Simulation Testing
See Also: Simulation, Simulators, Simulation Software
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
PCI Strain Gauge Simulator Card, 2-Channel, 3k
50-265-102
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These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
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Product
PCI Strain Gauge Simulator Card, 2-Channel, 2k
50-265-302
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These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Medalist i1000D
U9401B
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The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
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The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
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The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
PXI/PXIe Battery Simulator Module, 4-Channel, V/I Readback, 750 V Isolation
43-752A-012
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Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 4-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
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Product
PXI/PXIe Battery Simulator Module, 6-Channel
41-752A-001
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Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 6-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
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Product
PXI/PXIe LVDT/RVDT/Resolver Simulator Module
41-670-XYZ-AABBCC
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The 41/43-670 range is ideal for the simulation of variable differential transformers (VDT), both linear (LVDT) and rotary (RVDT) types, as well as resolvers. Available with up to four banks, each bank is capable of simulating the output of a single 5 or 6-wire VDT or resolver, or dual 4-wire utilizing a shared excitation signal. This allows the module to simulate up to 4 channels of 5 or 6-wire or 8 channels of 4-wire.
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
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Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
PXI RTD Simulator Module 12 Channel PT100
40-262-201
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The 40-262 is a 3U PXI module range that supports 6 (in one slot), 12 or 18 (in two slots) channels of RTD simulation. Based on the design principles of our 40-260 PXI Precision Resistor, this RTD simulator module can provide a setting resolution of <8mΩ (PT100) or <90mΩ (PT1000) and a resistance accuracy of better than 0.1% on all channels.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
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The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Sealed Beam Bulb Testing System
H710019SSL
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EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Dual Port Simulator Fiber Channel PXIe Module
PXIe-FC4 Simulyzer
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The modules are available as a single-function board - for analysis or for simulation / data generation - but also as a full-function board for simultaneous analysis and simulation. By simply upgrading the firmware / software, a single function board can become a full function board without having to purchase new hardware.
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Product
Seno-Con Test System
PANTHER 2K QST
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Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
End of Line Test System for Automotive Seats
AS519
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AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
PXI/PXIe LVDT/RVDT/Resolver Simulator Module, 2-Banks
43-670-003-AABBCC
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The 41/43-670-003 is ideal for the simulation of variable differential transformers (VDT), both linear (LVDT) and rotary (RVDT) types, as well as resolvers. It has two banks, each capable of simulating the output of a single 5 or 6-wire VDT or resolver, or dual 4-wire utilizing a shared excitation signal.
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Product
ATE Self Test Fixtures
AL663
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AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
Dual Port Simulator Fiber Channel PCI-X Module
PCI-X FC4 Simulyzer
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The modules are available as a single-function board - for analysis or for simulation / data generation - but also as a full-function board for simultaneous analysis and simulation. With a simple firmware/software upgrade, a single function board can become a full function board without having to purchase new hardware.
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Product
Radar Target Simulator
E8707A
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Rapid developments in the autonomous vehicle and demand for greater safety features is fueling the need for more sensitive and accurate automotive radar technology being deployed in advanced driver assistance systems (ADAS). With its rich expertise in radar test technology, Keysight now offers the E8707A radar target simulator to help automotive electronics manufacturers confidently simulate radar targets in various realistic scenarios.
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Product
True Concurrent Test
TestStation Duo
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The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
6TL24 Combinational Base Test Platform
H71002400
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The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
6TL60 Rotary Test Handler
H79006010
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6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
PXI Millivolt Thermocouple Simulator Module - 16 Channel
41-760-003
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This series of PXI Thermocouple Simulator Modules is available in a choice of 32, 24, 16 or 8 channels—each channel providing a low-voltage output across two connector pins capable of providing ±20mV with 0.7µV resolution, ±50mV with 1.7µV resolution and ±100mV with 3.3µV resolution, covering most thermocouple types.
