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Custom Test Fixtures
For popular high speed components like semiconductor packages, and test contactors, we have developed a custom test fixture which allows the use of high bandwidth microprobes to measure virtually any I/O pin, according to GigaTest's methodology and requirements.
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Audio Panel/Amplifier Test Fixture
TA-200
The Model TA-200 test panel was designed to allow Avionics shops the capability to test and troubleshoot both today's new generation audio panels as well as the standard audio panels of the past. The testing of these panels over the years has always proven to be a very time consuming job for most shops because of the limited capabilities of any past test panels.
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 1000 Units, Max UUT 450x330MM (wxd)
CMK-07
Linear click system with ball bearings, using gas springs. 10 mm ESD-proof top cover with aluminum reinforcement bars. Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 250 mm (wxd)
CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Mach Airspeed Test Fixture
TA-6055A
The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
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RF-Ready DC Fixture
The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus. The matching structures also allow incorporation of more complex stabilization structures.
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Manual Fixture Kit
230353 – CMK-04
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Standard & Custom Test Fixtures
Both standard and custom Test Fixtures from OAI enable the user to integrate the solar cell with the I -V tester. Fixture configurations range from from simple hold down devices to temperature-controlled fixtures with front and back side contact. We invite you to contact an OAI Application Engineer for help with your fixture design. With our expert guidance, you can expect maximum performance from your I -V Tester and Solar Simulator.
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Clamshell Type Mechanical Fixtures
Series 30
Semco’s GR Series 30 mechanical kits are an inexpensive solution to printed circuit board testing that requires the benefits of GR2270 style (VG) interface compatibility.
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Exchangeable Test Fixture
MA 2109/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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MIPI Test Fixtures and Tools
In order to support our MIPI test services, UNH-IOL has designed and created test fixtures and software tools to aid in performing C-PHY, D-PHY, DSI, and CSI-2 testing.
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Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 450 x 330 mm (wxd)
CMCSK-07-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Test Fixture Kits
Our test fixture kits provide cost effective solutions to printed circuit board testing and other devices under test. Our modular kits are available in multiple sizes and configurations. They can easily be customized if our standard doesn’t meet your requirements. Removable side panels for ease of fabrication for I/O connections, switches or other hardware.
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In-Line Functional Test Fixtures
Add an advantage to in-line production with fast change over interchangeable fixturing. Circuit Check’s in-line board handlers and in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading handlers.
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200 Vdc External Voltage Bias Fixture
16065A
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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High Speed Spin Fixture
1571P Series
The Model 1571 High Speed Rate Table System is designed to provide a precision high velocity testing solution for the development and/or production testing of inertial packages or their components.
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USB-C® Short Channel Rx Precet. Test Fixture
AUT20098
*Easy swap between CC1 and CC2RP & RD Mode: In the older version of the USB-C full breakout board, users had to manually set the jumper with a short pin. But now users can easily swap between the two by just moving the switch.*In the previous version, the soldering joint of Test Fixture Host Fixture 1A gets worn out quickly from repetitive plug and pull. This newly designed fixture is more durable and users can easily replace the worn out SMA connectors with new ones.*DC-in Jack is upgraded to +5V USB C portA boost in user experience as it makes setting up easier.
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Debug Fixture
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Automatic Fixture Removal
S95007B
Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
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MIPI Test Fixtures & Software
The UNH-IOL has been a contributing member of the MIPI Alliance since 2007 and tests all mobile devices looking for MIPI conformance and physical layer testing including C-PHY, D-PHY, DSI, and CSI-2. All UNH-IOL MIPI Test Fixtures and Tools are available to member and non-member companies. Below are just some of the MIPI Solutions we offer. For a full list please visit our MIPI Test Fixtures page.
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SMD Test Fixture
16034G
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Clamshell Type Mechanical Fixtures
Series 70
The VP Series 70 Mechanical Test Kits provide a solution to printed circuit board testing using the Virginia Panel ITA G12 Interface.
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Wireless Test Fixtures
At Forwessun, we have vast experience in designing and delivering wireless in-circuit test (ICT) fixtures. We have experience in providing fixtures tailored to the unique needs of various different industries. While our primary customer focus has been on full and half-bank fixtures for the HP3070 system, we offer bespoke solutions for other platforms as well including GenRad, Teradyne, and SPEA systems.
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Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 400 mm (wxd)
CMCSK-04-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Fixture Building Software
FixGenius
Tests show that FixGenius’ rule-based probe-mapping algorithms reduce pin deflection by up to 25% compared with traditional fixturing packages. FixGenius comes with a powerful Fixture Editor that allows the user to change the probe mapping. If a solution is mathematically possible, FixGenius’ algorithms will find it, and pick the one with least deflection. If the job simply cannot be done with one single fixture, FixGenius will fully automatically split the test into multiple fixtures or into fixture and flying probe test sets, with guaranteed test integrity.
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Main Air Data Test Fixture for ADC's
TA-245
This is the Main Air Data Test Fixture as shown in the AZ-241 repair manuals and will allow by the book testing of the units.
