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iJTAG

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

See Also: JTAG, JTAG Controllers, JTAG Debuggers, JTAG Emulators, P1687, Instrument Controllers, Semiconductor


Showing results: 1 - 4 of 4 items found.

  • ScanWorks IJTAG Test

    ScanWorks IJTAG Test - ASSET InterTech, Inc.

    The ScanWorks Internal JTAG (IJTAG) tools allow system-on-a-chip (SoC) designers, DFT engineers and validation engineers a new and simpler way to access, control and run any embedded instrument designed into chips. When the IEEE ratifies the IEEE 1687 IJTAG standard in 2013, it will enable easy access to run any functional type of IJTAG instrument. ASSET is the first tool supplier with development tools available today for the early adopters of this important new technology.

  • IJTAG IP Integration Environment

    Tessent IJTAG - Mentor Graphics Corp.

    To manage the complex requirements of testing a heterogeneous set of embedded IP, the industry developed IEEE P1687 (IJTAG). It standardizes a language for describing the IP interface and how IPs are connected to each other. It also introduces a language that defines how patterns that operate or test the IP are to be described. IEEE P1687 draws a clear line between what must be covered by the standard and what is better left to the ingenuity of the tool developers.

  • JTAG (and IJTAG) Environment Tool Suite

    SAJE - SiliconAid Solutions, Inc.

    SAJE is the SiliconAid Suite of JTAG related standards focused tools for chip development, verification, validation and patterns generation of ATE, Board, and System Test. Each tool can be used as a point tool by itself to compliment other tools in your flow. However, the SAJE Tool Suite used together in a flow can provide a total solution that also leveraging previous steps for debug and analysis.

  • Develop - Simulate - Validate JTAG / IJTAG based IP

    NEBULA - Intellitech Corp.

    You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.

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