Simulation Testing
See Also: Simulation, Simulators, Simulation Software
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Product
PXI Strain Gauge Simulator Module 2-Channel, 3k
40-265-102
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The 40-265 range consists of 6, 4 or 2 channel modules (this version is the 2-channel, 3kΩ) that simulate the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems. The range provides a simple way of replacing in house developed sensors with a low cost simulator having excellent performance. The 40-265 uses the same resistor bridge techniques that real life strain gauges are based on, ensuring accurate emulation under all conditions.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
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Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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SoC Test Systems
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Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Radar Target Simulator
E8707A
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Rapid developments in the autonomous vehicle and demand for greater safety features is fueling the need for more sensitive and accurate automotive radar technology being deployed in advanced driver assistance systems (ADAS). With its rich expertise in radar test technology, Keysight now offers the E8707A radar target simulator to help automotive electronics manufacturers confidently simulate radar targets in various realistic scenarios.
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Product
Thermocouple Simulator Module for SLSC
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Bloomy’s 8-Channel Thermocouple Simulator Module provides eight channels of galvanically-isolated thermocouple simulation and simulates types E, J, K, M, N, and T thermocouples. High-precision digital-to-analog converters which are isolated from each other and from system power provide sub-microvolt resolution and accuracy. Built-in switching provides open-circuit faults as well as switching to system calibration resources.
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Product
PXI/PXIe Battery Simulator Module, 2-Channel, Simplified Current Sink, 750 V Isolation
41-752A-903
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Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 2-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
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The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
Dual Port Simulator Fiber Channel PCI-X Module
PCI-X FC4 Simulyzer
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The modules are available as a single-function board - for analysis or for simulation / data generation - but also as a full-function board for simultaneous analysis and simulation. With a simple firmware/software upgrade, a single function board can become a full function board without having to purchase new hardware.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
6TL60 Rotary Test Handler
H79006010
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6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
6TL24 Combinational Base Test Platform
H71002400
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The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Functional Test
xUTS
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Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
PXI/PXIe LVDT/RVDT/Resolver Simulator Module, 4-Banks
41-670-001-AABBCC
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The 41/43-670-001 is ideal for the simulation of variable differential transformers (VDT), both linear (LVDT) and rotary (RVDT) types, as well as resolvers. It has four banks, each capable of simulating the output of a single 5 or 6-wire VDT or resolver, or dual 4-wire utilizing a shared excitation signal. This allows the module to simulate up to 4 channels of 5 or 6-wire or 8 channels of 4-wire.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
In-Circuit Test System Calibrations
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Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
PXI Isolated Millivolt Thermocouple Simulator - 8 Channel
41-761-004
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The use of two wire outputs and isolation from ground ensures that the 41-761 can be used to accurately simulate low voltages even in the presence of common mode voltages in the system. Each Vcold connection is independent permitting the 41-761 to be connected to multiple cold junctions.
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Product
PXI/PXIe Resolver Simulator Module, 4-Banks
41-670-201-AABBCC
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The 41/43-670-201 is ideal for the simulation of Resolvers. It has four banks, each capable of simulating the output of a single 5 or 6-wire resolver.
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Product
PXI/PXIe Battery Simulator Module, 2-Channel
41-752A-003
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Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 2-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
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Product
In-Circuit Test System
TestStation LX
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TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
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Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Load Simulator
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The load system is intended for testing satellite power supply systems; due to the integration with a solar array simulator and a battery simulator, it can perform validation and commissioning of satellite power supplies. The system is equipped with regenerative electronic loads and customer-specific high-power switching matrices for routing the DUT channels to the relevant loads. The individual voltages and currents for each channel can be read back via a Keysight Technologies switch mainframe.The system is equipped with high electrical power; its loads are capable of feeding the energy back into the power grid.
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Product
LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Photonics Wafer Probing Test System
58635
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The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
RTD Simulator PCI Card 6-Channel PT1000
50-262-102
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This RTD Simulator is a PCI card that supports 6 channels of RTD simulation. The card can provides a setting resolution of <90mΩ (also available in <8mΩ - PT100) and a resistance accuracy of better than 0.1% on all channels. Each simulation channel is able to provide a short or open circuit setting to simulate faulty wiring connections to a sensor. Calibration or verification of each resistor channel can be verified by using the calibration port connected to a high performance DMM and a supplied software package.
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Product
Benchtop Communication Test System
ATS3000A
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The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Automated Multi-Functional Tester
QTouch 1408 C
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Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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Product
Universal Test System
LEON System
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A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
