Integrated Development Environment
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MEMS Test System Development
olidus Technologies’ can design and build a test system customized for your exact needs, using our own or off the shelf components:Custom MEMS Test Systems. We can integrate and assemble test equipment and handling systems to fit your requirements. Custom MEMS Test Software. We can write custom software for device-specific calibration and testing, interfacing various instruments and handling systems, or create a customized GUI. We can also adapt our standard STI Test Software to work on your hardware system.
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Signal Integrity Products
Renesas' signal integrity products provide a 300% reach extension over passive copper solutions, and consume 80% less power than competing optical solutions. Renesas lane extender chips with analog equalizers are the perfect solution for DisplayPort™ USB-C long active cables.
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5 Slot VME64 Portable Tower Development Platform
32V05MMX36N3VCC0
Elma Type 32V with superior cooling and accepts 6U cards mounted vertically with or without rear I/O card cage, VITA & IEEE standards, heights are 63HP and 84HP (HP=.2”) and widths 3U, 4U and 6U.
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Development Kit
The VP430 is 3U VPX RF processing system featuring the transformational Xilinx® Zynq® Ultrascale+™ RF system-on-chip technology (RFSoC). The ZU27DR device used on the VP430 includes eight integrated analog-to-digital converters at 4GSPS, eight digital-to-analog converters at 6.4 GSPS, a user-programmable FPGA fabric, and multi-core Zynq ARM® processing subsystem.
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Integrated Leeb Hardness Tester
TIME®510D
Beijing TIME High Technology Ltd.
TIME®510D is an updated version of TIME5120 Leeb Hardness Tester, the cheapest and most popular leeb hardness tester manufacturer by TIME. It is portable and integrated with universal impact device D. Compared to TIME5120, the new product offers significant improvements in both outlook and performance.
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TTCN-3 Compilation & Execution Environment
Titan
Titan is a TTCN-3 compilation and execution environment with an Eclipse-based IDE. The user of the tool can develop test cases, test execution logic and build the executable test suite for several platforms. TTCN-3 is a modular language specifically designed for testing (the acronym itself stands for Test and Test Conformance Notation), standardized by ETSI (see www.ttcn-3.org) and endorsed by ITU.
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Integrated Airborne Solutions
UAVs have evolved into the 'Go-To' platform for many remote-sensing applications. Headwall's integrated solutions combine a hyperspectral imaging sensor and choice of GPS/IMU mounted on a high-performance UAV.
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Engineering Design & Development
TPSA has over 20 years of experience in Engineering Design & Software Development including:Hardware & Software DesignOTPS Acquisition SupportSystems Installation & SupportAircraft Modification/CertificationEngineering Studies & AnalysesFunctional & Systems TestingIndependent Verification & Validation (IV & V)Test Program Set EngineeringReliability & Maintainability (R&M)Engineering Drawings & DataConfiguration Data ManagementReverse EngineeringRequirements AnalysisSupport Equipment (SE)Aircraft Launch & Recovery Engineering (ALRE)Engineering Change Proposal (ECP) ReviewTechnology Insertion (TI)PDR, CDR, FAT, Techeval, OSV Support
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Universal Development Board For The PCAN-MicroMod CPU
PCAN MicroMod Evaluation Kit
As a plug-in module, the PCAN-MicroMod represents a simple way of providing electronic circuits with I/O functionality and CAN connection. The configuration is carried out with a Windows program that transfers the configuration data to the module via CAN. Several modules can be configured independently of one another on a CAN bus.
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Software Development Kit for ARINC 615A Targets
A615A-TGT-SDK
Avionics Interface Technologies
ARINC 615A Data Loader Target development kit enables systems developers to embed ARINC 615A compliant data load functionality into avionics target applications.
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Gases & Environment Meters
Lutron Electronic Enterprise Co., Ltd.
Gases & Environment Meters by Lutron
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Windows On Arm Development Kit
ROM-2860
ROM-2860 (Qualcomm QCS6490 OSM) built-in MS Windows 11 IoT Enterprise O.S. with the cable kit,power Adapter and audio board.
