Next Generation Automatic Test System
part of IFTE family of test equipment for the US Army. IFTE
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PXIe-5413, 20 MHz Bandwidth, 2-Channel, 16-Bit PXI Waveform Generator
785114-01
PXIe, 20 MHz Bandwidth, 2-Channel, 16-Bit PXI Waveform Generator - The PXIe-5413 is a 20 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms and standard functions including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -12 V to +12 V and uses a fractional resampling method to precisely generate waveforms. The PXIe-5413 also features advanced synchronization.
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Macro-Vickers Hardness Testing System
LV Series
LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Flexible Test System Automation Platform
RF2000A
The Ranatec RF2000A is a flexible test system automation platform that helps you to integrate your complete test system into a single box. No more cables and discrete parts on your desktop!
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Double Arm Alignment Automatic Testing Machine
U820
1. CCD automatic alignment, the alignment accuracy reaches ± 2.5μm2. Support layout test, displacement function3. The upper and lower jigs X, Y, θ are automatically fine-tuned to improve the yield4. Optional laser marking5. Optional SHOPFLOOR report output6. Optional BARCODE READER
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Simulation Systems
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Automotive Electronics Functional Test Systems
Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2F-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Short Circuit Test System
Shanghai Guantu Technology Co., Ltd.
The short-circuit test system refers to what kind of short-circuit test is carried out by which equipment, and how long is the test time. But I have one thing to tell you, the short circuit test is a kind of destructive test, mainly to test the working condition of the used equipment in a crisis situation, or to test how strong the anti-destructive ability of the used equipment is. Just like a lot of equipment in the military must undergo a short-circuit test, some for 3 minutes or longer, in order to resist breaking calls against the enemy during wartime.
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Polarity & Burn in Test Systems
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 8 Channels
DN2.653-08
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1R2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Lightning Impulse Voltage Generator Test Equipment
HTCJ-V / 170
Wuhan Huatian Electric Power Automation Co., Ltd.
Used for conducting impulse voltage tests of lightning impulse voltage full wave, lightning impulse voltage truncation wave and operating impulse voltage wave for power equipment, etc., to test insulation performance.
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IPX3 IPX4 Rain Test System
CX-RIP3/4
Shenzhen Chuangxin Instruments Co., Ltd.
For checking the protection against water with spray nozzle of 0,4 mm bore are used to prove the degrees of protection for the second characteristic numerals 3 and 4 “Protection against Spraying Water” resp. “Protection against splashing Water”.
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Automatic Dielectric Constant, Tan Delta & Resistivity Test Set
*Fully automatic or manual measurement In-built AC/DC voltage sources.*RS232 computer interface & USB printer interface provided.*Menu-driven software operation.*Data storage facility.
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Discrete Device Test System
capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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System Integration
G Systems develops fully integrated systems and we know that both software and hardware are equally important to system design. Our focus on code quality and optimization ensures customers receive efficient and maintainable code. We specialize in LabVIEW development and all of our LabVIEW developers are certified developers or architects. We’re also highly skilled in mechanical and electrical hardware design and builds on a wide variety of data acquisition, signal conditioning, RF, and distributed communication platforms.
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Ultrasonic testing / UT System
Xiamen IDEA Electronic Technology Co., Ltd.
IDEA-UTXX Intelligent Digital Multi-channel Ultrasonic detector uses the most advanced digital electronic technology and ultrasonic technology.With utilitarian function,steady performance, easy operation and favorable price, which is the full-digital intelligent ultrasonic detector that has the excellent price versus performance ratio.
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Multisite Testing – Rail System
Mechanical system allowing the flexibility of multi-site testing with adjustable site to site spacing The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without effecting the thermal equilibrium of the system.
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AOI & SPI Test Systems
Xceed AOI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The Xceed enables true 3D measurement and provides the most accurate and repeatable inspection results with the minimum false calls. It’s designed with Advanced Signal Processing which gives results in noise-less, clear, and accurate 3D images.
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VIDEO LINE TEST GENERATOR
VLTG-800
The VLTG-800 Video Line Test Generator creates a standard NTSC video signal that can be observed on a Monitor to display a series of vertical lines that defines the maximum number of “lines of definition” that the CCTV system is capable of displaying. The Generator creates eight groups of lines, ranging from 100 to 800 lines.
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All-In-One Battery Testing System
Integrating charge-discharge and temperature testing into one.
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Vibration Test Systems
G-5 Series
Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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Portable Ruggedized Test System
BADGER
Badger systems utilize NI's CompactRIO (cRIO), Single Board RIO (sbRIO), and/or CompactDAQ (cDAQ) hardware. The Badger product line offers high speed data acquisition/control and flexibility in an industrial package. Badger chassis and instrumentation have a 50 g shock ratings and a wide -40 to 70 °C operating temperature. These systems are ideal for automotive, industrial automation, remote monitoring, field service, and advanced control applications.
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Manual Flying Probe Test Systems
They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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Electrodynamic Vibration Test Systems
CV-series
CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
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Active Probe, 2 GHz
N2796A
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
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Generators
Noise Generator
The noise type to be generated is to be selected from the context menu: right-click the section with the noise name and select the noise type you need.
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Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3D-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Telephone Headset and Handset Test System
THT
TE2000 Headset Tester for audio testing headsets and handsets using computer generated test sounds.
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Automotive EMC test systems
Dozens of manufacturer's and other automotive immunity standards with their roots in ISO 7637 continue to evolve bringing new challenges to users of conducted immunity testing. Teseq continues to advance the state of the art, bringing simple, flexible solutions for the challenging and fast-changing requirements that are 42 V ready.Teseq has been at the forefront of the pioneering work to establish EMC tests for motor vehicle electronics. Automotive manufacturers and suppliers worldwide have come to trust test systems from Teseq. Active involvement in the standardization committees ensures that the latest advances are continously reflected in our test systems.
