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Product
Termination
WTER-6N5
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) Bead Probe
BTP-1HC-4
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Data Logger for Temperature
DSR-T
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Original medical probe being resistant to low temperature and free of toxicity and halogen Outstanding measuring resolution even in low temperature Original fittings for sensor connection, ensures 100,000 plugs Support single DSR connecting to PC via USB interface, and multiple DSR grouped in RS485 or LAN networking for central management
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Cable Tester
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The MapMaster™ mini detects faults and locations of RJ45 network cables. Good terminations, causes of faults and locations of cables are displayed on an LCD display. A set of five mapping remotes is included for locating cables terminated in wall jacks or patch panels. A built-in tone generator with 4 different tone combinations can be used with a tone probe to detect where a cable is routed and the location of the end of the cable.
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Product
Digital Engine Analyzer/Multimeter
385A
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The #385A has many of the necessary features required for today’s automotive diagnostics. Use frequency readings to test crankshaft and camshaft sensors, for example. The #385A comes equipped with an RPM pick-up, probe test leads, alligator clip test leads, protective holster, instructions and installed 9V battery. Inductive RPM pick-up features a five position, adjustable sensitivity switch.
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Product
Exhaust Gas Thermocouple
LM2500 T5.4
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AMETEK is the original OEM for the T5.4 EGT. We supply the L44830P01, L44830P02 and L44830P03 probes for use on the LM2500, LM2500+ and LM5000 gas turbines. In addition to the EGT, we also provide rigid harness, T3 probes, cables and flexible harness for these engines. Ensure you get the highest quality by selecting OEM qualified parts to keep your engine running reliably.
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Product
Ultra High 3.83 (109.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-72I15-10
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1I-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Thermocouple Thermometer – 2 Inputs – Data Logger
HD2128.2
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Thermocouple thermometer for probes type K, J, T, R, N, S, B, E, two inputs.
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Product
CAM/GATE Test Kits
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The Camgate ™ series test fixtures provide ‘Z’ axis motion and, with the optional floating top plate, makes this series ideal for top side probing. The floating push plate is accurately registered with two tooling/guide pins. The top plate mounting frame is adjustable in .500″ (12.7mm) increments to accommodate top side probing in the lower position, or clearance for PCA’s with tall components in the middle or top position, without the need for riser blocks. Camgate fixtures are available with the most widely used interfaces in the test industry.
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25L36-16
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1L24-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Pilot Control Software Suite
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The SemiProbe PILOT Control Software Suite semiautomatic and fully automatic probe systems employs the SemiProbe patented Adaptive Architecture. Software modules can be added to the base system as needed. PILOT Control Software consists of a Microsoft Windows-based user interface built on the SemiServer application for communicating to and from the probe system. Individual customer applications can be integrated with PILOT Control Software for a customized system to meet individual needs.
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Product
Multi-Interface TDM, Optical, And Packet/IP Rackmount & Probe Test Platforms
mTOP™
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Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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Product
Ultrasonic Imaging with Molecular Analysis
MOLECULUS
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MoleculUS is a dual-modality ultrasound and photoacoustic data acquisition unit that allows the simultaneous collection of ultrasound and photoacoustic channels sharing the same probe elements. The analog signal path of MoleculUS is split into PA and US paths. PA and US modes operate sequentially in time with support for US preview mode and continuous on-fly multiplexing between modes.
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Product
LFRE-1 High Performance Lead Free Probe
LFRE-1
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25I8-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Vane Thermo-Anemometer
Si-VV3
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The palm-sized Sauermann Si-VV3 vane thermo-anemometer easily measures airflow, air velocity & temperature with its vane probe.
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Product
Hand Held Sheet Resistance Measurement Instrument[Replaceable Probe Set (Non-destructive Probe & Contact Probe) ]
DUORES
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Easy to measure sheet resistance & carry aroundReplaceable hand-held probes for Non-destructive & Contact type
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1B-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-FK400-3
Switch Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Product
Standard 0.50 (14.00) - 2.00 (57.00) Non Replaceable General Purpose Probe
A-A-S-R
General Purpose Probe
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 310Overall Length (mm): 7.87Rec. Mounting Hole Size (mil): 31.5Rec. Mounting Hole Size (mm): 0.80Recommended Drill Size: #68 or 0.79 mm
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Product
Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72I40-2
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72T20-4
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Hand-Held Surface Probe
HP 1000-SP
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Advanced Thermal Solutions, Inc.
The HP 1000-SP is a stainless steel, single-sensor hand-held probe designed for measuring the surface temperature of solids. Its pointed tip allows for exact positioning of the sensor on the desired spot. This enhances measurement accuracy by eliminating any conduction heat transfer that may occur through the stem.
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25B-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Probe Needles for Wafer Sort and Test Applications
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Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.





























