Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Test & Measurement Services
We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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Pattern Conversion
Wave Wizard
Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Pulse Adapter
CV30P650
Frothingham Electronics Corporation
The CV30 P650 test station is currently the highest voltage pulser in a series of exponential pulse generators that can be connected to our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. The CV30 P650 pulse adapter can produce a maximum current of 100A at up to 600V using exponential pulses up the 10/1000 waveform. The pulser is rated at 30KW from 300V to 650V. Voltage compliance at 100A is 600V. The station can also include all of the usual FEC200 tests in the same test program.
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Spectrum Analyzer Modular AFM AXIe
The software and hardware complex "Modular Spectrum Analyzer AFM AXIe" for the analysis of RF signals with a frequency of up to 10 GHz is intended for use in automated testing programs, research in the frequency domain of periodic signals in the RF and microwave ranges, as well as for analyzing the parameters of signals with analog modulation (AM, World Cup, FM).
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Test Engineering
TestEdge engineers have an average of 17 years of engineering experience in test, packaging, and fixturing. This experience is across a wide spectrum of products, customers, and ATE platforms. We have experience in all of the following:Digital, analog, mixed-signal, RF Test programming servicesRemote test capability Semi-automatic test generation Automatic data collection and reduction High performance test fixturing Format independant vector translation High power testing with liquid cooling
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Content based revision compare of Test Programs
Test program Comparator
TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
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HV AC Hipot
The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
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Flying Probe Test
Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In addition to test program development, we offer board test services, maintaining the systems and staff that allow for high throughput and the ability to consistently deliver the rapid turn times that customers can depend on. And, with 7,000 square feet of space, we feature a modern, clean, ESD safe and ITAR registered facility that surpasses expectations.
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Test Requirement Document for Developing and Documenting Strategy and Structure of Test Programs
TRD System
The TRD System helps users develop and document the strategy and structure of test programs using TRD format screens, flowchart generation tools and documentation formats, all in accordance with the most popular military standard format ( MIL-STD-1519) or with unique custom formats. It also has the ability to automatically generate an ATLAS test program from the TRD information provided by the user.
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Remote Control Voice Recognition Tester
BK3013
Ready to help you take on the leading edge of consumer technology, we have designed a machine that tests microphones which both use RF and are used for voice recognition. The BK3013 runs a uniform SPL sweep to calculate FRF and also runs an SPL sweep that allows you to test the SPL range of your mic. Our "Test Shop" program will show you the results in graphs and allows you to have the computer check specific points in the test.
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High Power LED Test System
Lumere-GM
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Modular Relay Board
Alliance Support Partners, Inc.
An increasing number of electronics products are being assembled in panels of 8 or more to minimize production cost. These products are typically tested with in-circuit tests (ICT) followed by power-on functional tests. Normally, ICT requires isolation of power and ground while measurements are being performed. Functional tests, including in-system programming (ISP), require board power to be applied. The Modular Relay Board (MRB) is designed to switch power onto each individual board and to disconnect sensitive signals during functional test.
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JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Drug Stability Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
If you want find complete details about Integrated drug stability test chamber, Drug stability test chamber, Chemical drug stability test chamber, New designed integrated drug chamber, Good quality integrated drug test chamber - China Sanwood Environmental Chambers Co., Ltd. The scientific method to create a drug for a long time to failure evaluation of stable temperature, humidity and light environment for pharmaceutical enterprises to accelerate drug test, long-term test, high humidity and strong light test, is the best choice for pharmaceutical companies and drug stability test program.
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Integrated Test Facility
ITF
The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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JTAG based Test & Flash Programming Services
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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FPGA Testing
Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
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Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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ApTest Services
Applied Testing and Technology, Inc.
We undertake projects ranging from short term engagements to long term partnering, for customers from startups to the Global 1000. Many ApTest projects encompass a complete outsourced test design and development program, while others involve assisting a client with defining or implementing in-house testing programs.
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Development Software Suite
JTAG ProVision
The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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DiodeTester
FECPLS510
Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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Environmental Stress Screening
ESS
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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Website User Testing
User experience research platforms. Analytics delivers what, Userlytics reveals why & how. A scalable user testing program combined with response & action dependent user test scripts. Now you can design a scalable user testing project that has the flexibility and ability to customize the UX test to the actions and responses of each UX test participant.
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Data Logging and Analysis With Tecap
Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Furniture Testing
We can test to ANSI/BIFMA or any government, military or industrial test standard. American Testing Laboratory can design a specific furniture testing program tailored to meet your particular needs.
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Universal Tester Software Platform
APG (Automatic Program Generator) is a user-friendly 32-bit programming system aimed at providing fast and easy test program creation. It is a powerful Windows Application with all of the features of the Windows® environment enhanced by Autotest’s own Multi-Tasking Windows control.
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Aging and Life Test Rack
SY2036
SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
