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Product
OPTICAL PHASE NOISE TEST AND MEASUREMENT SYSTEM
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OEwaves’ HI-Q® Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
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Product
Phase Noise Test System
PN9000 System
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Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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Product
Test Box
RF
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This is a custom made part of a Phase Noise test system. It contains relays, filters, amplifiers, and so on. It works with other of-the-shelf eqipment, and custom software to form a high volume production test system.
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Product
Phase Noise Analyzer
NXA-50
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This new NXA-50 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 50 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range.
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Product
Phase Noise Analyzer
NXA-26
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This new NXA-26 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 26.5 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range. The NXA-26 combines over 25 years of Phase Noise Measurement Technology with an easy to navigate user interface. System operation requires minimal training that will have you making measurements in minutes.
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Product
Hi-Q W-Band Ultra Low Phase Noise Analyzer
OE8000W
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HI-Q® W-Band phase noise test system utilizesmicrowave photonics techniques for automatedmeasurement of ultra-low phase noise W-bandoscillators.
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Product
Phase Noise Analyzer and VCO Tester
FSWP
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The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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Product
Phase Noise Analyzer and VCO Tester
FSPN
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The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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Product
Low-Noise Filter, 210 V / 3 A
N1298C
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The N1298 Series power source accessories are a collection of low noise filters for the Keysight B2960 Series precision source / measure units (SMUs).
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 15 dB)
N4001A
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The SNS series N4001A noise source is ideal for general purpose use with a low reflection coefficent and a nominal ENR of 15 dB from 10 MHz to 18 GHz.
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Product
Phase Angle Voltmeters
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Since the development of the first Phase Angle Voltmeter (PAV) over 50 years ago, North Atlantic Industries has been the industry leader in AC Measurement Instrumentation. Our name has become synonymous with innovation and quality. Our products, specifically designed for defense, industrial, and commercial applications, deliver industry-leading accuracy, repeatability, and reliability.NAI’s units of today are actually multifunction Digital Analyzing Voltmeters that combine a complete Voltmeter, a Phase Angle Voltmeter, and a Waveform Signal Analyzer in a single microprocessor-based instrument. With these versatile and flexible instruments, a wide range of tests can be performed, either manually using the front panel controls or automatically using the IEEE-488 bus. Designed for the Synchro/Resolver and LVDT/RVDT marketplace, NAI’s Voltmeters are used in a variety of applications.
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Product
Advanced Low-Frequency Noise Analyzer
E4727B
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Get a deeper, closer look at low frequency noise with the A-LFNA integrated with WaferPro Express, featuring data analysis, wafer prober control and test suite automation.
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Noise Source, 1 GHz up to 50 GHz
346CK01
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The Keysight 346CK01 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 50 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty, which are reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 20 dB at 1 GHz, decreasing to typically 7 dB at 50 GHz.
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Product
Industry Standard in Noise Measurement
PN9000
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The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range(2 MHz to 140 GHz). Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a compact instrument.
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
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The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
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Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Functional Test Fixtures
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Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Active Alignment Assembly & Test Platform
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Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Product
NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Scienlab Battery Test System — Cell Level
SL1002A
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Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
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Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
PXI Integration Platform
ATS-3100
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The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
Phase Noise Test System
N5511A
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The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
