-
product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25B-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Water Filler for Nickel-Cadmium Cells
MasterFiller
The MasterFiller is an instrument designed to deliver measured quantities of distilled water as required in the service of Aircraft Nickel-Cadmium batteries.· The MasterFiller consists of a microprocessor controlled pump with a level sensing probe, a keypad and display and an external 12VDC power supply (or optional battery).· The MasterFiller is part of a system comprising Intelligent Charger-Analyzers and Software for Battery Data Acquisition and Analysis, designed to improve the accuracy and efficiency of the process of testing batteries for airworthiness certification.
-
product
VPX Interposer
VPX850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
-
product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I-16
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Film Thickness Probe
FTPadv
The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
-
product
WaveMaster Oscilloscope, 13 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 813Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
-
product
Wireless Fiber Inspection Probe - WIS 300
Shanghai Fibretool Technology Co.,Ltd.
WIS 300 wireless fiber inspection scope is a WIFI/USB dual-use portable digital fiber inspector. With automated PASS/FAIL and fast images focus functionality, and easy pairing to Android™ and Apple© iOS devices, It can quickly check various patch cords and transceivers, display the fiber end face in PC/laptop/ OTDR/Smartphone etc..digital devices with the USB cable or WiFi connection. Under WiFi mode, it can automatically get the image checked and analyzed. Test results can do the pass/fail judges with IEC/IPC criteria. Fiber images and results can be saved on PC and mobile devices in jpg/pdf/excel format for file records. It’s super light and handy to take anywhere anytime for field tests, operation inspections, and lab research.
-
product
TAPPIR Femtosecond Transient Absorption Pump-Probe Infrared Spectrometer
TAPPIR
A femtosecond difference frequency generator (DFG) is installed inside the TAPPIR optical unit for the tunable probe of transient absorption within 3 mm - 11 mm. DFG is pumped with signal and idler waves delivered together from an external optical parametric amplifier.
-
product
Complete Graphical Power Quality Analysis System
PK5064-PRO+
The PK5064-PRO+ is the top choice for comprehensive power quality studies, energy audits, load studies, harmonic analysis, and more. Wide-range flexible current probes allow you to get into tight and confined spaces, wrap around large conductors, and measure almost any AC circuit that comes your way.
-
product
Passive Probe, 500 MHz, 2.5mm Tip
PP007-WR-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
-
product
Probe Cards
LCD Driver
LCD Driver devices are utilized in some of the most popular high definition tech products such as LCD televisions, high functioning smart phones and tablets.
-
product
Adapter/Stainless Steel
WADP-QSMSF-01
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
-
product
Controlled Impedance Analyzers
HYPERLABS Controlled Impedance Analyzers can be used with various probes and adapters to quickly and reliably characterize impedance on PCB test coupons. These Test Systems are designed to comply with IPC-2141A standards for PCB coupon testing, and can be customized to meet specific customer needs.
-
product
Standard 0.80 (22.00) - 4.00 (114.00) High Frequency Probe
CSP-03G-003
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 3.70Return Loss @ -20dB (GHz): 1.80Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,090Overall Length (mm): 27.76
-
product
Dual Microwave Probe
The PICOPROBE® DUAL MICROWAVE PROBE consists of two separate probes mounted on a single holder. One probe is fixed to the holder; the other is adjustable. Each probe may be individually configured with GSG, GS, or SG footprints having any fixed pitch from 50 to 2540 microns. The probe to probe (signal to signal) spacing is user adjustable over a 4000 micron (160 mil) range. When ordering, an initial signal to signal spacing should be specified (up to .75 inches).
-
product
Readout passive probe
Rngs around the BNC input sockets that allow the attenuation factor of attached probes to be detected by the scope.
-
product
Thermal Videoscope Kits with Specialty Probe Options
FLIR VS290™ Series
The FLIR VS290 is an industrial thermal and visual videoscope system designed to help professionals quickly and safely find hidden faults and dangers in difficult-to-access locations. Featuring a 160 × 120 true thermal imager and FLIR MSX® (VSC-IR32 and VSC-IR33 probes), VS290 videoscopes give users the power to see and measure invisible hot spots before catastrophic equipment failures can occur. The small, sleek tips allow for easy inspection through tight or confined openings, improving productivity and reducing diagnostic time. The 2-meter side-viewing probe options are CAT IV 600V safety rated—perfect for underground electrical vault inspections. The 1-meter forward-viewing probe is a practical fit for general purpose equipment and building thermal scans. All are versatile tools for the most demanding environments in utility, manufacturing, and building maintenance applications.
-
product
SPICE-Based Analog Simulation Program
TINA-TI
TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages and waveforms. TINA''s schematic capture is truly intuitive-a real "quickstart."
-
product
Probe Series
AVIOR Series
The MPI AVIOR series offers a broad lineup of high performance prober systems targeting the Optical Communications market. Our prober systems are available in Top emitting (TP), Flip chip (FP) emitting and Die/Package (DP) configurations to meet your specific test requirements. Whether it be R&D or mass production, MPI has a solution that will meet your needs for accurate and reliable measurements in conjunction with a reduced cost-of-test.
-
product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25I35-6
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-1V1S
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
-
product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25H79-16
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Complete Probe Station
BD Series
Best for DC and RF probing, the platen lift is designed for smooth raise and contact of your probes simultaneously to your device. It is ideal for probing multiple spots on your device, or through multiple devices.
-
product
Wireless In-Circuit Test Fixtures
Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
-
product
Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72I-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
-
product
Positional Current Probe, PCB Track Touch And Measure
I-prober 520
Current measurement from insulated probing of conductorSuitable for observation and measurement of current in PCB tracks, component leads and ground planesWide dynamic range of 10mA to 20A peak to peakWide bandwidth of DC to 5MHzLow noise figure equivalent to <6mA rms at full B/WSafety rated to 300V Cat II (600V Cat 1)Suitable for connection to any oscilloscopeHigh accuracy general purpose H-field probeConverts to 'closed magnetic circuit' current probe
-
product
Standard 1.00 (28.00) - 2.75 (78.00) Non Replaceable General Purpose Probe
E-S-W
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 65Full Travel (mm): 1.65Recommended Travel (mil): 43Recommended Travel (mm): 1.09Overall Length (mil): 495Overall Length (mm): 12.57Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.70Recommended Drill Size: #51Overall Length Remark: Overall length for E-S-V and E-S-W is .540 (13.72)
-
product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25T79-6
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Changeable Cassette
230350/1 – CMK-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Raman Probes
As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
