Transceiver Test
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Product
mmWave Transceiver System
Waveform Transceivers
The mmWave Transceiver System is a modular hardware solution for prototyping real-time communications systems for mmWave frequencies. With 2 GHz of bandwidth, the system can be used to evaluate the ultrawide bandwidth signals being proposed for next-generation wireless communications standards in real time. You can analyze these ultrawide bandwidth signals in real time using a multi-FPGA architecture for computationally intensive digital signal processing. With this processing capability, you can build a real-time two-way communications link with up to 2 GHz of bandwidth.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785589-02
FlexRIO IF Transceiver
The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Regenerative Battery Pack Test System
17020
Test System
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785589-01
FlexRIO IF Transceiver
The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
PXIe-5645, 6 GHz, 80 MHz Bandwidth, RF and Baseband PXI Vector Signal Transceiver
782377-01
Vector Signal Transceiver
6 GHz, 80 MHz Bandwidth, RF and Baseband PXI Vector Signal Transceiver—The PXIe‑5645 combines a vector signal generator and vector signal analyzer with FPGA-based real-time signal processing and control into a single device, also known as a VST. Because of this software-designed approach, the PXIe‑5645 offers the flexibility of a software defined radio architecture with RF instrument class performance. The PXIe‑5645 features a high-performance, differential or single-ended baseband I/Q interface. This interface allows the PXIe‑5645 to address many additional applications, such as testing both the upconverted RF and downconverted baseband signals of a device with a single instrument.
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Product
EOL RF Functional Test
AS652
Test Platform
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785587-02
FlexRIO IF Transceiver
The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Bottom Electrode SMD Test Fixture
16197A
Test Fixture
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
