Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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Burn-In Boards
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Manufacture of burn-in boards since 1976. Established for more than 40 years in the market, Trio-Tech is recognized and is an approved global supplier to all major semiconductor companies. Trio-Tech has the capability to design and manufacture boards for all system types, with solutions available for many test conditions, Including HTOL, PTC, HAST and 85/85.
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Product
Burn-In Tester
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Universal test bench system. Provides basic electrical measurements at a low cost. Designed for a wide range of electronic products with a dedicated wiring harness. Allows you to expand the scope of functionality. Work in automatic or manual mode. Tailored to the needs of low- and high-volume production
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Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Product
RF Burn-In Services
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Innovative Circuits Engineering, inc
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
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Product
Burn-In Test
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C.C.P. Contact Probes Co., LTD.
Customized Burn-In Test Sockets for temperatures of up to 180°C.
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Electric Burn-in Board Carts
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Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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Product
Burn-in Room and Aging Test Chamber
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Isolated type of burn-in room features: ●Separate the product and loading area, easy to control temperature and maintain. ●Temp. range: 40-70ºC±3/±5ºC, ●Temp. constancy: ±0.5ºC ●Uniformity: ±3ºC ●Test frame materials: painted stainless steel or a combination of forming aluminum ●Insulation: with PU foam ( doors with double glazing ) insulation, so that the internal temperature is not subject to external factors, to achieve power saving effect ●Product hierarchy placement, Selection of layer height in accordance with the requirements, convenient access ●Computer monitoring system is optional. ●Noise level:≤75dB Application Suitable for all kinds of electronic products, especially for products with heating characteristics Product and loading area should be separated Large-scale production
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Product
300mm Single Touchdown Burn-in and Test System
FOX-15
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Up to 15 wafers at a time Known Good Die solution Lowers production cost
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Product
Laser Diode Burn-In Testing
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Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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Product
High Power Burn-In Test
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Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
Burn-in Board Continuity Tester
CT-1
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Burn-in Board Coninuity Tester. Verifies burn-in board continuity and component tolerances. 768 I/O channels, can be forced to the constant current source or grounded independently. Highly accurate measurement of resistance, voltage, and capacitance using a pair of precision instrumentation amplifiers.
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Product
Burn-In Boards
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Meets burn-in requirements, including extreme temperatures or continual handling. 2 or more layers of polyimide. 200 C maximum temperature. Gold-plated connectors.
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Burn-In System
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The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
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Advanced Burn-in and Test System for packaged parts
ABTS-Li
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High power logic individual temperature control
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Product
Low Voltage Burn-in and Test System
Max 450
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For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Product
Burn-in Room and Aging Test Chamber
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Aging test room according to your requirements. More types of Burn-In Test Room, Burn-In Chamber, Burn-In Test Oven wanted, please contact us freely.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
LED Burn-In Test
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Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
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Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
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Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Burn-in Systems
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Incal Offers A Line Of State-Of-The-Art Burn-In Testing Hardware And Software For Retrofit And/Or Total, Customized Burn-In System Configurations.
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Product
Burn-In Systems
OPTIMUM Series
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Advanced Microtechnology, Inc.
The OPTIMUM product line of burn-in systems has a model to meet your individual testing requirements. Please select one of the models below for more specific information
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Product
Continuity Tester, LED
26330
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If the bulb lights up, continuity exists. If the bulb fails to light, the circuit is open. Not for use on live circuits, but incidental contact with 12V supply will not burn out LED bulb.
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Multi-Channel Controllers
7000 Series
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The new 7000 Series MultiSource Multi-Channel Controller is designed for applications requiring a large number channels in a cost-effective and compact solution. With both laser driver and temperature controller options, the MultiSource is an excellent building block for system applications such as device burn-in and characterization.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Flame Burning Tester
DRK3024A
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Shandong Drick Instruments Co., Ltd.
It is used to detect high temperature resistance, combustibility and combustion performance of materials.
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Product
Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
