Test Call Generators
check telecom networks by call event validation.
-
Product
EXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz
N5173B
-
Balance budget & performance to address parametric testing of microwave components & receiversPerform LO up conversion for microwave backhaul links or CW blocking for receiver testingMaximize test throughput with 600-s frequency switchingCharacterize microwave filters & amplifiers with the best combination of output power, low harmonics & full step attenuationUse as a high-stability system reference: the standard high-performance OCXO has an aging rate of 5x10-10 parts/day
-
Product
Test Fixture
N1295A
-
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
-
Product
Belt Starter Generator Test Systems
-
D&V has developed 12 V, 48 V and higher voltage BSG and ISG testing systems for performance, endurance and production testing, complete with thermal chambers, chillers and assembly lines.
-
Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1G-1
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
-
Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2F-2
-
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
Arbitrary Function Generator PXI Card
GX1200 Series
-
The GX1200 and GX1201 are high performance, single-channel PXI arbitrary waveform generators that combine a function generator, arbitrary waveform synthesizer, programmable sequencer, pulse generator, and modulation generator in one instrument. The GX1200 Series delivers all this at a lower cost than comparable benchtop or VXI-based instruments.
-
Product
Standard 1.50 (43.00) - 3.00 (85.00) General Purpose Probe
P2665G-1C1S
-
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
-
Product
204.8 kSa/s Smart PXIe Arb. Waveform Source
EMX-1434
-
The VTI Instruments EMX-1434 is an arbitrary source/tach high performance modular PXIe board. It is uniquely designed for sound/vibration and DSA applications and can be easily synchronized with digitized data giving the capability to combine the required source and signal analysis into one single chassis to maximize flexibility. The module can also functions as a high-performance arbitrary waveform generator for electronic test applications requiring standard function generator capability, or the need to generate custom-defined waveforms.
-
Product
Active Probe, 1 GHz
N2795A
-
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
-
Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
-
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
-
Product
Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3H-2
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Scienlab Combined Battery Test Solution
SL1133A
-
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
-
Product
Flight Control System Test Platform
-
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
-
Product
Generic test automation framework for acceptance testing and ATDD
ROBOT FRAMEWORK
-
Robot Framework is a generic test automation framework for acceptance testing and acceptance test-driven development (ATDD). It has easy-to-use tabular test data syntax and it utilizes the keyword-driven testing approach. Its testing capabilities can be extended by test libraries implemented either with Python or Java, and users can create new higher-level keywords from existing ones using the same syntax that is used for creating test cases.
-
Product
Standard 1.50 (43.00) - 3.00 (85.00) General Purpose Probe
P2665G-1W1S
-
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
-
Product
PCIe 5.0 Test Platform
PXP-500A
-
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
-
Product
Flat, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0F-1
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
-
Product
VIDEO LINE TEST GENERATOR
VLTG-800
-
The VLTG-800 Video Line Test Generator creates a standard NTSC video signal that can be observed on a Monitor to display a series of vertical lines that defines the maximum number of “lines of definition” that the CCTV system is capable of displaying. The Generator creates eight groups of lines, ranging from 100 to 800 lines.
-
Product
Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 4 Channels, up to 80 MS/s on 8 Channels
DN2.656-08
-
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
-
Product
PXI-5412, 20 MHz Bandwidth, 1-Channel, 14-Bit PXI Waveform Generator
779176-03
-
20 MHz Bandwidth, 1-Channel, 14-Bit PXI Waveform Generator - The PXI‑5412 is a 20 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms and standard functions including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
-
Product
Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-8
-
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
-
Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2B30-2
-
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
PXIe3.0-based 9GS/s Arbitrary Waveform Generator
P9082M
-
The P9082M is a PXIe3.0-based 9GS/s arbitrary waveform generator module that provides technologically advanced options and configurations, such as a dual-channel 5.4GS/s ADC signal acquisition channel with 9GHz bandwidth that converts the instrument into an arbitrary waveform transceiver .
-
Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74B
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
-
Product
Generators
Amplitude-Modulated Signal Generator
-
The Software Signal generator allows to produce amplitude-modulated signals at the DAC output.
-
Product
Replaceable General Purpose Probe
MEP-30
-
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
-
Product
PXIe-5745, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO Signal Generator
785596-01
-
The PXIe-5745 enables direct RF generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s for generation up to 1.5 GHz or in a single-channel wideband upconversion mode at 6.4 GS/s. The PXIe-5745 is ideal for applications that require high channel density IF signal generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for generating predefined waveforms, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA for dynamically creating waveforms, signal modulation/demodulation, and other custom real-time signal processing.
-
Product
Generators
Vibration Shock
-
Software Vibration shock is used for testing specimen resistance to vibration impact. This software is a part of the software complex ZETLAB VIBRO, supplied together with vibration control systems ZET 017-U. The software enables generation of impacts with pre-set parameters and noise presence within a specified frequency range. The software is activated via ZETLAB control panel and VCS menu.
-
Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
-
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
-
Product
E-S General Purpose Probes
-
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 65Full Travel (mm): 1.65Recommended Travel (mil): 43Recommended Travel (mm): 1.09Overall Length (mil): 495Overall Length (mm): 12.57Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.70Recommended Drill Size: #51Overall Length Remark: Overall length for E-S-V and E-S-W is .540 (13.72)
