Integrated Development Environment
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Product
Test Solutions For Integrators
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Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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Temperature & Environment Monitors
Room Alert
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Monitors Temperature, Humidity, Power, Flood/Water, Smoke/Fire, Motion, Room Entry, Air Flow, Panic Buttons, Network Cameras and more. Offers built-in sensors & allows external sensors to be added.Allows unlimited alert notifications & unlimited users. Allows notification via email, SMS, SMTP, dial-out page, audio alert, webpage update, logfile update and more.
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Integrating Sphere Systems
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An optical device for various purposes such as. measuring the radiant flux (optical power) from a laser diode, light-emitting diode (LED) or bulb.
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IQ Modulators with Integrated LO
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Analog Devices IQ modulators and demodulators operate at frequencies up to microwave and feature a combination of high performance, broadband operating frequency, and flexibility.
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FlexVNX+ Test And Development Platform Aligned To SOSA And VITA 90 Standards
39S08VPX98Y2VAN
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Elma’s all-new FlexVNX+ Test and Development chassis is the next generation portable test platform designed to accelerate development and test of VNX+ plug-in cards (PICs) aligned to The Open Group® SOSA™ Technical Standard and VITA 90.
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Product
Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
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The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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PathWave Test Executive For Manufacturing Developer Version
KS8328A
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PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
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Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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ESS Environment stress screening
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Temperature adaptability test under the condition of rapid change, or gradient for electrical, electronic, instruments and other products or spareparts, particularly applies to environmental stress screening test（ESS）
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Linux-based Development Platform For The GridARM™ ΜController
PEAK gridARM Evaluation Board
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The ARM7 microcontroller gridARM™ was developed by Grid Connect® as a system on a chip solution (SoC) for the implementation of embedded applications with a focus on industrial communication. The Evaluation Board PEAK-gridARM is a Linux-based development platform for the gridARM™ microcontroller. It has connections for Gigabit Ethernet, high-speed CAN, USB 2.0, RS-232, SPI and I²C. The digital and analog inputs of the evaluation board can be manipulated with buttons and potentiometers. The states of the microcontroller, the supply and the message traffic are displayed via LEDs. A board support package for Linux enables access to the hardware resources of the PEAK-gridARM evaluation board.
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Product
Rugged COM-HPC Server Type Size E Reference Development Platform Based On Ampere® Altra® SoC
Ampere Altra Developer Rugged
Software Development Kit
The rugged 4U rackmount server platform provides a cloud-native environment for embedded edge development. It can host the SOAFEE (Scalable Open Architecture for Embedded Edge) providing a cloud-native environment for embedded edge development and is compatible with Autoware Foundation's Autoware Open AD Kit. It supports the open source EDKII as bootloader with UEFI, so customers can just download a stock AArch64 (arm64) ISO such as Ubuntu and install it through booting a live ISO directly on the target. The same convenience we have become used to by using x86 / amd64 target systems.
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Product
Integrated Turbine Rotor Measurement and Assembly Platforms
GeoSpin
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Rotary Precision Instruments UK Ltd
Improve productivity and achieve higher levels of quality by reducing inspection times and the need for costly teardowns due to inefficient rotor assembly.GeoSpin has been specifically developed for the measurement and assembly of smaller gas turbine rotors for the aerospace and power generation industries reducing the rate of teardowns by 95%.
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HV Enclosures with Integrated Safety Test
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The HV test hood according to Performance Level e (ISO 13849-1), developed by us according to the EN50191 standard (erection and operation of fixed and temporary electrical test installations), offers the highest safety for the operator. The large test chamber is enclosed with a hood made of sturdy, highly insulating and transparent plastic. During the test, there is a clear view of the test specimen. A signal light visually indicates safe opening when the light is “green”. “Red light” symbolises danger, the hood cannot be opened due to the safety interlock. The safety switch also ensures that the hood cannot be opened during the test. This means that the test hood fulfils all the required specifications for compulsory contact protection.
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Test development service
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Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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Integrated Two-Stage Current Sensors
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If ultra-low noise performance is required, our integrated two stage devices are the number one choice. With input inductances from 24 nH to 1.8 µH and a flux-noise level as low as 0.8 µPhi0/sqrt(Hz) an energy resolution of about 45 h is attained. The devices consist of a 16 SQUID series array as amplifier stage and a single front-end SQUID.
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Integrated FET Regulators For Automotive
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Renesas offers several buck, boost, boost-buck, and buck-boost integrated FET regulators for automotive applications.
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Integrating Sphere FT-NIR Spectrometer
QuasIR 3000™
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The QuasIR™ 3000 was designed from the ground up to offer the industry a new kind of NIR analysis solution – a solution that brings together the portability required to move NIR analysis closer to point-of-need, combined with unmatched spectroscopic performance for the fastest and most accurate results.
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Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Affordable, Ultralight, Easily Integrated Cameras
ARIA Series
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ARIA represents Alkeria’s answer to the increasing demand of affordable, ultracompact, ultralight and easy to integrate cameras. Choose between the most common and requested sensors, get all the benefits of USB3 interface and Alkeria’s smart I/O. Top quality delivered in the size of a coin, the weight of a feather and at convenient price. A camera born for embedded vision, inspection and OEM design.
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MEMS Test System Development
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olidus Technologies’ can design and build a test system customized for your exact needs, using our own or off the shelf components:Custom MEMS Test Systems. We can integrate and assemble test equipment and handling systems to fit your requirements. Custom MEMS Test Software. We can write custom software for device-specific calibration and testing, interfacing various instruments and handling systems, or create a customized GUI. We can also adapt our standard STI Test Software to work on your hardware system.
