Transceiver Test
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Product
4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
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The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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Product
Transceiver Testing
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Family of RF test systems designed for transceiver testing. Designed for radio-to-radio testing in a closed mesh network. Step attenuators allow you to dynamically fade up/down the RF signal between radios. These Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted remote commands.
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Product
Transceiver Driver
S-112
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Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.
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Product
Benchtop Femtosecond/Picosecond Lasers and Amplifiers
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The systems feature a portable design with user-friendly front panel control knobs for adjustment of output parameters, such as power, pulse width and repetition rate. With wavelength options of 780 nm, 850 nm, 1310 nm, and 1550 nm, pulse widths as low as < 0.3 ps, and GHz low-jitter synchronization signals, these systems provide ideal optical sources for high speed transceiver conformance testing and photodiode characterization.
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Product
OSFP 800G
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OSFP800 has emerged as a leading standard to drive the development of 800G ecosystem. The MultiLane OSFP800 development kit is an essential tool to ensure the validity of your OSFP800 products. The module compliance board (MCB) is used to test transceivers, AOCs, active cables and DACs, while the host compliance board (HCB) enables the testing of system host ports. The loopback modules (LB) provide an economical way to test thermal capacity and signal integrity of system host ports at every stage of the process: R&D validation, production testing, and field testing.
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Product
Transceiver Cables
Transceiver Cable
Transceiver Cables are designed to provide flexibility in connecting a bus to various devices on the PXI, CompactRIO, and CompactDAQ platforms. Each isolated cable includes the necessary transceiver for the bus type. The cables also feature termination resistors that you can enable or disable in software. You can use the NI-XNET driver to program and configure the Transceiver Cables.
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Product
Gigabit Ethernet SFP Module
SFP-GMM-550
Optical Transceiver
Hardened SFP/1250-ED, MM850/LC 550m (also known as 808-38201) Industrial standard small form-factor pluggable (SFP) package, Provides digital diagnostics monitoring (DDM) functionality. Wide specifications and fiber types available, Comes with metal enclosure for EMI.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Product
TRC-8546, NI-XNET LIN Transceiver Cable, 18 in.
783702-02
Transceiver Cable
TRC-8546, NI-XNET LIN Transceiver Cable, 18 in.
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Product
VXT PXI Vector Transceiver, 380 MHz to 6/8/12 GHz
M9415A
Vector Signal Transceiver
The Keysight M9415A VXT PXIe vector transceiver integrates a VSG and a VSA from 380 MHz to 6, 8, or 12 GHz in a 3-slot PXIe module with up to 1.2 GHz bandwidth.
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Product
NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-02
Transceiver Adapter Module
The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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Product
PXIe-5841, 6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver
786982-01
Vector Signal Transceiver
6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver - The PXIe-5841 is a vector signal transceiver (VST) with 1 GHz of instantaneous bandwidth. It combines vector signal generator, vector signal analyzer and high-speed serial interface capabilities with FPGA-based real-time signal processing and control. The PXIe-5841 features the flexibility of a software defined radio architecture with RF instrument class performance. This VST delivers the fast measurement speed and small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments. The PXIe-5841 is available with an optional high-performance local oscillator module for improved phase noise, measurement time, and EVM performance. You can use the VST to test a variety of cellular and wireless standards such as Wi-Fi 6 and 5G NR. In addition, you can expand the small, two slot 2U PXI Express form factor to support multiple input, multiple output (MIMO) configurations.
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Product
VXT PXI Vector Transceiver, 300/600/1200 MHz Bandwidth
M9410A
Vector Signal Transceiver
The Keysight M9410A VXT PXIe vector transceiver integrates a 6 GHz vector signal generator and vector signal analyzer in a 2-slot PXIe module.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
26.5 GHz Or 54 GHz, Up To 4 GHz BW, RF PXI Vector Signal Transceiver
789601-26211
Vector Signal Transceiver
The PXIe-5842 is a vector signal transceiver (VST), which combines a vector signal generator and vector signal analyzer into a single four-slot PXI Express instrument. This VST provides the fast measurement speed and small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments. The PXIe-5842 benefits from PXI modularity and scalability, as up to four PXIe-5842 VSTs can fit into one 18-slot PXI Chassis. Additionally, the VST provides the error vector magnitude (EVM) performance required to test a variety of cellular and wireless standards such as Wi-Fi 7 and 5G NR. The PXIe-5842 supports frequency coverage and bandwidth availability for a wide range of semiconductor, aerospace, and defense applications.
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Product
NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-02
Transceiver Adapter Module
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family.
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Product
*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785589-01
FlexRIO IF Transceiver
The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Product
Hardened SFP+LR/10G-ED, SM1310/LC 20Km
SFP-XSM-LCI-20K
Optical Transceiver
Provides digital diagnostics monitoring (DDM) functionality, Wide specifications and fiber types available, Industrial standard small form-factor pluggable (SFP) package. Comes with metal enclosure for EMI, The Class 1 laser product complies with EN 60825-1, Supports plug-n-play operation.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Single Site Test Handler
3210
Test Handler
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
ESS Performance Test System
Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Fixture Kit In-Line 6TL35 455x600mm
AH500
Test Fixture
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 3000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
