System-Based Protection Testing
RelaySimTest
RelaySimTest is a software solution for system-based protection testing with OMICRON test equipment that takes a novel, future-oriented approach: the test is independent of relay type and relay manufacturer and the often very extensive parameter settings. Instead, it completely focuses on the correct behavior of the protection system. This is made possible by simulating realistic events in the power system.
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Economic Type Resistance Indicator
CS1-RS
CS1-RS economic type Resistance Indicator has been designed with high accuracy measurement, display and communication of Ohm(2 wire) as like as Coil of motor or transformer.The meter supports Field Calibration function. It can be calibrated with sensor (Resistance) to meet machinery structure.They are also available 1 option of 1 Relay outputs, 1 Analogue output or 1 RS485 (Modbus RTU Mode) interface with versatile functions such as control, alarm, re-transmission or communication for a wide range of machinery and testing equipments applications.
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TAP Pods
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Configurable Microwave and Optical Witching Platform
1257
The Astronics 1257 switching system is a high-performance switching and control system available in 4U, 5U, or 6U rack-mountable packages. The unit draws upon our four decades of experience as a major automated test equipment (ATE) switching supplier to set a new standard in switching systems.
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PXI 3A Power MUX BRIC, 15-Channel, 16-Pole
40-571-205
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
