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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Instrument Bracket Kit With Strain Relief, Slide Configuration, For 28" And Longer
310113453
Strain Relief
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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VXI 12-Channel Digital-to-Analog
65DA2-55
NAI’s 65DA2-55 is a 12-channel Digital-to-Analog Instrument on a VXI board. This single-slot, message-based board provides twelve independent, single-ended, 16-bit, Digital-to-Analog (D/A) channels.
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Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits
310113002
Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits Similar to instrument bracket p/n 310113453, but includes cutout to accommodate air intake on NI PXIe-1088 chassis. Only compatible with slide configurations 28" and longer. Not compatible with cable tray. Not recommended for use with 2+ tier 90 Series systems (905, 9075, etc.).Used to mount testing instrument to slides and also allows test instrument to slide out for maintenance access. Provides strain relief in front area of bracket. Compatible with chassis (see drawing for more information)
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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PXIe, 28.2 Gbps, 48-Channel PXI High-Speed Serial Instrument
PXIe-7903 / 788917-01
The PXIe-7903 is designed for engineers who need high-performance FPGA coprocessing capabilities or who need to validate, interface through, and test serial protocols. It includes a Xilinx Virtex UltraScale+ FPGA to implement various high-speed serial protocols, and it is programmable with the LabVIEW FPGA Module for maximum application-specific customization and reuse. The PXIe-7903 takes advantage of FPGA multigigabit transceivers to deliver 48 TX and RX serial lanes.
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Spectroscopy Card
microDXP
The microDXP is a complete, low power compact digital spectroscopy card design for a wide range of handheld, benchtop and other embedded applications, lowering cost and speeding time-to-market.
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Instrumentation & Control
Rotork offer high performance and precision for all instruments and related products; intrument valves, controllers, and measurement
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Environments Instruments
This multifunction anemometer provides instant data such as Air Speed and Temperature in Dual Level LCD display with Backlight. This tool has wide measuring range of wind speed from 0 ~ 45m/s (0 ~ 8800ft/min) and temperature from 0 ~ 45°C (32 ~ 113°F).
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Laboratory Instrumentation
Haydon Kerk Pittman has developed motion control systems used in: multi-axis sample management systems requiring high performance and reliability to meet high duty cycle requirements; microscopy stages demanding high precision positioning in multiple axis simultaneously; motion systems for automatic pipetting which requires very accurate motion for aspiration and dispense modes helping to eliminate manual pipetting errors.
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Multi-function Instrumentation
PXI Arbitrary Waveform and Programmable Function Generators as well as DC source cards and a precision standards module.
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Essential Instruments
All Digilent test and measurement devices are multi-instrument electronics tools designed to bring the benchtop to you. Digilent's portable USB scopes, logic analyzers and signal generators allow you to measure, visualize, generate, record, and control mixed-signal circuits of all kinds. Combined with our free WaveForms software, detailed documentation, and a dedicated support community, our test and measurement hardware will turn your computer into a multi-instrument circuit analysis tool, all without the physical constraints of a lab.
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Custom Instruments
Mensor provides custom instruments such as high speed or high volume pressure controllers to meet specific customer requirements. These custom instruments are used to deliver pressure in high speed production environments and high volume testing applications.
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Instrumentation HPAs
Communications & Power Industries
CPI SMP Division provides a complete line of high-powered continuous wave (CW) and pulsed instrumentation amplifiers for EMC testing, available in octave and multi-octave bandwidths from 1.0 GHz to 95.0 GHz and power levels exceeding 2.0 kW to meet the new military and automotive standards. CPI is the only supplier that manufactures both the traveling wave tube (TWT) and the TWT amplifier.
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Analogue Instruments
Devices for installation in control, command and distribution panels. A needle on a gauge allows users to quickly interpret the electrical parameters. Analogue devices provide for fast, visual management, without having to interpret the data in order to determine the status of the installation.
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LXI Instruments
ProDAQ 61xx Series
The ProDAQ 61xx Series is a family of LXI Instruments based on the ProDAQ 6100 LXI architecture, which provides high-througput and precise synchronization for a new family of high-performance standalone LXI instruments.
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Polarization Instrumentation
This page features the optics and instrumentation necessary to control and measure the polarization of light. Our free-space and fiber-coupled polarimeters can measure any state of polarization (SOP) on the Poincaré sphere.
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Instrument Mainframe
PI-11008
The PI-11008 Instrument Chassis was designed to accommodate the power and noise requirements of some of Pulse Instruments analog instrument cards. These instrument cards, such as the PI-41401, PI-41702 and others supply signal outputs that require more current from the -12 V supply than available in a standard chassis. Therefore this chassis has a larger -12 V power supply that provides 2.5 Amps.
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Testing Instruments
NDT testing instruments, other testing instruments, paper testing instruments, plastic testing instruments, rubber testing instruments, soil testing instruments
