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Product
In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
PCB Test System
Circuit Wizard - CW409
Test System
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Test Workflow Pro
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
PXI Integration Platform
ATS-3100
Test Platform
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
Hybrid Single Site Test Handler
3110
Test Handler
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Digital Functional Test
CTS100i
Functional Test
Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Scienlab Battery Test System — Cell Level
SL1002A
Test System
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
In-Circuit Test System
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
