Showing results: 256 - 270 of 692 items found.
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Evans Analytical Group®
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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PicoSource PG900 Series -
Pico Technology Ltd.
The fast-transition pulse can stimulate a transmission path, device or network with a broad spectrum signal in a single instant. Such a pulse is very useful for many of the high-speed broadband measurements that we need to make; for instance in time-domain reflectometry, semiconductor test, gigabit interconnect and port test and in radar.
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SEMOZON® AX8580 -
MKS Instruments
The SEMOZON® AX8580 Ozone Delivery System generates and delivers high flow, high concentration, ultra-clean ozone for advanced thin film applications. The SEMOZON AX8580 is specifically designed for use with an increasing number of semiconductor process applications such as ALD, CVD and TEOS/Ozone CVD.
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LGR-ICOS Series -
ABB Ltd.
LGR-ICOS laser process analyzers accurately measure gas concentrations with extraordinarily high sensitivity, fast response and over a wide dynamic range in both simple and complex mixtures. They are ideal for contaminant monitoring in HyCO (syngas), fuel gas, petrochemicals, and semiconductor fabrication facilities.
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Panasonic Automotive & Industrial Systems Europe GmbH
Modern semiconductor technology enables fast, quiet, bounce-free switching, even in miniature sizes. PhotoMOS relays nevertheless enjoy an almost unlimited lifetime if used according to the specifications. Moreover, they are extremely reliable, unaffected by vibrations, and their ON-resistance remains stable throughout their entire lifetime.
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Model 541A -
TREK, INC.
Trek Model 541A electrostatic voltmeter series are microprocessor based devices which are ideally suited to monitor critical operations associated with semiconductor, LCD, electronic assembly, and other processes where static charge accumulation poses a threat to production yields or product quality.
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STAr Technologies, Inc.
Semiconductor product yield is the utmost priority for all wafer fabrication plant as it represents the viability of a wafer fabrication plant to compete for customers. STAr provides multiple software solutions for wafer fabrication plant to improve yield by reducing errors and enabling advanced data analysis.
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CS-900 -
HORIBA, Ltd.
In order to fulfil the tight chemical concentration control required in semiconductor WET process, HORIBA realizes higher functionality to meet the needs by designing compact equipment while maintaining stable measurement and carrying out operator safety through its original sensor design.
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HF-960H -
HORIBA, Ltd.
The HF-960H accurately measures concentrations of hydrofluoric and hydrochloric acid used in semiconductor manufacturing and other processes. The dedicated FES-510 series sensor is made from materials that are highly resistant to chemicals, making this unit ideal for the management of hydrofluoric and hydrochloric acid, even in high concentrations.
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Sonix Inc.
Image quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.
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Integra Technologies
Integra Technologies is an industry leader in providing qualification, design verification and reliability testing services to semiconductor manufacturers and military/space/aerospace and automotive OEMs. Integra offers a full range of qualification services as well as the technical guidance to define a qualification plan that meets your requirements.
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IMV Corporation
A Piezo-resistive Accelerometer has a stable structure composed on a silicon chip created by the micromachining and semiconductor production technology. A mass and a beam on which a set of the Piezo-resisters are created on the silicon chip. A set of electrical bridged is formed by such Piezo-resistive resisters to generate signals proportional to the applied acceleration.
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T2000 -
Advantest Corp.
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Reltech Limited
Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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Corelis, Inc.
Corelis offers services to validate the accuracy of Boundary-Scan Description Language (BSDL) files that characterize the boundary-scan functionality of semiconductor devices. These services include validation of a device's BSDL file while the chip is still in development and BSDL file accuracy verification against actual silicon.