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Development Kits for BASIC/C-programmable IoT Modules
These kits will help you test, evaluate, and write apps for our range of BASIC/C-programmable IoT modules.
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Turret Integrated Rotating Systems (OMFV)
Slip Rings can be fitted on tank turrets and military vehicles for frontline operations, allowing power, Ethernet, video and CAN bus signals to be transmitted on the battlefield using fiber optic channels.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Automated Development Framework
TestPoint
TestPoint is an automated development framework built to maximize code re-use, minimize maintenance, and abstract complexities from developers.
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Development System
FE-RE2
* Emulates Atmel AT89C51IE2/RE2 and others * 128K Code Memory * Real-Time Emulation * Frequency up to fmax 60 MHz * 3V and 5V Support * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * RS-232 and USB Interface * C Compiler and Assembler
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Cryogen-Free DR With Integrated Magnet
Magnet thermally linked to cryocooler 2nd stage Ideal for smaller magnets up to 17 T or small vector magnets up to 7T / 2T / 2TSingle pulse tube cryocooler for cooling both magnet and DRMagnet operation at 700 mK or 4 KUse with top-loading probeFast Sample Change
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FlexVNX+ Test And Development Platform Aligned To SOSA And VITA 90 Standards
39S08VPX98Y2VAN
Elma’s all-new FlexVNX+ Test and Development chassis is the next generation portable test platform designed to accelerate development and test of VNX+ plug-in cards (PICs) aligned to The Open Group® SOSA™ Technical Standard and VITA 90.
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The Integrated Solution To GNSS + GBAS Functional Testing
GSS4150
To help developers and integrators test the airborne GNSS receiver in their GBAS landing system (GLS), Spirent has developed the GSS4150 solution. The GSS4150 is a VHF signal source generator, supporting multiple different message types, enabling you to build the solutions that power the future of aviation.
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Integrated DC Hipot Tester
ZGF / 503
Wuhan Huatian Electric Power Automation Co., Ltd.
Specifically used to detect electrical insulation strength and leakage current of power devices.
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Dual Digital Aquisition System For Charge Integration And Pulse Shape Discrimination
DT5790
The DT5790 operates upon the DPP-PSD firmware, specially developed for Charge Integration and Pulse Shape Discrimination. DPP-PSD is based on an advanced on line Digital Dual Gate Charge Integration allowing an effective data analysis even at high count rate. It performs input signal baseline calculation, self-triggering and double-gate charge integration with programmable parameters, double integration of both prompt and total charge for Pulse Shape Discrimination and pedestal subtraction for energy calculation.
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NETCONF & YANG Development
*Extensible YANG Datastore Server*Built and instrumented using ndCONF Agent Development Studio*ndCONF - NETCONF, RFSCONF, SNMPv3and CLI management products*Migrating SNMP & CLI access to ndCONF's NETCONF, RESTCONF, SNMPv3 and CLI integrated management
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Integrators
Integrators are used to meassure electric charges in real time. In contrary to digital charge integration, the analog integrator accuracy does not depend on the frequncy of data sampling and can resolve small changes disregarding the data sampling rate. In case of pulsed signals, the analogue integration produces reliable results without requiring high data transfer rates.
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Bluetooth Integrated Digital Multimeter Detector
Bluetooth with Memory Integrated Wireless Connectivity 4 in 1 Digital Multi Detector With Moisture Detector
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6 Slot 4U CompactPCI 19" Rackmount Development Platform
39C06AD648Y4HCCX
The Type 39C is an advanced generation of CompactPCI chassis for PICMG 2.0, 2.16, 2.17, and EXP.0 applications. IEEE 1101.10/11, 6U x 160mm CPCI cards from the front and 6U x 80mm I/O cards from the rear.
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Development System
FE-W7
* Emulates Winbond W77xxx or W78xxx Microcontrollers * 125K Code Memory * Real-Time Emulation * Frequency up to fmax at 1.8V to 5.5V * Wide Supply Voltage Support * MS-Windows Debugger For C And Assembler * Emulation Headers for PLCC, QFP and DIP * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
